PROCEEDINGS VOLUME 7511
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY | 19-22 OCTOBER 2009
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
IN THIS VOLUME

0 Sessions, 78 Papers, 0 Presentations
Front Matter  (1)
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY
19-22 October 2009
Shanghai, China
Front Matter
Proc. SPIE 7511, Front Matter: Volume 7511, 751101 (4 January 2010); doi: 10.1117/12.846029
Imaging and Spectroscopy
Proc. SPIE 7511, One-shot surface profile measurement using polarized phase-shifting, 751102 (20 November 2009); doi: 10.1117/12.836308
Proc. SPIE 7511, One-shot 3D shape and color measurement using composite RGB fringe projection and optimum three-frequency selection, 751103 (20 November 2009); doi: 10.1117/12.837853
Proc. SPIE 7511, Influence of partially coherent illumination on aerial-image-based aberration measurement of projection optics in lithographic tools, 751104 (20 November 2009); doi: 10.1117/12.837770
Proc. SPIE 7511, Microstructure testing with digital holography, 751105 (20 November 2009); doi: 10.1117/12.837812
Proc. SPIE 7511, Optimization of pupil sampling scheme for aerial-image-based aberration measurement of projection optics in lithographic tools, 751106 (20 November 2009); doi: 10.1117/12.837771
Proc. SPIE 7511, Determination of magneto-optical characteristics of hexaferrites from 200 GHz to 1THz using time domain spectroscopy, 751107 (20 November 2009); doi: 10.1117/12.839690
Proc. SPIE 7511, The research on promoting the measuring accuracy of UV radiometers, 751108 (20 November 2009); doi: 10.1117/12.837955
Proc. SPIE 7511, Correlation between linear and angular kinematic errors in prismatic joint of machine tools, 751109 (20 November 2009); doi: 10.1117/12.839861
Proc. SPIE 7511, The effects of water quality on the measurement results of nanoparticles' effective diameter and polydispersity by Photon Correlation Spectroscopy, 75110A (20 November 2009); doi: 10.1117/12.840121
Interferometer
Proc. SPIE 7511, Measurement of thin film shape with a sinusoidal wavelength scanning interferometer using a white light source, 75110B (20 November 2009); doi: 10.1117/12.840190
Proc. SPIE 7511, Vibration measurements based on demodulating the phase of a fiber 3dB-coupler Michelson interferometer, 75110C (20 November 2009); doi: 10.1117/12.837952
Proc. SPIE 7511, The dynamic interferometry technology of 4.5-meter concave aspherical mirror and relativity precision analysis, 75110D (20 November 2009); doi: 10.1117/12.835988
Proc. SPIE 7511, Research on chromatic dispersion measurement of PCF based on Michelson white-light interferometry, 75110E (20 November 2009); doi: 10.1117/12.837453
Proc. SPIE 7511, Development of oral cavity inspecting system, 75110F (20 November 2009); doi: 10.1117/12.837519
Proc. SPIE 7511, Content measurement of textile mixture by Fourier transform near infrared spectroscopy, 75110G (20 November 2009); doi: 10.1117/12.838029
Proc. SPIE 7511, Vibration errors in phase-shifting interferometer, 75110H (20 November 2009); doi: 10.1117/12.837606
Proc. SPIE 7511, Research of full-field deformation measurement system, 75110I (20 November 2009); doi: 10.1117/12.837776
Proc. SPIE 7511, On-line measurement of profile parameters of rectangular holographic photoresist gratings during development, 75110J (20 November 2009); doi: 10.1117/12.837778
Proc. SPIE 7511, Machine tools error characterization and compensation by on-line measurement of artifact, 75110K (20 November 2009); doi: 10.1117/12.839866
Optoelectric Measurement
Proc. SPIE 7511, An inversion of plume gas concentration distribution based on multivariate regression analysis, 75110L (20 November 2009); doi: 10.1117/12.837910
Proc. SPIE 7511, A polarization-modulated multichannel Mueller-matrix scatterometer for smoke particle characterization, 75110M (20 November 2009); doi: 10.1117/12.838276
Proc. SPIE 7511, Depth measurement using infrared thermography, 75110N (20 November 2009); doi: 10.1117/12.837816
Proc. SPIE 7511, A tunable external cavity laser diode with no mechanical movement, 75110O (20 November 2009); doi: 10.1117/12.839828
Proc. SPIE 7511, Light scattering modeling of bacteria using spheroids and cylinders, 75110P (20 November 2009); doi: 10.1117/12.837919
Proc. SPIE 7511, Optical measurement of atmospheric refractive index structure constants, 75110Q (20 November 2009); doi: 10.1117/12.837988
Proc. SPIE 7511, A single channel spatial polarization encoding and decoding method based on photoelastic modulator, 75110R (20 November 2009); doi: 10.1117/12.838050
Proc. SPIE 7511, Color identification and fuzzy reasoning based monitoring and controlling of fermentation process of branched chain amino acid, 75110S (20 November 2009); doi: 10.1117/12.838229
Proc. SPIE 7511, Measurement and evaluation on advanced adaptive optoelectronic sensor system, 75110T (20 November 2009); doi: 10.1117/12.838218
Proc. SPIE 7511, Method for decrease of the centroid error of star image caused by stellar spectrum, 75110U (20 November 2009); doi: 10.1117/12.839991
Poster Session
Proc. SPIE 7511, Used digital speckle correlation method to measure vibration, 75110V (20 November 2009); doi: 10.1117/12.835998
Proc. SPIE 7511, The self-reacting machining process of optical accessories and the precision testing, 75110W (20 November 2009); doi: 10.1117/12.836114
Proc. SPIE 7511, Modal analysis of low-level-light aiming sight-glass based on vibration testing conditions, 75110Y (20 November 2009); doi: 10.1117/12.837142
Proc. SPIE 7511, Small roll angle measurement based on auto-collimation and moiré fringe, 75110Z (20 November 2009); doi: 10.1117/12.837317
Proc. SPIE 7511, Design of an MCU-controlled laser liquid turbidimeter based on OPT101, 751110 (20 November 2009); doi: 10.1117/12.837510
Proc. SPIE 7511, Experimental studies of PCS system for measuring of nanometer particles, 751111 (20 November 2009); doi: 10.1117/12.837569
Proc. SPIE 7511, Measurement of the laser beam quality using knife-edge method, 751112 (20 November 2009); doi: 10.1117/12.837570
Proc. SPIE 7511, Processing technology of interferogram for thin film thickness measurement, 751113 (20 November 2009); doi: 10.1117/12.837583
Proc. SPIE 7511, Design and simulation of comparative method for testing transverse thermal conductivity of Si[sub]x[/sub]N[sub]y[/sub] thin film, 751114 (20 November 2009); doi: 10.1117/12.837586
Proc. SPIE 7511, Single-image based dimensions inspection technology for planar industrial parts, 751115 (20 November 2009); doi: 10.1117/12.837650
Proc. SPIE 7511, Optoelectronic measurement in deformation of blast shock with Doppler effect, 751116 (20 November 2009); doi: 10.1117/12.837714
Proc. SPIE 7511, A novel method measuring optical fiber nonlinear coefficient based on XPM, 751117 (20 November 2009); doi: 10.1117/12.837737
Proc. SPIE 7511, Dynamic deformation inspection of a human arm by using a line-scan imaging system, 751118 (20 November 2009); doi: 10.1117/12.837739
Proc. SPIE 7511, Design and tolerance analysis of compensator for high order aspheric surface testing, 751119 (20 November 2009); doi: 10.1117/12.837750
Proc. SPIE 7511, Experimental study on absolute spectral responsivity value transfer with cryogenic radiometer, 75111A (20 November 2009); doi: 10.1117/12.837791
Proc. SPIE 7511, On-orbit visual principle point monitoring system of three-line array camera, 75111B (20 November 2009); doi: 10.1117/12.837802
Proc. SPIE 7511, Simulation of ultraviolet laser-induced fluorescence LIDAR for detecting bioaerosol, 75111C (20 November 2009); doi: 10.1117/12.837805
Proc. SPIE 7511, Analysis for angle anisoplanatic effect of the steady thermal blooming, 75111D (20 November 2009); doi: 10.1117/12.837820
Proc. SPIE 7511, Ellipsometric data inversion of absorbing films by simulated annealing - simplex hybrid algorithm, 75111E (20 November 2009); doi: 10.1117/12.837845
Proc. SPIE 7511, Infrared object detection: the influence of flying altitude and velocity, 75111F (20 November 2009); doi: 10.1117/12.837848
Proc. SPIE 7511, Online image acquisition system of magnet chip surface quality based on asynchronous reset, 75111G (20 November 2009); doi: 10.1117/12.837858
Proc. SPIE 7511, Measurement of surface bidirectional reflectance distribution based on parabolic mirror, 75111H (20 November 2009); doi: 10.1117/12.837861
Proc. SPIE 7511, A new method for obtaining aerosol backscattering ratio with partial pure rotational Raman spectrum, 75111I (20 November 2009); doi: 10.1117/12.837867
Proc. SPIE 7511, Partial coherence theory relating to dispersive medium involved interference, 75111J (20 November 2009); doi: 10.1117/12.837887
Proc. SPIE 7511, The application of new simulated annealing genetic algorithm in film characters measurement, 75111K (20 November 2009); doi: 10.1117/12.837924
Proc. SPIE 7511, Design of wide field and high resolution video lens, 75111L (20 November 2009); doi: 10.1117/12.837933
Proc. SPIE 7511, Adaptive optics techniques without a wave-front sensor based on guide laser in atmospheric laser communications, 75111M (20 November 2009); doi: 10.1117/12.837951
Proc. SPIE 7511, Monitor system of cable tension with fiber Bragg grating, 75111N (20 November 2009); doi: 10.1117/12.837972
Proc. SPIE 7511, Research of the temperature measurement of high-energy laser energy meter and energy loss compensation technique, 75111O (20 November 2009); doi: 10.1117/12.838014