PROCEEDINGS VOLUME 7855
PHOTONICS ASIA 2010 | 18-20 OCTOBER 2010
Optical Metrology and Inspection for Industrial Applications
Proceedings Volume 7855 is from: Logo
PHOTONICS ASIA 2010
18-20 October 2010
Beijing, China
Front Matter: Volume 7855
Proc. SPIE 7855, Front Matter: Volume 7855, 785501 (9 December 2010); doi: 10.1117/12.886292
Optical Metrology for Nondestructive Testing
Proc. SPIE 7855, PEM-based polarimeters for industrial applications, 785502 (5 November 2010); doi: 10.1117/12.870044
Proc. SPIE 7855, Computer simulation of photomechanics, 785503 (11 November 2010); doi: 10.1117/12.871332
Proc. SPIE 7855, Spectroscopic topological Stokes polarimeter, 785504 (11 November 2010); doi: 10.1117/12.871805
Proc. SPIE 7855, Measurement of the elastic modulus of solid material with objective speckles field, 785507 (11 November 2010); doi: 10.1117/12.870447
Proc. SPIE 7855, Determination of the optimal marker positions for optical extensometer considering lens distortion, 785508 (11 November 2010); doi: 10.1117/12.871330
Proc. SPIE 7855, Error analysis of strain measurement induced by operating temperature of uncooled CCD, 785509 (11 November 2010); doi: 10.1117/12.871331
Proc. SPIE 7855, Optical system design for crack inspections using magneto-optical imaging, 78550A (11 November 2010); doi: 10.1117/12.870050
Optical Metrology Devices
Proc. SPIE 7855, Development of an inner profile measurement instrument using a ring beam device, 78550B (11 November 2010); doi: 10.1117/12.870825
Proc. SPIE 7855, A palm-top camera for 3D profilometry incorporating a MEMS scanner, 78550D (11 November 2010); doi: 10.1117/12.870827
Proc. SPIE 7855, Phase shift based measurements using a pocket LCD projector, 78550E (11 November 2010); doi: 10.1117/12.871214
Proc. SPIE 7855, A hand-held triangulation sensor for small features measurement, 78550F (11 November 2010); doi: 10.1117/12.872460
Proc. SPIE 7855, A simple optical system for measuring small rotation angle of mechanism, 78550G (11 November 2010); doi: 10.1117/12.871325
Proc. SPIE 7855, Two-coordinate dynamic photoelectric autocollimator based on single linear CCD, 78550H (11 November 2010); doi: 10.1117/12.870026
Proc. SPIE 7855, Absolute phase calculation from one composite RGB fringe pattern image by windowed Fourier transform algorithm, 78550I (11 November 2010); doi: 10.1117/12.868767
Proc. SPIE 7855, High-resolution dynamic three-dimensional profilomety based on a combination of stereovision and color-encoded digital fringe projection, 78550J (11 November 2010); doi: 10.1117/12.869988
Optical Metrology Methods
Proc. SPIE 7855, Profilometry using Fizeau-interferometer based on optical comb interferometry and sinusoidal phase modulation method, 78550K (11 November 2010); doi: 10.1117/12.870985
Proc. SPIE 7855, A displacement reconstruction algorithm used for optical feedback self mixing interferometry system under different feedback levels, 78550L (11 November 2010); doi: 10.1117/12.870051
Proc. SPIE 7855, FPGA-based signal processing in an optical feedback self-mixing interferometry system, 78550M (11 November 2010); doi: 10.1117/12.870057
Proc. SPIE 7855, Time-resolved vibrational surface profile measurement of ultrasonic motor using stroboscopic oblique incidence interferometer, 78550N (11 November 2010); doi: 10.1117/12.871749
Proc. SPIE 7855, Theoretical analysis of the frequency splitting caused by intracavity quartz crystal, 78550P (11 November 2010); doi: 10.1117/12.870681
Proc. SPIE 7855, Optical FMCW interference: a new technology for optical metrology, 78550Q (11 November 2010); doi: 10.1117/12.871815
Proc. SPIE 7855, Profile measurement based on spectral interferometer with multi-wavelength back-propagation methods, 78550R (11 November 2010); doi: 10.1117/12.870987
Proc. SPIE 7855, Sinusoidal wavelength-scanning common-path interferometer with a beam-scanning system for measurement of film thickness variations, 78550S (11 November 2010); doi: 10.1117/12.871030
Analysis and Calibration Methods for Optical Metrology
Proc. SPIE 7855, Error analysis for 3D shape measurement with projector defocusing, 78550T (11 November 2010); doi: 10.1117/12.870715
Proc. SPIE 7855, Calibration of a phase-based 3D imaging system based on uneven fringe projection technique, 78550U (11 November 2010); doi: 10.1117/12.868768
Proc. SPIE 7855, Calibration target reconstruction for 3-D vision inspection system of large-scale engineering objects, 78550V (11 November 2010); doi: 10.1117/12.870287
Proc. SPIE 7855, Phase error correction based on Inverse Function Shift Estimation in Phase Shifting Profilometry using a digital video projector, 78550W (11 November 2010); doi: 10.1117/12.870369
Proc. SPIE 7855, Fast quality-guided flood-fill phase unwrapping algorithm for three-dimensional fringe pattern profilometry, 78550X (11 November 2010); doi: 10.1117/12.870232
Proc. SPIE 7855, Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy, 78550Y (11 November 2010); doi: 10.1117/12.872022
Proc. SPIE 7855, Measuring method for the object pose based on monocular vision technology, 78550Z (11 November 2010); doi: 10.1117/12.868984
Proc. SPIE 7855, Effect of color illumination on color contrast in color vision application, 785510 (11 November 2010); doi: 10.1117/12.869924
Proc. SPIE 7855, An anti-noise subpixel algorithm based on phase-shifting of Fourier transform and its application in CCD photoelectric autocollimator, 785511 (11 November 2010); doi: 10.1117/12.870072
Proc. SPIE 7855, Effect of structural parameters on the performance of fiber distance sensor with single mode illumination and inclined-fiber receiving, 785512 (11 November 2010); doi: 10.1117/12.870099
Optical Metrology Applications
Proc. SPIE 7855, 3D profilometry: next requests from the industrial viewpoint, 785513 (11 November 2010); doi: 10.1117/12.871778
Proc. SPIE 7855, Optical coherence tomography used for jade industry, 785514 (11 November 2010); doi: 10.1117/12.868577
Proc. SPIE 7855, A fast three-dimensional reconstruction method applied for the fabric defect detection, 785515 (12 November 2010); doi: 10.1117/12.868512
Proc. SPIE 7855, A novel method to measure wheelset parameters based on laser displacement sensor on line, 785516 (12 November 2010); doi: 10.1117/12.869408
Proc. SPIE 7855, Steam wetness measurement using CCD imaging methods in low-pressure turbine, 785517 (12 November 2010); doi: 10.1117/12.869892
Proc. SPIE 7855, Green inspection station, 785519 (12 November 2010); doi: 10.1117/12.870666
Poster Session
Proc. SPIE 7855, The influence of BRDF calibration to CT industry NDT, 78551C (12 November 2010); doi: 10.1117/12.868317
Proc. SPIE 7855, The study of interferometer spectrometer based on DSP and linear CCD, 78551D (12 November 2010); doi: 10.1117/12.868435
Proc. SPIE 7855, Study on a novel illuminance calibration method for signal to noise ratio measurement of image intensifier, 78551E (12 November 2010); doi: 10.1117/12.868452
Proc. SPIE 7855, 3D profile measurement by using projection speckle pattern correlation method, 78551F (12 November 2010); doi: 10.1117/12.868510
Proc. SPIE 7855, Design of 3D vision probe based on auto-focus, 78551G (12 November 2010); doi: 10.1117/12.868519
Proc. SPIE 7855, Principle of a novel displacement sensor based on infrared He-Ne laser, 78551H (12 November 2010); doi: 10.1117/12.868878
Proc. SPIE 7855, Pose estimation from four corresponding points with a single camera, 78551I (12 November 2010); doi: 10.1117/12.869474
Proc. SPIE 7855, Ultraviolet bidirectional reflectance distribution function measurement and analysis of typical roughness surface, 78551J (12 November 2010); doi: 10.1117/12.869722
Proc. SPIE 7855, Application of photoelectric autocollimator in detecting position precision of NC motorized stage, 78551K (12 November 2010); doi: 10.1117/12.869820
Proc. SPIE 7855, Distance measurement for curved surface based on confocal technique, 78551L (12 November 2010); doi: 10.1117/12.869825
Proc. SPIE 7855, Fluorescence rejection by shifted excitation Raman difference spectroscopy, 78551M (12 November 2010); doi: 10.1117/12.869893
Proc. SPIE 7855, Computer simulation of phase-shift algorithm, 78551O (12 November 2010); doi: 10.1117/12.869917
Proc. SPIE 7855, A real-time multipoint tracking system based on FPGA for multi-touch and motion tracking, 78551Q (12 November 2010); doi: 10.1117/12.870088
Proc. SPIE 7855, The research of on-line inspection method of printed matter based on optical information processing, 78551T (12 November 2010); doi: 10.1117/12.870231
Proc. SPIE 7855, A laser self-mixing interference vibrometer based on current modulation and DSP demodulation, 78551U (12 November 2010); doi: 10.1117/12.870264
Proc. SPIE 7855, The development of optical fringe measurement system integrated with a CMM for products inspection, 78551W (12 November 2010); doi: 10.1117/12.870377
Proc. SPIE 7855, Influence of surface material characteristics on laser radar 3D imaging of targets, 78551Z (12 November 2010); doi: 10.1117/12.870521
Proc. SPIE 7855, CCD calibration method for wheel set wear online measurement, 785521 (12 November 2010); doi: 10.1117/12.870564
Proc. SPIE 7855, Three registration strategies for point clouds in optical inspection of free form shaped plastic parts, 785522 (12 November 2010); doi: 10.1117/12.870568