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Compact spectrometer for the analysis of high harmonics content of extreme-ultraviolet free-electron-laser radiation
Stress analysis of Mo, MoSi2 and Si mono-layer thin films and multilayers prepared by magnetron sputtering
Computer-controlled cylindrical polishing process for development of grazing incidence optics for the hard x-ray region
Micro-imaging performance of multilayers used as monochromators for coherent hard x-ray synchrotron radiation
EUV spectroscopic imaging observations of the first mission of Japanese small scientific satellites series
Compact extreme ultraviolet source by use of a discharge-produced potassium plasma for surface morphology application