Proceedings Volume 7930 is from: Logo
SPIE MOEMS-MEMS
22-27 January 2011
San Francisco, California, United States
Front Matter
Proc. SPIE 7930, Front Matter: Volume 7930, 793001 (26 March 2011); doi: 10.1117/12.891493
MOEMS-MEMS Plenary Session
Proc. SPIE 7930, Lateral spread of MEMS WDM technologies, 793003 (11 February 2011); doi: 10.1117/12.882725
MEMS-Based Endomicroscopy: Joint Session with Conference 7893
Proc. SPIE 7930, MEMS-based laser scanning microscope for endoscopic use, 793004 (11 February 2011); doi: 10.1117/12.874625
Proc. SPIE 7930, An improved focus control mirror using SU-8 wafer bonding process, 793005 (14 February 2011); doi: 10.1117/12.876672
Proc. SPIE 7930, SU-8 focus control mirrors released by XeF2 dry etch, 793006 (14 February 2011); doi: 10.1117/12.877077
Display and Imaging I
Proc. SPIE 7930, Electrowetting-based liquid lenses for endoscopy, 793008 (14 February 2011); doi: 10.1117/12.879133
Proc. SPIE 7930, Liquid crystal lens auto-focus extended to optical image stabilization for wafer level camera, 793009 (14 February 2011); doi: 10.1117/12.875575
Proc. SPIE 7930, Tunable liquid lens with reduced chromatic and spherical aberration, 79300A (14 February 2011); doi: 10.1117/12.879602
Proc. SPIE 7930, A multi-aperture approach to wafer-level camera lenses, 79300B (14 February 2011); doi: 10.1117/12.873158
Proc. SPIE 7930, Ultra-compact imaging system based on multi-aperture architecture, 79300C (14 February 2011); doi: 10.1117/12.873520
Proc. SPIE 7930, Design of an ultra-thin objective lens based on superposition compound eye, 79300D (14 February 2011); doi: 10.1117/12.873611
Display and Imaging II
Proc. SPIE 7930, Microbolometers for thermography and night vision markets, 79300E (14 February 2011); doi: 10.1117/12.871337
Proc. SPIE 7930, MEMS-based handheld projection systems and a survey of applications, 79300F (14 February 2011); doi: 10.1117/12.876154
Proc. SPIE 7930, MEMS scanned laser head-up display, 79300G (14 February 2011); doi: 10.1117/12.879031
Proc. SPIE 7930, Vertical electrostatically 90° turning flaps for reflective MEMS display, 79300H (14 February 2011); doi: 10.1117/12.873840
Microspectroscopy and Optical Filter
Proc. SPIE 7930, Out-of-plane translatory MEMS actuator with extraordinary large stroke for optical path length modulation, 79300I (14 February 2011); doi: 10.1117/12.879069
Proc. SPIE 7930, Characterization of MEMS FTIR spectrometer, 79300J (14 February 2011); doi: 10.1117/12.876124
Proc. SPIE 7930, Tunable mid-infrared filter based on Fabry-Perot interferometer with two movable reflectors, 79300K (14 February 2011); doi: 10.1117/12.875428
Proc. SPIE 7930, Fabrication and testing of MEMS-based optical filter combined with a HgCdTe detector, 79300L (14 February 2011); doi: 10.1117/12.874345
Devices for Space Applications: Joint Session with Conference 7928 and 7931
Proc. SPIE 7930, Ultra-low-power multiplexed electronic driver for high resolution deformable mirror systems, 79300M (14 February 2011); doi: 10.1117/12.876404
Proc. SPIE 7930, MEMS-based programmable reflective slit mask for multi-object spectroscopy, 79300N (14 February 2011); doi: 10.1117/12.874438
Proc. SPIE 7930, Focal plane array spectrometer: miniaturization effort for space optical instruments, 79300O (14 February 2011); doi: 10.1117/12.882501
MOEM Components and Systems I
Proc. SPIE 7930, Shaping light with MOEMS, 79300P (14 February 2011); doi: 10.1117/12.873051
Proc. SPIE 7930, Large diameter dual-axis MEMS-based mirror for laser beam steering, 79300Q (14 February 2011); doi: 10.1117/12.876212
Proc. SPIE 7930, MEMS scanning laser projection based on high-Q vacuum packaged 2D-resonators, 79300R (14 February 2011); doi: 10.1117/12.878676
Proc. SPIE 7930, Optical position feedback and phase control of resonant 1D and 2D MOEMS-scanners, 79300S (14 February 2011); doi: 10.1117/12.873261
Proc. SPIE 7930, Integration of near-field probes and photonic crystal nanocavities for precise and low-loss resonance control, 79300T (14 February 2011); doi: 10.1117/12.879571
MOEM Components and Systems II
Proc. SPIE 7930, MEMSEye for optical 3D position and orientation measurement, 79300U (14 February 2011); doi: 10.1117/12.879150
Proc. SPIE 7930, Integrated piezoresistive position detection for electrostatic driven micro scanning mirrors, 79300V (14 February 2011); doi: 10.1117/12.874979
Proc. SPIE 7930, Microfabricated mirrors for space applications, 79300W (15 February 2011); doi: 10.1117/12.875038
Proc. SPIE 7930, Design and fabrication of a pre-aligned free-space optical interconnection device, 79300X (14 February 2011); doi: 10.1117/12.878470
MOEM Components and Systems III
Proc. SPIE 7930, Development of on-CMOS chip micro-photonic and MOEMS systems, 79300Z (14 February 2011); doi: 10.1117/12.873353
Proc. SPIE 7930, In situ surface topography measurement of MOEMS structures under laser exposure, 793010 (14 February 2011); doi: 10.1117/12.877062
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