PROCEEDINGS VOLUME 7794
SPIE OPTICAL ENGINEERING + APPLICATIONS | 1-5 AUGUST 2010
Optical System Contamination: Effects, Measurements, and Control 2010
Proceedings Volume 7794 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
1-5 August 2010
San Diego, California, United States
Front Matter
Proc. SPIE 7794, Front Matter: Volume 7794, 779401 (24 September 2010); doi: 10.1117/12.879950
Contamination Effects I
Proc. SPIE 7794, Optical characterization of condensed RTV effluent as a function of temperature, 779402 (20 August 2010); doi: 10.1117/12.859310
Proc. SPIE 7794, Lessons learned for the NASA Mission Solar Dynamics Observatory, 779403 (20 August 2010); doi: 10.1117/12.864479
Proc. SPIE 7794, Preservation of thermal control specular gold baffle surface on the James Webb Space Telescope (JWST) integrated science instrument module (ISIM) electronics compartment (IEC), 779404 (21 August 2010); doi: 10.1117/12.864481
Proc. SPIE 7794, Long-term laser irradiation tests of optical elements for ESA mission ADM-Aeolus, 779405 (8 September 2010); doi: 10.1117/12.861163
Proc. SPIE 7794, Aerosol Polarimeter Sensor (APS) contamination control requirements and implementation, 779406 (8 September 2010); doi: 10.1117/12.858912
Contamination Effects II
Proc. SPIE 7794, Contamination impact of station brush fire on cleanroom facilities, 779408 (8 September 2010); doi: 10.1117/12.860204
Proc. SPIE 7794, Contaminant film deposition on VUV-modified surfaces, 779409 (8 September 2010); doi: 10.1117/12.860729
Contamination Control, Monitoring, and Verification I
Proc. SPIE 7794, Zeolite adsorbers for molecular contamination control in spacecraft, 77940B (8 September 2010); doi: 10.1117/12.860468
Proc. SPIE 7794, Development of molecular adsorber coatings, 77940C (8 September 2010); doi: 10.1117/12.864483
Proc. SPIE 7794, Purge system for Landsat Data Continuity Mission and other instruments in contamination, 77940E (8 September 2010); doi: 10.1117/12.877193
Anti-Contamination/Protective Coatings
Proc. SPIE 7794, Properties of Ball InfraRed Black, a new cryogenic thermal control coating, 77940F (8 September 2010); doi: 10.1117/12.858575
Proc. SPIE 7794, Reducing particle adhesion by material surface engineering, 77940G (8 September 2010); doi: 10.1117/12.859956
Proc. SPIE 7794, Tailoring of superhydrophilic to superhydrophobic coating morphologies for space exploration contamination control, 77940H (8 September 2010); doi: 10.1117/12.860895
Proc. SPIE 7794, The Lotus coating for space exploration: a dust mitigation tool, 77940I (8 September 2010); doi: 10.1117/12.864480
Contamination Control, Monitoring, and Verification II
Proc. SPIE 7794, A dynamic approach to monitoring particle fallout in a cleanroom environment, 77940K (8 September 2010); doi: 10.1117/12.861025
Proc. SPIE 7794, Infiltration of supermicron aerosols into a simulated space telescope, 77940M (8 September 2010); doi: 10.1117/12.861130
Proc. SPIE 7794, Concepts for a NASA applied spaceflight environments office, 77940N (8 September 2010); doi: 10.1117/12.871178
Contamination Analysis/Space Environments
Proc. SPIE 7794, Development of versatile molecular transport model for modeling spacecraft contamination, 77940O (8 September 2010); doi: 10.1117/12.860044
Proc. SPIE 7794, Analysis of particulate contamination during launch of the MMS mission, 77940P (8 September 2010); doi: 10.1117/12.864331
Proc. SPIE 7794, Bus vent design evolution for the Solar Dynamics Observatory, 77940Q (8 September 2010); doi: 10.1117/12.864484
Proc. SPIE 7794, Comparison of measured and analytical ultraviolet light attenuation, 77940R (8 September 2010); doi: 10.1117/12.862165
Stray Light in Optical Systems I
Proc. SPIE 7794, Deterministic sequential stray light analysis, 77940T (8 September 2010); doi: 10.1117/12.860861
Proc. SPIE 7794, Scattering from moderately rough interfaces between two arbitrary media, 77940V (8 September 2010); doi: 10.1117/12.863995
Stray Light in Optical Systems II
Proc. SPIE 7794, Stray light testing of the OLI Telescope, 77940W (8 September 2010); doi: 10.1117/12.862225
Proc. SPIE 7794, Study on the ghost images spatial distribution in high power laser facilities, 77940X (8 September 2010); doi: 10.1117/12.860459
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