Proceedings Volume 7432 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
2-6 August 2009
San Diego, California, United States
Front Matter
Proc. SPIE 7432, Front Matter: Volume 7432, 743201 (23 September 2009); doi: 10.1117/12.837052
Calibration and Analysis Methods I: Calibration
Proc. SPIE 7432, Optimal checkerboard selection for structured light system calibration, 743202 (10 September 2009); doi: 10.1117/12.823829
Proc. SPIE 7432, Measurement accuracy of fringe projection depending on surface normal direction, 743203 (10 September 2009); doi: 10.1117/12.827057
Proc. SPIE 7432, High precision calibration method of intrinsic parameters for fish-eye cameras, 743204 (10 September 2009); doi: 10.1117/12.825586
Proc. SPIE 7432, New calibration technique for a novel stereo camera, 743205 (10 September 2009); doi: 10.1117/12.825753
Proc. SPIE 7432, 3D cutting tool inspection system and its key technologies, 743206 (10 September 2009); doi: 10.1117/12.828891
Proc. SPIE 7432, 3D measurement method based on wavelet transform by using SEM, 743207 (10 September 2009); doi: 10.1117/12.828518
Calibration and Analysis Methods II: Data Analysis
Proc. SPIE 7432, A fringe period unwrapping technique for digital fringe profilometry based on spatial shift estimation, 743208 (10 September 2009); doi: 10.1117/12.824845
Proc. SPIE 7432, Shift-variant image deblurring for machine vision: one-dimensional blur, 743209 (10 September 2009); doi: 10.1117/12.825663
Proc. SPIE 7432, Automatic inspection of textured surfaces by support vector machines, 74320A (10 September 2009); doi: 10.1117/12.825194
Proc. SPIE 7432, Stokes parameters of reflected and scattered light by a rough surface, 74320B (10 September 2009); doi: 10.1117/12.828030
Proc. SPIE 7432, Data processing and parameter extraction for cutting tool inspection, 74320C (10 September 2009); doi: 10.1117/12.828890
Optical Metrology and 3D Applications I
Proc. SPIE 7432, In-process inspection of internal threads of machined automotive parts, 74320D (10 September 2009); doi: 10.1117/12.824387
Proc. SPIE 7432, Measure of roughness of paper using speckle, 74320E (10 September 2009); doi: 10.1117/12.825072
Proc. SPIE 7432, A novel method for overlay measurement by scatterometry, 74320F (10 September 2009); doi: 10.1117/12.825091
Optical Metrology and 3D Applications II
Proc. SPIE 7432, In-situ analysis of fruit anthocyanins by means of total internal reflectance, continuous wave and time-resolved spectroscopy, 74320H (10 September 2009); doi: 10.1117/12.823157
Proc. SPIE 7432, Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer, 74320J (10 September 2009); doi: 10.1117/12.827352
Proc. SPIE 7432, Digital processing of an interferometric velocimeter for ballistic shock measurement, 74320K (10 September 2009); doi: 10.1117/12.828498
Proc. SPIE 7432, In-plane and out-of-plane deformation and vibration measurement using an optomechanical image derotator, 74320L (10 September 2009); doi: 10.1117/12.825254
3D Methods I: Structured Light and Phase Methods
Proc. SPIE 7432, Digital multiple wavelength phase shifting algorithm, 74320N (10 September 2009); doi: 10.1117/12.823903
Proc. SPIE 7432, Continuous scanning phase measurement for high immunity to vibration, 74320O (10 September 2009); doi: 10.1117/12.825793
Proc. SPIE 7432, Three-dimensional profilometry system incorporating a MEMS scanner, 74320P (10 September 2009); doi: 10.1117/12.825980
Proc. SPIE 7432, Comparison of projection means for structured light systems, 74320S (10 September 2009); doi: 10.1117/12.827416
3D Methods II: Speckle, Holographic, and Dynamic Methods
Proc. SPIE 7432, Microscopic TV sherography for microsystems characterization, 74320T (10 September 2009); doi: 10.1117/12.825766
Proc. SPIE 7432, 3D inspection microscope using holographic primary objective, 74320V (10 September 2009); doi: 10.1117/12.826574
Proc. SPIE 7432, Dual mode interferometer for measuring dynamic displacement of specular and diffuse components, 74320W (10 September 2009); doi: 10.1117/12.827090
3D Methods III: Other Methods Including Color, Stereo, and Focus
Proc. SPIE 7432, Combined stereovision and phase shifting method: use of a color visibility-modulated fringe pattern, 74320X (10 September 2009); doi: 10.1117/12.828228
Proc. SPIE 7432, Pixel synchronous measurement of object shape and colour, 74320Y (10 September 2009); doi: 10.1117/12.827053
Proc. SPIE 7432, Chromatic confocal spectral interferometry for technical surface characterization, 74320Z (10 September 2009); doi: 10.1117/12.826902
Proc. SPIE 7432, Three-dimensional profilometry based on focus method by projecting LC grating pattern, 743210 (10 September 2009); doi: 10.1117/12.827028
Proc. SPIE 7432, A portable 3D shape measurement system based on the combined stereovision and phase shifting method, 743211 (10 September 2009); doi: 10.1117/12.829284
Proc. SPIE 7432, Real-time 3D part metrology using polarization rotation, 743212 (10 September 2009); doi: 10.1117/12.828805
Proc. SPIE 7432, Laser Doppler distance sensors using phase and frequency evaluation, 743213 (10 September 2009); doi: 10.1117/12.826520
Poster Session
Proc. SPIE 7432, Research of the chromaticity coordinates and color spectrum calibration using tristimulus sensors and eigenspectrum method, 743214 (10 September 2009); doi: 10.1117/12.826178
Proc. SPIE 7432, Iterative estimation of the topography by means of structured light, 743216 (10 September 2009); doi: 10.1117/12.825658
Proc. SPIE 7432, Multi-channel liquid crystal cell parameter measurement technique, 743217 (10 September 2009); doi: 10.1117/12.827084
Proc. SPIE 7432, Method to measure frequency change of tunable laser based on Jamin shearing interferometer, 743218 (10 September 2009); doi: 10.1117/12.824681
Proc. SPIE 7432, Measurement of frequency swept linearly with Fabry-Perot fiber interferometer, 74321A (10 September 2009); doi: 10.1117/12.824662
Proc. SPIE 7432, Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry, 74321B (10 September 2009); doi: 10.1117/12.824393
Proc. SPIE 7432, Three-dimensional embedded defect detection and localization in a semi-transparent medium, 74321C (10 September 2009); doi: 10.1117/12.830444
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