PROCEEDINGS VOLUME 7790
SPIE OPTICAL ENGINEERING + APPLICATIONS | 1-5 AUGUST 2010
Interferometry XV: Techniques and Analysis
Proceedings Volume 7790 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
1-5 August 2010
San Diego, California, United States
Front Matter
Proc. SPIE 7790, Front Matter: Volume 7790, 779001 (3 August 2010); doi: 10.1117/12.868347
Space Optics
Proc. SPIE 7790, The center of curvature optical assembly for the JWST primary mirror cryogenic optical test: optical verification, 779003 (3 August 2010); doi: 10.1117/12.861874
Proc. SPIE 7790, Cryogenic wavefront error measurement for the James Webb Space Telescope fine-guidance sensor-powered optics, 779004 (3 August 2010); doi: 10.1117/12.860856
Proc. SPIE 7790, Dual frequency sweeping interferometry for absolute distance metrology at long ranges: implementation and performance, 779005 (3 August 2010); doi: 10.1117/12.859120
Phase Measuring Algorithms and Extended Range Measurements
Proc. SPIE 7790, Extended averaging phase-shift schemes for Fizeau interferometry on high-numerical-aperture spherical surfaces, 779006 (3 August 2010); doi: 10.1117/12.860914
Proc. SPIE 7790, Real-time phase demodulation of heterodyne speckle interference patterns using correlation image sensor, 779007 (3 August 2010); doi: 10.1117/12.859391
Proc. SPIE 7790, Linear systems theory for the analysis of phase-shifting algorithms, 779008 (3 August 2010); doi: 10.1117/12.860982
Proc. SPIE 7790, Theoretical analysis and optimisation of the method of excess fractions for long-range metrology, 779009 (3 August 2010); doi: 10.1117/12.861177
Fringe Projection and Reflection Methods
Proc. SPIE 7790, Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter, 77900A (3 August 2010); doi: 10.1117/12.861561
Proc. SPIE 7790, Generating sinusoidal fringe by defocusing: potentials for unprecedentedly high-speed 3-D shape measurement using a DLP projector, 77900B (3 August 2010); doi: 10.1117/12.860179
Proc. SPIE 7790, A compact LED-based phase measuring deflectometry setup, 77900C (3 August 2010); doi: 10.1117/12.860484
Proc. SPIE 7790, Fast and flexible calibration of a phase-based 3-D imaging system by uneven fringe projection, 77900D (3 August 2010); doi: 10.1117/12.860066
Proc. SPIE 7790, Three-dimensional microstructure measurement by high-resolution fringe analysis for shadow moiré image by SEM, 77900E (3 August 2010); doi: 10.1117/12.859101
Calibration Methods
Proc. SPIE 7790, Self-referencing calibration method for transmission spheres in Fizeau interferometry, 77900F (3 August 2010); doi: 10.1117/12.860911
Proc. SPIE 7790, Self-calibrating lateral scanning white-light interferometer, 77900G (3 August 2010); doi: 10.1117/12.860866
Proc. SPIE 7790, Discrete step wavemeter, 77900H (3 August 2010); doi: 10.1117/12.860897
Proc. SPIE 7790, Frequency stepping interferometry for accurate metrology of rough components and assemblies, 77900I (3 August 2010); doi: 10.1117/12.862702
Optical Surface Testing
Proc. SPIE 7790, Precision interferometry in less than ideal environments, 77900J (3 August 2010); doi: 10.1117/12.863613
Proc. SPIE 7790, The spatial frequency response and resolution limitations of pixelated mask spatial carrier based phase shifting interferometry, 77900K (3 August 2010); doi: 10.1117/12.860751
Proc. SPIE 7790, Imaging issues for interferometric measurement of aspheric surfaces using CGH null correctors, 77900L (3 August 2010); doi: 10.1117/12.862427
Proc. SPIE 7790, An analytic expression for the field dependence of FRINGE Zernike polynomial coefficients in rotationally symmetric optical systems, 77900M (3 August 2010); doi: 10.1117/12.863025
Speckle and Holographic Techniques
Proc. SPIE 7790, Theoretical and experimental investigation of statistics of spatial derivatives of Stokes parameters for polarization speckle, 77900N (3 August 2010); doi: 10.1117/12.861608
Proc. SPIE 7790, Noise reduction in dynamic interferometry measurements, 77900O (3 August 2010); doi: 10.1117/12.860450
Proc. SPIE 7790, Three-dimensional coherence holography using a commercial projector for display and incoherent illumination of a coherence hologram, 77900Q (3 August 2010); doi: 10.1117/12.858786
Micro-element Measurement and Image Registration Techniques
Proc. SPIE 7790, Low-cost full-field microinterferometer heads produced by hot- embossing technology, 77900R (3 August 2010); doi: 10.1117/12.862164
Proc. SPIE 7790, Image continuity at different levels of zoom for Moiré techniques, 77900S (3 August 2010); doi: 10.1117/12.860283
Spectral Methods and Optical Sectioning
Proc. SPIE 7790, High-speed optical coherence imaging: towards the structure and the physiology of living tissue, 77900T (3 August 2010); doi: 10.1117/12.861483
Proc. SPIE 7790, Multiple-wavelength interferometers using backpropagation of optical fields for profile measurement of thin glass sheets, 77900U (3 August 2010); doi: 10.1117/12.861534
Proc. SPIE 7790, Comparison of different film thickness evaluation algorithms applicable to spectrometric interrogation systems, 77900V (3 August 2010); doi: 10.1117/12.859687
Proc. SPIE 7790, Fiber optical interferometric sensor based on a piezo-driven oscillation, 77900W (3 August 2010); doi: 10.1117/12.860672
Material Property Measurements
Proc. SPIE 7790, Spectroscopy with a coherent dual frequency comb interferometer at 3.4 μm, 77900X (3 August 2010); doi: 10.1117/12.859730
Proc. SPIE 7790, Simultaneous measurement of spectral reflectivity and birefringence of a stone surface using polarization phase-shifting interferometer, 77900Y (3 August 2010); doi: 10.1117/12.862267
Proc. SPIE 7790, Determination of refractive index of transparent plate by Fabry-Perot fringe analysis, 77900Z (3 August 2010); doi: 10.1117/12.862363
Proc. SPIE 7790, Measurement of surface resistivity/conductivity of carbon steel in 5-20ppm of RA-41 inhibited seawater by optical interferometry techniques, 779010 (3 August 2010); doi: 10.1117/12.855191
Poster Session
Proc. SPIE 7790, Non-steady-state photo-EMF effect induced by an arbitrary 1-D periodical light distribution, 779011 (3 August 2010); doi: 10.1117/12.860790
Proc. SPIE 7790, Large-optics shearing interferometer for the wavefront sensing of widely tunable laser, 779012 (3 August 2010); doi: 10.1117/12.859761
Proc. SPIE 7790, Polarized point diffraction interferometer for fringe stabilization, 779013 (3 August 2010); doi: 10.1117/12.859805
Proc. SPIE 7790, Wavefront calculation from backscattering phase in optical rough surfaces, 779014 (3 August 2010); doi: 10.1117/12.860917
Proc. SPIE 7790, Investigation of three-beam interference fringes with controllable phase shift of two reference waves, 779015 (3 August 2010); doi: 10.1117/12.860746
Proc. SPIE 7790, One-shot in-line digital-holography-based two-dimensional Hilbert demodulation technique, 779016 (3 August 2010); doi: 10.1117/12.860238
Proc. SPIE 7790, Autofocusing on pure phase object for living cell imaging in lensless Fourier transform digital holography, 779017 (3 August 2010); doi: 10.1117/12.860527
Proc. SPIE 7790, Adaptive photodetector versus conventional method for localization of the Talbot self-images, 779018 (3 August 2010); doi: 10.1117/12.860072
Proc. SPIE 7790, Wave-front reconstruction by digital phase retrieval method in high power laser, 779019 (3 August 2010); doi: 10.1117/12.860542
Proc. SPIE 7790, Improving 4-D shape measurement by using projector defocusing, 77901A (3 August 2010); doi: 10.1117/12.860181
Proc. SPIE 7790, A new color structured light coding method for three-dimensional measurement of isolated objects, 77901B (3 August 2010); doi: 10.1117/12.860372
Proc. SPIE 7790, A fast 3D shape measurement based on two orthogonal grating projection, 77901C (3 August 2010); doi: 10.1117/12.870899
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