PROCEEDINGS VOLUME 7801
SPIE OPTICAL ENGINEERING + APPLICATIONS | 1-5 AUGUST 2010
Advances in Metrology for X-Ray and EUV Optics III
Proceedings Volume 7801 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
1-5 August 2010
San Diego, California, United States
Front Matter
Proc. SPIE 7801, Front Matter for Volume 7801, 780101 (7 October 2010); doi: 10.1117/12.877480
Long Trace Profiler Development I
Proc. SPIE 7801, Developmental long trace profiler using optimally aligned mirror-based pentaprism, 780103 (2 September 2010); doi: 10.1117/12.859925
Proc. SPIE 7801, Present status of upgraded long trace profiler for characterization of high-precision x-ray mirrors at SPring-8, 780104 (2 September 2010); doi: 10.1117/12.861021
Long Trace Profiler Development II
Proc. SPIE 7801, Recent upgrades to the Diamond-NOM: A slope measuring profiler capable of characterizing the surface profile of large optics with sub-nanometer repeatability, 780105 (27 August 2010); doi: 10.1117/12.861623
Proc. SPIE 7801, Studies in optimal configuration of the LTP, 780106 (2 September 2010); doi: 10.1117/12.861401
Proc. SPIE 7801, ESRF metrology laboratory: overview of instrumentation, measurement techniques, and data analysis, 780107 (27 August 2010); doi: 10.1117/12.864141
Surface Metrology
Proc. SPIE 7801, Using the power spectral density method to characterise the surface topography of optical surfaces, 780108 (28 August 2010); doi: 10.1117/12.861539
Interferometry, Optics, and Calibration
Proc. SPIE 7801, A double-pass Fizeau interferometer system for measuring the figure error of large synchrotron optics, 78010A (27 August 2010); doi: 10.1117/12.861538
Proc. SPIE 7801, Calibration of the modulation transfer function of surface profilometers with binary pseudo-random test standards: expanding the application range, 78010B (2 September 2010); doi: 10.1117/12.860049
Proc. SPIE 7801, Large-field high-energy KB microscope with aperiodic multilayer, 78010C (2 September 2010); doi: 10.1117/12.860271
At-wavelength Metrology and Imaging
Proc. SPIE 7801, At-wavelength optical metrology development at the ALS, 78010D (28 August 2010); doi: 10.1117/12.859946
Proc. SPIE 7801, New capabilities for predicting image degradation from optical surface metrology data, 78010E (27 August 2010); doi: 10.1117/12.859758
Proc. SPIE 7801, Characterization of the DT ice layer in a fusion capsule using a two-dimensional x-ray shearing interferometer, 78010F (2 September 2010); doi: 10.1117/12.859932
Proc. SPIE 7801, Study of 18.2-nm Schwarzschild microscope for plasma diagnostics, 78010G (25 August 2010); doi: 10.1117/12.860281
Poster Session
Proc. SPIE 7801, Surface profile measurement of KB mirrors using Fizeau laser interferometer, 78010K (27 August 2010); doi: 10.1117/12.860760
Proc. SPIE 7801, In situ long trace profiler for measurement of Wolter type-I mirror, 78010L (2 September 2010); doi: 10.1117/12.863366
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