PROCEEDINGS VOLUME 7283
AOMATT 2008 - 4TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING | 19-21 NOVEMBER 2008
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
IN THIS VOLUME

0 Sessions, 167 Papers, 0 Presentations
Front Matter  (1)
3.1  (12)
3.2  (9)
Poster Session  (145)
AOMATT 2008 - 4TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING
19-21 November 2008
Chengdu, Chengdu, China
Front Matter
Proc. SPIE 7283, Front Matter: Volume 7283, 728301 (21 May 2009); doi: 10.1117/12.834199
3.1
Proc. SPIE 7283, Calibration of rotary joints in multi-axis machine tools, 728302 (20 May 2009); doi: 10.1117/12.828277
Proc. SPIE 7283, Development of a parallelism tester for visible and infrared compound system, 728303 (20 May 2009); doi: 10.1117/12.828281
Proc. SPIE 7283, Micro assembled Fourier transform spectrometer, 728304 (20 May 2009); doi: 10.1117/12.828282
Proc. SPIE 7283, Non-null interferometric system for general aspheric test, 728305 (20 May 2009); doi: 10.1117/12.828283
Proc. SPIE 7283, Study on data processing and experiment of Fabry-Perot fiber optic strain gauge, 728306 (20 May 2009); doi: 10.1117/12.828284
Proc. SPIE 7283, Real-time portable dual channel image fusion and data processing system, 728307 (20 May 2009); doi: 10.1117/12.828285
Proc. SPIE 7283, Pyroelectric property of novel LiTa3O8 thin film prepared by sol-gel methods, 728308 (20 May 2009); doi: 10.1117/12.828286
Proc. SPIE 7283, Measurement of phase noise through beat frequency, 728309 (20 May 2009); doi: 10.1117/12.828287
Proc. SPIE 7283, Alignment of off-axis asphere and compensator with four poles, 72830A (20 May 2009); doi: 10.1117/12.828589
Proc. SPIE 7283, Quantitative characterization of supersmooth surface with roughness in the sub-nanometer range, 72830B (20 May 2009); doi: 10.1117/12.828590
Proc. SPIE 7283, Tracking and detecting occupational diseases for teachers with infrared imaging method, 72830C (20 May 2009); doi: 10.1117/12.828594
Proc. SPIE 7283, Stabilization of a multiplexed optical fiber interferometer system, 72830D (20 May 2009); doi: 10.1117/12.828595
3.2
Proc. SPIE 7283, Dynamic liquid surface shape measurement, 72830E (20 May 2009); doi: 10.1117/12.828596
Proc. SPIE 7283, Alignment error model of subaperture stitching interferometry for aspheric surface based on wavefront aberrations, 72830F (20 May 2009); doi: 10.1117/12.828598
Proc. SPIE 7283, Large dynamic range optical metrology with radial shearing interferometry, 72830G (20 May 2009); doi: 10.1117/12.828599
Proc. SPIE 7283, AGV trace sensing and processing technology based on RGB color sensor array, 72830H (20 May 2009); doi: 10.1117/12.828601
Proc. SPIE 7283, New method of annular sub-apertures stitching, 72830I (20 May 2009); doi: 10.1117/12.834194
Proc. SPIE 7283, Study on multi-sensor optic-electrical system performance test, 72830J (20 May 2009); doi: 10.1117/12.828602
Proc. SPIE 7283, Squareness perpendicularity measuring techniques in multiaxis machine tools, 72830K (20 May 2009); doi: 10.1117/12.828603
Proc. SPIE 7283, Phase retrieval based wavefront sensing experimental implementation and wavefront sensing accuracy calibration, 72830L (20 May 2009); doi: 10.1117/12.828604
Proc. SPIE 7283, Interpolation circuit with high resolution and high response speed, 72830M (20 May 2009); doi: 10.1117/12.828605
Poster Session
Proc. SPIE 7283, New method of fiber Bragg grating demodulation technique and applied in detection of equipment, 72830N (20 May 2009); doi: 10.1117/12.828606
Proc. SPIE 7283, Three-beam coherent combination experiments based on segmented mirrors and measure of phase characteristics of beams passing through Yb-doped fiber amplifier, 72830O (20 May 2009); doi: 10.1117/12.828610
Proc. SPIE 7283, Development of photoelectric pulse laser range finding system, 72830P (20 May 2009); doi: 10.1117/12.828611
Proc. SPIE 7283, Development of real-time photoelectric measurement on geometric size of objects, 72830Q (20 May 2009); doi: 10.1117/12.828612
Proc. SPIE 7283, Study on surface topography of IBS oxide multilayer mirrors, 72830R (20 May 2009); doi: 10.1117/12.828614
Proc. SPIE 7283, Conjugate gradient optimum algorithm study of non-linear correction for one-dimension PSD, 72830S (20 May 2009); doi: 10.1117/12.828616
Proc. SPIE 7283, Performance analysis of temperature and strain simultaneous measurement system based on coherent detection of Brillouin scattering, 72830T (20 May 2009); doi: 10.1117/12.828617
Proc. SPIE 7283, Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique, 72830U (20 May 2009); doi: 10.1117/12.828618
Proc. SPIE 7283, Interfaces roughness cross correlation properties and light scattering of optical thin films, 72830V (20 May 2009); doi: 10.1117/12.828623
Proc. SPIE 7283, Quantitative measurement of optical surfaces using an improved knife edge, 72830W (20 May 2009); doi: 10.1117/12.828620
Proc. SPIE 7283, Research on the measurement of large glass stress distribution, 72830X (20 May 2009); doi: 10.1117/12.828622
Proc. SPIE 7283, Model and simulation for testing two-mirror optical system by subaperture stitching interferometry, 72830Y (20 May 2009); doi: 10.1117/12.828624
Proc. SPIE 7283, Development of bubble tester, 72830Z (20 May 2009); doi: 10.1117/12.828625
Proc. SPIE 7283, Resolution performance of extreme ultraviolet telescope, 728310 (20 May 2009); doi: 10.1117/12.828627
Proc. SPIE 7283, Study on portable optical 3D coordinate measuring system, 728311 (20 May 2009); doi: 10.1117/12.828628
Proc. SPIE 7283, Large field F-θ laser scanning system, 728312 (20 May 2009); doi: 10.1117/12.828629
Proc. SPIE 7283, Dynamic detection technology for the irregularity state of railway track based on linear array CCD, 728313 (20 May 2009); doi: 10.1117/12.828630
Proc. SPIE 7283, Design of 3D measurement system based on multi-sensor data fusion technique, 728314 (20 May 2009); doi: 10.1117/12.828632
Proc. SPIE 7283, Ultra-precise micro-motion stage for optical scanning test, 728315 (20 May 2009); doi: 10.1117/12.828633
Proc. SPIE 7283, Study of photoacoustic Imaging based on DSPI, 728316 (20 May 2009); doi: 10.1117/12.828654
Proc. SPIE 7283, Dynamic deformation measurement based on inverse projected fringe technique, 728317 (20 May 2009); doi: 10.1117/12.828657
Proc. SPIE 7283, Research on Hartmann test for progressive addition lenses, 728318 (20 May 2009); doi: 10.1117/12.828655
Proc. SPIE 7283, Distortion measurement and calibration technology research of automatic observing and aiming optical system based on CCD, 728319 (20 May 2009); doi: 10.1117/12.828656
Proc. SPIE 7283, Study on control structure analysis and optimization of high-precision measurement platform for optical aspheric surface, 72831A (20 May 2009); doi: 10.1117/12.828658
Proc. SPIE 7283, Aspheric mirror measurement based on fringe reflection, 72831B (20 May 2009); doi: 10.1117/12.828659
Proc. SPIE 7283, Study on interferometry with grating modulating optical fiber interference fringes phase, 72831C (20 May 2009); doi: 10.1117/12.828784
Proc. SPIE 7283, Surface test of continuous phase plate with stitching technique, 72831D (20 May 2009); doi: 10.1117/12.834195
Proc. SPIE 7283, Determination of optical constants in the VUV range for fluoride thin films, 72831E (20 May 2009); doi: 10.1117/12.828661
Proc. SPIE 7283, Storage and compression design of high speed CCD, 72831F (20 May 2009); doi: 10.1117/12.828663
Proc. SPIE 7283, Research and fabrication of integrated optical chip in FOG, 72831G (20 May 2009); doi: 10.1117/12.828665
Proc. SPIE 7283, Study on the measurement of image motion between sequential images based on optical correlator, 72831H (20 May 2009); doi: 10.1117/12.828667
Proc. SPIE 7283, Adaptive algorithm of infrared target enhancement for target recognition of infrared detector, 72831I (20 May 2009); doi: 10.1117/12.828668
Proc. SPIE 7283, Fabry-Perot fiber pressure sensor based on white light interferometry and intensity demodulation method, 72831J (20 May 2009); doi: 10.1117/12.828669
Proc. SPIE 7283, Study on adjustment technique of optical-axis parallelism in multibeam axes optoelectronic system, 72831K (20 May 2009); doi: 10.1117/12.828670
Proc. SPIE 7283, Application of wavelet analysis on thin-film wideband monitoring system, 72831L (20 May 2009); doi: 10.1117/12.828671
Proc. SPIE 7283, Study on the technology of sinusoidal phase modulating interferometry based on Fourier transform algorithm, 72831M (20 May 2009); doi: 10.1117/12.828672