PROCEEDINGS VOLUME 7425
SPIE OPTICAL ENGINEERING + APPLICATIONS | 2-6 AUGUST 2009
Optical Materials and Structures Technologies IV
Proceedings Volume 7425 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
2-6 August 2009
San Diego, California, United States
Front Matter
Proc. SPIE 7425, Front Matter: Volume 7425, 742501 (15 September 2009); doi: 10.1117/12.846290
Material Selection and Characterization
Proc. SPIE 7425, Optical system material selection using performance indices in a simultaneous optimization approach, 742502 (22 August 2009); doi: 10.1117/12.828164
Proc. SPIE 7425, CTE measurements of Cesic®: a low-CTE ceramic composite, 742503 (22 August 2009); doi: 10.1117/12.824554
Proc. SPIE 7425, CTE characterization of ZERODUR® for the ELT century, 742504 (22 August 2009); doi: 10.1117/12.823937
Proc. SPIE 7425, Cryogenic refractometer for high accuracy measurements of the refractive index of materials, 742505 (22 August 2009); doi: 10.1117/12.826210
NDE of Silicon Carbide
Proc. SPIE 7425, A general overview of some nondestructive evaluation (NDE) techniques for materials characterization, 742506 (22 August 2009); doi: 10.1117/12.826906
Proc. SPIE 7425, NDE methods for determining the materials properties of silicon carbide plates, 742507 (22 August 2009); doi: 10.1117/12.824885
Proc. SPIE 7425, High frequency ultrasound phased array characterization of SiC mirror blanks, 742508 (22 August 2009); doi: 10.1117/12.825096
Proc. SPIE 7425, Material testing of silicon carbide mirrors, 742509 (22 August 2009); doi: 10.1117/12.826363
Si-SiC
Proc. SPIE 7425, Proof load testing of lightweight silicon carbide mirror substrates, 74250A (22 August 2009); doi: 10.1117/12.826920
Proc. SPIE 7425, Recent achievements using chemical vapor composite silicon carbide (CVC SiC), 74250B (22 August 2009); doi: 10.1117/12.824202
Proc. SPIE 7425, Silicon cladding for mirror substrates, 74250C (22 August 2009); doi: 10.1117/12.827032
Proc. SPIE 7425, Production of mirrors made of HB-Cesic for an airborne reconnaissance telescope system, 74250D (22 August 2009); doi: 10.1117/12.825123
Proc. SPIE 7425, Why silicon for telescope mirrors and structures?, 74250E (22 August 2009); doi: 10.1117/12.824887
Proc. SPIE 7425, SPIRALE: the first all-Cesic® telescopes orbiting earth, 74250F (22 August 2009); doi: 10.1117/12.825894
Beryllium and Be Composites
Proc. SPIE 7425, An all-beryllium-aluminum optical system for reconnaissance applications, 74250H (22 August 2009); doi: 10.1117/12.828495
Proc. SPIE 7425, Cryogenic adhesive testing for the NIRCam optical bench assembly, 74250J (22 August 2009); doi: 10.1117/12.828262
Proc. SPIE 7425, NIRCam optical bench assembly qualification vibration testing, 74250K (22 August 2009); doi: 10.1117/12.828256
Glass
Proc. SPIE 7425, Heritage of ZERODUR® glass ceramic for space applications, 74250L (22 August 2009); doi: 10.1117/12.825263
Proc. SPIE 7425, ZERODUR® glass ceramics for high stress applications, 74250M (22 August 2009); doi: 10.1117/12.828033
Proc. SPIE 7425, A bonded precision optical assembly using potassium hydroxide, 74250O (22 August 2009); doi: 10.1117/12.826260
Optical Materials, Proven and Emerging
Proc. SPIE 7425, A century of sapphire crystal growth: origin of the EFG method, 74250P (22 August 2009); doi: 10.1117/12.824452
Proc. SPIE 7425, Silicon nitride for lightweight stiff structures for optical instruments, 74250Q (22 August 2009); doi: 10.1117/12.825107
Proc. SPIE 7425, Structural design considerations for an 8-m space telescope, 74250R (22 August 2009); doi: 10.1117/12.838308
Proc. SPIE 7425, Replication of lightweight mirrors, 74250S (22 August 2009); doi: 10.1117/12.828567
Thin Film Coatings
Proc. SPIE 7425, Space radiation testing of thin film and multilayer optical coatings, 74250T (22 August 2009); doi: 10.1117/12.828481
Proc. SPIE 7425, Fabrication and characterization of cerium oxide thin films for ultraviolet sensing applications, 74250U (22 August 2009); doi: 10.1117/12.827418
Proc. SPIE 7425, Characterization of silver and aluminum custom mirror coatings for the MRO interferometric telescopes, 74250V (22 August 2009); doi: 10.1117/12.826044
Poster Session
Proc. SPIE 7425, Synchrotron radiation x-ray absorption fine-structure and raman scattering studies on 6H-SiC materials, 74250Y (22 August 2009); doi: 10.1117/12.825811
Proc. SPIE 7425, Fabrication of microlens arrays on a glass substrate by roll-to-roll process with PDMS mold, 74250Z (22 August 2009); doi: 10.1117/12.826058
Back to Top