Front Matter
Proc. SPIE 7389, Front Matter: Volume 7389, 738901 (17 June 2009); doi: 10.1117/12.835932
Multisensor Approaches and Strategies
Proc. SPIE 7389, Flexible optical metrology strategies for the control and quality assurance of small series production, 738902 (17 June 2009); doi: 10.1117/12.827589
Proc. SPIE 7389, Sensor and actuator conditioning for multiscale measurement systems on example of confocal microscopy, 738903 (17 June 2009); doi: 10.1117/12.827534
Proc. SPIE 7389, Remote online monitoring and measuring system for civil engineering structures, 738904 (17 June 2009); doi: 10.1117/12.828002
Digital Holography
Proc. SPIE 7389, Resolution-enhanced approaches in digital holography, 738905 (17 June 2009); doi: 10.1117/12.830654
Proc. SPIE 7389, Investigation of the thermal lens effect of a NdYAG laser, 738906 (17 June 2009); doi: 10.1117/12.823257
Proc. SPIE 7389, Microfluidic system based on the digital holography microscope for analysis of motile sperm, 738907 (17 June 2009); doi: 10.1117/12.827826
Proc. SPIE 7389, Automated compensation of fringe pattern in digital holography and TV holography, 738908 (17 June 2009); doi: 10.1117/12.828198
Fringe Projection Deflectometry
Proc. SPIE 7389, Calibration of a combined system with phase measuring deflectometry and fringe projection, 738909 (17 June 2009); doi: 10.1117/12.828130
Proc. SPIE 7389, Predictive segmentation method for 3D inspection accuracy and robustness improvement, 73890A (17 June 2009); doi: 10.1117/12.827482
Proc. SPIE 7389, Quality-guided phase unwrapping for the modified Fourier transform method, 73890B (17 June 2009); doi: 10.1117/12.827952
Proc. SPIE 7389, 3D reconstruction by polarimetric imaging method based on perspective model, 73890C (17 June 2009); doi: 10.1117/12.827582
Proc. SPIE 7389, Optical 3D shape measurement for dynamic object using color fringe pattern projection and empirical mode decomposition, 73890D (17 June 2009); doi: 10.1117/12.827342
Proc. SPIE 7389, Development of a high resolution pattern projection system using linescan cameras, 73890F (17 June 2009); doi: 10.1117/12.823837
Speckle Metrology
Proc. SPIE 7389, Industrial inspections by speckle interferometry: general requirements and a case study, 73890G (17 June 2009); doi: 10.1117/12.827585
Proc. SPIE 7389, Out-of-plane vibration analysis with a transmission holographic-optical-element-based electronic speckle pattern interferometer, 73890H (17 June 2009); doi: 10.1117/12.827674
Proc. SPIE 7389, Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm, 73890I (17 June 2009); doi: 10.1117/12.824186
Measurements of Figures and Phase Objects
Proc. SPIE 7389, Measurement of chromatic dispersion of microstructured polymer fibers by white-light spectral interferometry, 73890J (17 June 2009); doi: 10.1117/12.824543
Proc. SPIE 7389, Characterization of optical fibers by digital holographic interferometry, 73890K (17 June 2009); doi: 10.1117/12.826854
Proc. SPIE 7389, Digital holographic tomography of phase objects, 73890L (17 June 2009); doi: 10.1117/12.827666
Proc. SPIE 7389, Phase object power mapping and cosmetic defects enhancement by Fourier-based deflectometry, 73890M (17 June 2009); doi: 10.1117/12.827670
Measurement of Shape and Roughness
Proc. SPIE 7389, Extraction of shape and roughness using scattering light, 73890N (17 June 2009); doi: 10.1117/12.827478
Proc. SPIE 7389, The complete acquisition of the topography of a special multi-mirror arrangement with the help of a Fizeau interferometer, 73890O (17 June 2009); doi: 10.1117/12.823484
Proc. SPIE 7389, Ball bearing measurement with white light interferometry, 73890P (17 June 2009); doi: 10.1117/12.828113
Proc. SPIE 7389, Highly sensitive wavefront sensor for characterization of micro- to nanometer-scale surface flatness deviations, 73890Q (17 June 2009); doi: 10.1117/12.828141
Proc. SPIE 7389, Profilometry of semiconductor components by two-colour holography with Bi12TiO20 crystals, 73890R (17 June 2009); doi: 10.1117/12.827533
Proc. SPIE 7389, Fast total scattering facility for 2D inspection of optical and functional surfaces, 73890S (17 June 2009); doi: 10.1117/12.827864
Proc. SPIE 7389, Soft x-ray projection system for robust roundness measurements, 73890T (17 June 2009); doi: 10.1117/12.827330
3D Interferometry
Proc. SPIE 7389, Gauge block calibration by using a high speed phase shifting interferometer comprising two frequency scanning diode lasers, 73890U (17 June 2009); doi: 10.1117/12.827455
Proc. SPIE 7389, Development of an ultrasensitive interferometry system as a key to precision metrology applications, 73890V (17 June 2009); doi: 10.1117/12.827586
Proc. SPIE 7389, Common-path two-wavelength interferometer with submicron precision for profile measurements in online applications, 73890W (17 June 2009); doi: 10.1117/12.827502
Proc. SPIE 7389, Digital interferometry using sequentially recorded intensity patterns, 73890X (17 June 2009); doi: 10.1117/12.827527
Optics Testing
Proc. SPIE 7389, Small lens testing method using phase shift shearing interferometer, 73890Y (17 June 2009); doi: 10.1117/12.827723
Proc. SPIE 7389, Reproducibility of contact lens power measurements using the phase shifting schlieren method, 73890Z (17 June 2009); doi: 10.1117/12.827525
Proc. SPIE 7389, Phase analysis error reduction in the Fourier transform method using a virtual interferogram, 738910 (17 June 2009); doi: 10.1117/12.825200
Proc. SPIE 7389, Parameter determination of biconvex lenses using confocal imaging, 738911 (17 June 2009); doi: 10.1117/12.827470
Proc. SPIE 7389, Optical testing of lens systems with concentric design, 738912 (17 June 2009); doi: 10.1117/12.827746
Novel Interferometric Sensors
Proc. SPIE 7389, Simplified laser Doppler distance sensor employing a single fan-shaped interference fringe system for dynamic position and shape measurement of laterally moving objects, 738913 (17 June 2009); doi: 10.1117/12.827500
Proc. SPIE 7389, Surface profile analysis using a fiber optic low-coherence interferometer, 738914 (17 June 2009); doi: 10.1117/12.827823
Proc. SPIE 7389, Fiber optic interferometric sensor based on mechanical oscillation, 738915 (17 June 2009); doi: 10.1117/12.827510
Optics Measurement I: Joint Session with EOS Conference on Metrology of Advanced Optics
Proc. SPIE 7389, Interferometric measurement of rotationally symmetric aspheric surfaces, 738916 (17 June 2009); doi: 10.1117/12.830655
Proc. SPIE 7389, New metrology approach for the production of aspheric lenses, 738918 (17 June 2009); doi: 10.1117/12.830657
Proc. SPIE 7389, Measuring aspheres with a chromatic Fizeau interferometer, 738919 (17 June 2009); doi: 10.1117/12.830658
Proc. SPIE 7389, Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes, 73891A (17 June 2009); doi: 10.1117/12.827513
Proc. SPIE 7389, Dual-CGH interferometry test for x-ray mirror mandrels, 73891B (17 June 2009); doi: 10.1117/12.830659
Optics Measurement II: Joint Session with EOS Conference on Metrology of Advanced Optics
Proc. SPIE 7389, Measurement and simulation of striae in optical glass, 73891C (17 June 2009); doi: 10.1117/12.827677
Proc. SPIE 7389, Photothermal measurement of absorptance losses, temperature-induced wavefront deformation, and compaction in DUV optics, 73891D (17 June 2009); doi: 10.1117/12.827501
Micro-Topography and Thickness Measurement
Proc. SPIE 7389, Several micron-range measurements with sub-nanometric resolution by the use of dual-wavelength digital holography and vertical scanning, 73891H (17 June 2009); doi: 10.1117/12.827338
Proc. SPIE 7389, Digital holographic characterization of liquid microlenses array fabricated in electrode-less configuration, 73891I (17 June 2009); doi: 10.1117/12.828034
Proc. SPIE 7389, Optical, mechanical, and electro-optical design of an interferometric test station for massive parallel inspection of MEMS and MOEMS, 73891J (17 June 2009); doi: 10.1117/12.828162
Proc. SPIE 7389, Thin film interferometer using a light source with spectrally nonequidistantly distributed sampling points, 73891K (17 June 2009); doi: 10.1117/12.827537
Position, Displacement, and Vibration Measurement
Proc. SPIE 7389, All-interferometric six-degrees-of-freedom sensor based on laser self-mixing, 73891L (17 June 2009); doi: 10.1117/12.827345
Proc. SPIE 7389, Compensated laser encoder with symmetric and quasi-common-path heterodyne interferometry, 73891M (17 June 2009); doi: 10.1117/12.827453
Proc. SPIE 7389, Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances, 73891N (17 June 2009); doi: 10.1117/12.827485
Proc. SPIE 7389, Determination of the frequency spectrum of Lamb waves from a sequence of maps of the instantaneous acoustic displacement obtained with TV holography, 73891O (17 June 2009); doi: 10.1117/12.827675
Proc. SPIE 7389, Dynamic holographic interferometry for dilatation measurements in a vacuum-thermal environment, 73891P (17 June 2009); doi: 10.1117/12.828153
Proc. SPIE 7389, In-situ position and vibration measurement of rough surfaces using laser Doppler distance sensors, 73891Q (17 June 2009); doi: 10.1117/12.828396
Proc. SPIE 7389, Study on the temporal coherence function of a femtosecond optical frequency comb, 73891R (17 June 2009); doi: 10.1117/12.824210