PROCEEDINGS VOLUME 7361
SPIE OPTICS + OPTOELECTRONICS | 20-23 APRIL 2009
Damage to VUV, EUV, and X-Ray Optics II
Proceedings Volume 7361 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
20-23 April 2009
Prague, Czech Republic
Front Matter
Proc. SPIE 7361, Front Matter: Volume 7361, 736101 (3 June 2009); doi: 10.1117/12.834521
Facilities and their Optics
Proc. SPIE 7361, Damage study for the design of the European XFEL beamline optics., 736105 (18 May 2009); doi: 10.1117/12.821890
Proc. SPIE 7361, The FERMI@Elettra FEL photon transport system, 736106 (18 May 2009); doi: 10.1117/12.822237
Damage by Ultra-short XUV/X-ray Pulses
Proc. SPIE 7361, Interaction of intense ultrashort XUV pulses with silicon, 736107 (18 May 2009); doi: 10.1117/12.822152
Proc. SPIE 7361, Response of molecular solids to ultra-intense femtosecond soft x-ray pulses, 736108 (18 May 2009); doi: 10.1117/12.822297
Proc. SPIE 7361, Efficient materials processing by dual action of XUV/Vis-NIR ultrashort laser pulses, 73610A (18 May 2009); doi: 10.1117/12.822433
Damage by Short XUV/X-ray Pulses
Proc. SPIE 7361, Silica nano-ablation using laser plasma soft x-rays, 73610B (18 May 2009); doi: 10.1117/12.822289
Proc. SPIE 7361, Surface changes of solids under intense EUV irradiation using a laser-plasma source, 73610C (18 May 2009); doi: 10.1117/12.820744
Proc. SPIE 7361, Direct structuring of solids by EUV radiation from a table-top laser produced plasma source, 73610D (18 May 2009); doi: 10.1117/12.822243
Theory and Computer Simulation
Proc. SPIE 7361, Dynamic of electronic subsystem of semiconductors excited with an ultrashort VUV laser pulse, 73610E (18 May 2009); doi: 10.1117/12.820548
Proc. SPIE 7361, Radiation damage within atomic clusters irradiated with intense VUV radiation, 73610F (7 May 2009); doi: 10.1117/12.821883
Proc. SPIE 7361, Modelling of damage processes of the optical-cryogenic sensor at microscopic and macroscopic levels, 73610G (18 May 2009); doi: 10.1117/12.822604
Damage to Multilayers
Proc. SPIE 7361, Damage studies of multilayer optics for XUV free electron lasers, 73610I (18 May 2009); doi: 10.1117/12.822257
Proc. SPIE 7361, Sub-micron focusing of soft x-ray free electron laser beam, 73610J (18 May 2009); doi: 10.1117/12.822498
Proc. SPIE 7361, Competitive reactions of carbon deposition and oxidation on the surface of Mo/Si multilayer mirrors by EUV irradiation, 73610L (18 May 2009); doi: 10.1117/12.822286
Laser-induced Damage
Proc. SPIE 7361, Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm, 73610M (18 May 2009); doi: 10.1117/12.820580
Proc. SPIE 7361, Laser-induced damage studies in optical elements using X-ray laser interferometric microscopy, 73610N (18 May 2009); doi: 10.1117/12.823302
Proc. SPIE 7361, Characterization of the focused beam of desktop 10-Hz capillary-discharge 46.9-nm laser, 73610O (18 May 2009); doi: 10.1117/12.822759
Laser Plasmas
Proc. SPIE 7361, Nonlinear 6-fold enhancement of laser drilling efficiency by double pulse mode: prospective in medicine application, 73610Q (18 May 2009); doi: 10.1117/12.820754
Damage to Phosphors, Filters, Detectors and Coatings
Proc. SPIE 7361, Phosphor materials under high-density XUV FEL excitation: mechanisms of luminescence quenching, 73610R (18 May 2009); doi: 10.1117/12.822292
Proc. SPIE 7361, Factors affecting the transmission and stability in complex fluorides in VUV spectral region, 73610S (18 May 2009); doi: 10.1117/12.822558
Proc. SPIE 7361, Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam, 73610T (18 May 2009); doi: 10.1117/12.820691
Proc. SPIE 7361, Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors, 73610U (18 May 2009); doi: 10.1117/12.823836
Poster Session
Proc. SPIE 7361, Degradation of thin-film filters irradiated by debris emission of a laser induced plasma, 73610V (18 May 2009); doi: 10.1117/12.821847
Proc. SPIE 7361, Risk analysis of laser elements for complex characterization of damages by space radiation, 73610W (18 May 2009); doi: 10.1117/12.820489
Proc. SPIE 7361, Characterization of tin vapor from CO[sub]2[/sub] laser produced EUV light source, 73610X (18 May 2009); doi: 10.1117/12.820966
Proc. SPIE 7361, Applicability of transmissive diffractive optics to high flux FEL radiation, 73610Y (18 May 2009); doi: 10.1117/12.822159
Proc. SPIE 7361, Toward a better understanding of multi-wavelength effects on KDP crystals, 73610Z (18 May 2009); doi: 10.1117/12.822852
Proc. SPIE 7361, Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation, 736110 (18 May 2009); doi: 10.1117/12.822950
Proc. SPIE 7361, Applications of compact laser-driven EUV/XUV plasma sources, 736112 (18 May 2009); doi: 10.1117/12.833645
Proc. SPIE 7361, XUV metrology: surface analysis with extreme ultraviolet radiation, 736113 (18 May 2009); doi: 10.1117/12.833648
Back to Top