PROCEEDINGS VOLUME 7544
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION | 8-10 AUGUST 2010
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION
8-10 August 2010
Hangzhou, China
Front Matter
Proc. SPIE 7544, Front Matter: Volume 7544, 754401 (24 February 2011); doi: 10.1117/12.888137
Instrumentation Theory and Methodology
Proc. SPIE 7544, Factorial tests for the air beam assisted form error in-process optical measurement, 754402 (28 December 2010); doi: 10.1117/12.885879
Proc. SPIE 7544, Analysis of angle measurement uncertainty for wMPS, 754403 (28 December 2010); doi: 10.1117/12.885389
Proc. SPIE 7544, In-situ optical measurement of separation angles between bifacial lines in large scale space, 754404 (28 December 2010); doi: 10.1117/12.885384
Proc. SPIE 7544, Higher order harmonics contribution and suppression in metrology beamline, 754405 (28 December 2010); doi: 10.1117/12.885285
Proc. SPIE 7544, Dual autofocusing algorithm for optical lens measurement system, 754406 (28 December 2010); doi: 10.1117/12.887304
Proc. SPIE 7544, Evaluation of vehicle ride comfort based on neural network, 754407 (28 December 2010); doi: 10.1117/12.885814
Proc. SPIE 7544, Analysis of the performance of multi-channel measurement system, 754408 (28 December 2010); doi: 10.1117/12.885393
Proc. SPIE 7544, Transmission delay measurement for converter, 754409 (28 December 2010); doi: 10.1117/12.885453
Proc. SPIE 7544, Detection of abnormal data during dynamic measurement of discontinuous surfaces, 75440A (28 December 2010); doi: 10.1117/12.885810
Proc. SPIE 7544, Estimation of the uncertainty propagation in verification operator of cylindricity errors, 75440B (28 December 2010); doi: 10.1117/12.885336
Proc. SPIE 7544, Color recognition system for urine analyzer, 75440C (28 December 2010); doi: 10.1117/12.885816
Proc. SPIE 7544, Dual magnetic circuit magnetic bead coagulation test method, 75440D (28 December 2010); doi: 10.1117/12.885815
Proc. SPIE 7544, The challenge in the application of new generation geometrical product specifications, 75440E (28 December 2010); doi: 10.1117/12.885837
Proc. SPIE 7544, Mechanism of STED microscopy and analysis of the factors affecting resolution, 75440F (28 December 2010); doi: 10.1117/12.885681
Measurement for Precision and Ultra-Precision Machining
Proc. SPIE 7544, Thermal conductivity and thermal linear expansion measurements on molten salts for assessing their behaviour as heat transport fluid in thermodynamics solar systems, 75440G (28 December 2010); doi: 10.1117/12.886181
Proc. SPIE 7544, Final manufacturing and measurement of satellite proof masses for the MICROSCOPE project, 75440H (28 December 2010); doi: 10.1117/12.885187
Proc. SPIE 7544, LDGI signal subdivision by soft computing for nanomeasurement, 75440I (28 December 2010); doi: 10.1117/12.885413
Proc. SPIE 7544, Edge profile measurement of micro-cutting tools on a diamond turning machine, 75440J (28 December 2010); doi: 10.1117/12.885660
Proc. SPIE 7544, Development of pneumatic actuator with low-wave reflection characteristics, 75440K (28 December 2010); doi: 10.1117/12.885825
Proc. SPIE 7544, Feasibility and challenge for measurement of transparent object by adopting differential interference contrast technology, 75440L (28 December 2010); doi: 10.1117/12.885401
Proc. SPIE 7544, Effects of water flow rate on transparent window size for form error in-process optical measurement, 75440M (28 December 2010); doi: 10.1117/12.885892
Proc. SPIE 7544, Reflective-type optical encoder based on fractional Talbot self-image effect using phase grating, 75440N (28 December 2010); doi: 10.1117/12.886238
Proc. SPIE 7544, Three-dimensional angular measurement based on moiré fringe, 75440O (28 December 2010); doi: 10.1117/12.885821
Proc. SPIE 7544, Slide error measurement of a large-scale ultra-precision lathe, 75440P (28 December 2010); doi: 10.1117/12.885661
Proc. SPIE 7544, Development of GJ-4G track inspection car, 75440Q (28 December 2010); doi: 10.1117/12.885888
Proc. SPIE 7544, Dynamic error correction method for time grating CNC rotary table, 75440R (28 December 2010); doi: 10.1117/12.885576
Proc. SPIE 7544, Measurement of damping properties of damping material, 75440S (28 December 2010); doi: 10.1117/12.885843
Proc. SPIE 7544, Landmark measurement of Hanjiangfish fossil based on digital modeling, 75440T (28 December 2010); doi: 10.1117/12.885669
Proc. SPIE 7544, On-line monitoring system for skiving of NdFeB laminate components, 75440U (28 December 2010); doi: 10.1117/12.885556
Proc. SPIE 7544, Three-dimensional profile measurement based on light-section method, 75440V (28 December 2010); doi: 10.1117/12.885929
Proc. SPIE 7544, Evaluation of roundness error based on improved area hunting method, 75440W (28 December 2010); doi: 10.1117/12.885472
Proc. SPIE 7544, Motion error analysis of profilometer with grating-inductance combination, 75440X (28 December 2010); doi: 10.1117/12.885400
Proc. SPIE 7544, Design of aerostatic bearing restrictor with multi-loop coupling pocket, 75440Y (28 December 2010); doi: 10.1117/12.885461
Proc. SPIE 7544, Comparison of three TCC calculation algorithms for partially coherent imaging simulation, 75440Z (28 December 2010); doi: 10.1117/12.885227
Proc. SPIE 7544, Influence of ecological factors on pepper blade thickness, 754410 (28 December 2010); doi: 10.1117/12.885972
Proc. SPIE 7544, Precise stage design with planar diffraction grating interferometer, 754411 (28 December 2010); doi: 10.1117/12.885215
Proc. SPIE 7544, Coordinate measurement method based on coding target, 754412 (28 December 2010); doi: 10.1117/12.885664
Proc. SPIE 7544, Calibration method for large internal micrometer with three-point contact, 754413 (28 December 2010); doi: 10.1117/12.885288
Proc. SPIE 7544, Design of internal screw thread measuring device based on the Three-Line method principle, 754414 (28 December 2010); doi: 10.1117/12.885613
Proc. SPIE 7544, Image segmentation algorithm for location of laser spots during aircraft relative attitude determination, 754415 (28 December 2010); doi: 10.1117/12.885808
Proc. SPIE 7544, Measurement of water jet diameter for determination of line width of water jet-guided laser, 754416 (28 December 2010); doi: 10.1117/12.885356
Novel Instrument and Measurement System
Proc. SPIE 7544, A novel micro-friction measuring-head using force-feedback compensation, 754417 (28 December 2010); doi: 10.1117/12.885909
Proc. SPIE 7544, Aspects of probing on the micro scale, 754418 (28 December 2010); doi: 10.1117/12.885190
Proc. SPIE 7544, Dual wavelength fluorescent ratiometric pH measurement by scanning near-field optical microscopy, 754419 (28 December 2010); doi: 10.1117/12.885194
Proc. SPIE 7544, Development of ultra-precision micro-cavity measurement technique in HIT-UOI, 75441A (28 December 2010); doi: 10.1117/12.885701
Proc. SPIE 7544, Compensation of laser beam directional stability offset error by using translational spectroscope, 75441B (28 December 2010); doi: 10.1117/12.885699
Proc. SPIE 7544, Development of high-precision high-frequency phase-shifting circuit, 75441C (28 December 2010); doi: 10.1117/12.885464
Proc. SPIE 7544, Development of a near-infrared spectroscopic system for monitoring urine glucose level for the use of long-term home healthcare, 75441D (28 December 2010); doi: 10.1117/12.886007
Proc. SPIE 7544, High precision multimatrix optic-electronic modules for distributed measuring systems, 75441E (28 December 2010); doi: 10.1117/12.886294
Proc. SPIE 7544, Design of durability testing system for motorcycle engine ECU, 75441F (28 December 2010); doi: 10.1117/12.885414
Proc. SPIE 7544, Instrument for measuring moment of inertia with high precision, 75441G (28 December 2010); doi: 10.1117/12.885551
Proc. SPIE 7544, Nonlinear control of maglev positioning stage, 75441H (28 December 2010); doi: 10.1117/12.885306
Proc. SPIE 7544, Design and analysis of two dimensional X-Y micropositioning stage, 75441I (28 December 2010); doi: 10.1117/12.885293
Proc. SPIE 7544, Precision positioning system based on intelligent Fuzzy-PID control, 75441J (28 December 2010); doi: 10.1117/12.886016
Proc. SPIE 7544, Development of DSP and FPGA based 4-axis motion controller, 75441K (28 December 2010); doi: 10.1117/12.885274
Proc. SPIE 7544, A 2D coplanar translation stage with synchronous XY position metrology for surface scanning measurement, 75441L (28 December 2010); doi: 10.1117/12.885663
Proc. SPIE 7544, Multi-component gas analyzer based on Fourier transform spectrometer, 75441M (28 December 2010); doi: 10.1117/12.885317