PROCEEDINGS VOLUME 7426
SPIE OPTICAL ENGINEERING + APPLICATIONS | 2-6 AUGUST 2009
Optical Manufacturing and Testing VIII
Proceedings Volume 7426 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
2-6 August 2009
San Diego, California, United States
Front Matter
Proc. SPIE 7426, Front Matter: Volume 7426, 742601 (12 September 2009); doi: 10.1117/12.846300
Multiple Surfaces and Freeform Optics
Proc. SPIE 7426, High-resolution measurement of internal interface of optically transparent materials, 742602 (22 August 2009); doi: 10.1117/12.825199
Proc. SPIE 7426, Microfluidic design and fabrication of wafer-scale varifocal liquid lens, 742603 (22 August 2009); doi: 10.1117/12.825064
Proc. SPIE 7426, Fabrication and characterization of polymer based spatial light modulators, 742604 (22 August 2009); doi: 10.1117/12.825507
Proc. SPIE 7426, Comparison of freeform manufacturing techniques in the production of monolithic lens arrays, 742605 (24 August 2009); doi: 10.1117/12.824451
Proc. SPIE 7426, Nanometer level freeform surface measurements with the NANOMEFOS non-contact measurement machine, 742606 (22 August 2009); doi: 10.1117/12.826067
Developments in Surface Finishing
Proc. SPIE 7426, Accuracy of freeform manufacturing processes, 742607 (22 August 2009); doi: 10.1117/12.825829
Proc. SPIE 7426, Ultraprecision machining techniques for the fabrication of freeform surfaces in highly integrated optical microsystems, 742608 (22 August 2009); doi: 10.1117/12.826538
Proc. SPIE 7426, Increased UV transmission by improving the manufacturing processes for FS, 742609 (22 August 2009); doi: 10.1117/12.825377
Proc. SPIE 7426, Varying electro-kinetic interactions to achieve predictable removal rates and smooth surfaces on ZnS, 74260A (22 August 2009); doi: 10.1117/12.825384
MRF and Aspheres
Proc. SPIE 7426, Zirconia coated carbonyl iron particle-based magnetorheological fluid for polishing, 74260B (22 August 2009); doi: 10.1117/12.826383
Proc. SPIE 7426, Normal force and drag force in magnetorheological finishing, 74260C (22 August 2009); doi: 10.1117/12.826415
Proc. SPIE 7426, Contributions of nanodiamond abrasives and deionized water in magnetorheological finishing of aluminum oxynitriden, 74260D (22 August 2009); doi: 10.1117/12.826453
Proc. SPIE 7426, Simulation and analysis of the polishing process for aspheres, 74260F (22 August 2009); doi: 10.1117/12.825067
Proc. SPIE 7426, Edge tool influence function library using the parametric edge model for computer controlled optical surfacing, 74260G (22 August 2009); doi: 10.1117/12.828499
Surface Shaping
Proc. SPIE 7426, Calculating BRDFs from surface PSDs for moderately rough optical surfaces, 74260I (9 September 2009); doi: 10.1117/12.831302
Large Asphere Surfacing and Testing I
Proc. SPIE 7426, Swing-arm optical CMM for aspherics, 74260J (22 August 2009); doi: 10.1117/12.828493
Proc. SPIE 7426, Manufacturing and performance test of a 800 mm space optic, 74260K (22 August 2009); doi: 10.1117/12.825226
Proc. SPIE 7426, Fabrication and testing of 1.4-m convex off-axis aspheric optical surfaces, 74260L (22 August 2009); doi: 10.1117/12.828513
Proc. SPIE 7426, Non-null interferometric aspheric testing with partial null lens and reverse optimization, 74260M (22 August 2009); doi: 10.1117/12.824534
Proc. SPIE 7426, Verification procedure for the wavefront quality of the primary mirrors for the MRO interferometer, 74260N (22 August 2009); doi: 10.1117/12.825429
Large Asphere Surfacing and Testing II
Proc. SPIE 7426, Monolithic versus segmented primary mirror concepts for space telescopes, 74260O (22 August 2009); doi: 10.1117/12.824475
Proc. SPIE 7426, Measurement of high-departure aspheric surfaces using subaperture stitching with variable null optics, 74260P (22 August 2009); doi: 10.1117/12.826544
Proc. SPIE 7426, Stitching interferometry: the practical side of things, 74260Q (22 August 2009); doi: 10.1117/12.827459
Proc. SPIE 7426, Research of precision interference locating method for a partial null compensator at aspheric testing, 74260R (22 August 2009); doi: 10.1117/12.825830
Proc. SPIE 7426, Fizeau interferometer with spherical reference and CGH correction for measuring large convex aspheres, 74260S (22 August 2009); doi: 10.1117/12.829053
Interferometry
Proc. SPIE 7426, Limits for interferometer calibration using the random ball test, 74260U (22 August 2009); doi: 10.1117/12.828503
Proc. SPIE 7426, Orthonormal vector polynomials in a unit circle, application: fitting mapping distortions in a null test, 74260V (22 August 2009); doi: 10.1117/12.828288
Poster Session
Proc. SPIE 7426, Scanning pentaprism measurements of off-axis aspherics II, 74260Y (22 August 2009); doi: 10.1117/12.828497
Proc. SPIE 7426, Imaging analysis of a novel compound diffractive telescope system, 74260Z (22 August 2009); doi: 10.1117/12.823950
Proc. SPIE 7426, High-speed and precision auto-focusing system for direct laser lithography, 742610 (22 August 2009); doi: 10.1117/12.825191
Proc. SPIE 7426, Development of a large ion beam figuring facility for correction of optics up to 1.7 m diameter, 742611 (22 August 2009); doi: 10.1117/12.826433
Proc. SPIE 7426, Fabrication of 300-mm silicon reference wafer by using direct laser writer, 742612 (22 August 2009); doi: 10.1117/12.824846
Proc. SPIE 7426, Laser tracker surface measurements of the 8.4m GMT primary mirror segment, 742613 (22 August 2009); doi: 10.1117/12.826706
Proc. SPIE 7426, Experimental investigation of the dimensions and quality of laser-drilled holes in metals, 742614 (22 August 2009); doi: 10.1117/12.827429
Proc. SPIE 7426, Parametric and scattering characterization of PDMS membranes for optical applications, 742615 (22 August 2009); doi: 10.1117/12.826550
Proc. SPIE 7426, Modified alignment CGHs for aspheric surface test, 742616 (22 August 2009); doi: 10.1117/12.826659
Back to Top