PROCEEDINGS VOLUME 7792
SPIE OPTICAL ENGINEERING + APPLICATIONS | 1-5 AUGUST 2010
Reflection, Scattering, and Diffraction from Surfaces II
Proceedings Volume 7792 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
1-5 August 2010
San Diego, California, United States
Front Matter
Proc. SPIE 7792, Front Matter: Volume 7792, 779201 (22 September 2010); doi: 10.1117/12.879948
Scattering Theory
Proc. SPIE 7792, The idea of the Lambertian surface: history, idealization, and system theoretical aspects and part 1 of a lost chapter on multiple reflection, 779202 (20 August 2010); doi: 10.1117/12.860172
Proc. SPIE 7792, Polar decomposition applied to light scattering by structured 2D surfaces, 779203 (20 August 2010); doi: 10.1117/12.862257
Proc. SPIE 7792, A Kirchhoff approximation for surface plasmon polaritons, 779204 (2 September 2010); doi: 10.1117/12.862137
Proc. SPIE 7792, Multiple scatter of vector electromagnetic waves from rough metal surfaces with infinite slopes using the Kirchhoff approximation, 779205 (2 September 2010); doi: 10.1117/12.859465
Proc. SPIE 7792, Nonstandard refraction of light from one- and two-dimensional dielectric quasi-periodic surfaces, 779206 (2 September 2010); doi: 10.1117/12.859143
Proc. SPIE 7792, Polarization of dipole scattering by randomly oriented ellipsoids, 779207 (2 September 2010); doi: 10.1117/12.860109
Instruments and Applications I
Proc. SPIE 7792, Development of a tunable polarimetric scatterometry system in the MWIR and LWIR, 779209 (2 September 2010); doi: 10.1117/12.859870
Proc. SPIE 7792, Time depending techniques for volume and discrete boundary surface scatterometry and part II of a lost chapter in Lambert's Photometria on multiple reflection, 77920A (2 September 2010); doi: 10.1117/12.860170
Proc. SPIE 7792, Design rules for catadioptric scatterometers based on measurement requirements, 77920B (2 September 2010); doi: 10.1117/12.860173
Optical Properties and Diagnostics I
Proc. SPIE 7792, Temperature dependence of the reflectance of metals at visible wavelengths, 77920D (2 September 2010); doi: 10.1117/12.856785
Proc. SPIE 7792, Polarization/depolarization of non-diffusive anisotropic photon-scattering biomedical tissues, 77920F (2 September 2010); doi: 10.1117/12.860105
Proc. SPIE 7792, Optical measurement for the concentrations of the pickling acid with near infrared spectroscopy in steel making industry, 77920G (2 September 2010); doi: 10.1117/12.860284
Proc. SPIE 7792, Bidirectional reflectance distribution of a 2D thin-film photonic crystal patterned using an atomic-force microscope, 77920H (2 September 2010); doi: 10.1117/12.863909
BRDF Modeling
Proc. SPIE 7792, A general BRDF/BSDF model including out-of-plane dependence, 77920I (10 September 2010); doi: 10.1117/12.861046
Proc. SPIE 7792, Experimental confirmation of the Rayleigh-Rice obliquity factor, 77920J (2 September 2010); doi: 10.1117/12.858799
Proc. SPIE 7792, Investigations on back scatter of typical projectiles for application of laser based trajectory measurement, 77920K (2 September 2010); doi: 10.1117/12.860588
Proc. SPIE 7792, Restoration of scene information reflected from a non-specular surface, 77920L (2 September 2010); doi: 10.1117/12.859124
Instruments and Applications II
Proc. SPIE 7792, Developing a multispectral HDR imaging module for a BRDF measurement system, 77920M (2 September 2010); doi: 10.1117/12.860071
Proc. SPIE 7792, A stereoscopic imaging system for laser back-scatter-based trajectory measurement in ballistics, 77920N (2 September 2010); doi: 10.1117/12.860568
Proc. SPIE 7792, New scanning gonio-photometer for extended BRTF measurements, 77920O (2 September 2010); doi: 10.1117/12.860889
Proc. SPIE 7792, Optical inspection of flat reflective surfaces by a wave front sensor, 77920Q (2 September 2010); doi: 10.1117/12.861148
Proc. SPIE 7792, Reflectance measurements for black absorbers made of vertically aligned carbon nanotubes, 77920R (2 September 2010); doi: 10.1117/12.861741
Coherence and Scattering
Proc. SPIE 7792, Wavelength-tunable focal length of a nanopatterned metallic planar lens with strong focusing capability, 77920S (2 September 2010); doi: 10.1117/12.861497
Proc. SPIE 7792, A partially coherent slowly diffracting beam, 77920T (2 September 2010); doi: 10.1117/12.862136
Proc. SPIE 7792, Coherence effects: from spectral change to nondiffraction, 77920U (2 September 2010); doi: 10.1117/12.859139
Optical Properties and Diagnostics II
Proc. SPIE 7792, Mechanical surface treatment to obtain optically cooperative surfaces vis-à-vis fringe projection, 77920V (2 September 2010); doi: 10.1117/12.860647
Proc. SPIE 7792, Roughness influence on periodic gratings and application to optical metrology of roughness, 77920W (2 September 2010); doi: 10.1117/12.860773
Proc. SPIE 7792, PASCAL: instrument for accurate precise characterization of Lambertian materials, 77920X (2 September 2010); doi: 10.1117/12.860839
Proc. SPIE 7792, A model for the optical properties of amorphous carbon (soot), 77920Y (2 September 2010); doi: 10.1117/12.861051
Optical Properties and Diagnostics III
Proc. SPIE 7792, Preliminary characterization study of a gold-coated concentrator for hemispherical longwave irradiance measurements, 77920Z (2 September 2010); doi: 10.1117/12.862461
Proc. SPIE 7792, Stress measurement of thin wafer using reflection grating method, 779210 (2 September 2010); doi: 10.1117/12.861058
Proc. SPIE 7792, Optical material characterization through BSDF measurement and analysis, 779211 (2 September 2010); doi: 10.1117/12.861499
Poster Session
Proc. SPIE 7792, Effective decomposition of pearlescent paints, 779213 (2 September 2010); doi: 10.1117/12.860530
Proc. SPIE 7792, Improvements of nanometer particle's measuring system based on photon correlation spectroscopy, 779215 (2 September 2010); doi: 10.1117/12.859957
Proc. SPIE 7792, A novel method for diameter estimation of small opaque objects using Fraunhofer diffraction, 779219 (2 September 2010); doi: 10.1117/12.869591
Proc. SPIE 7792, Topography measurement of specular and diffuse surfaces, 77921A (2 September 2010); doi: 10.1117/12.871112
Back to Top