PROCEEDINGS VOLUME 8169
SPIE OPTICAL SYSTEMS DESIGN | 5-8 SEPTEMBER 2011
Optical Fabrication, Testing, and Metrology IV
Proceedings Volume 8169 is from: Logo
SPIE OPTICAL SYSTEMS DESIGN
5-8 September 2011
Marseille, France
Front Matter
Proc. SPIE 8169, Front Matter: Volume 8169, 816901 (14 October 2011); doi: 10.1117/12.917107
Conventional Optics: Manufacturing and Testing I
Proc. SPIE 8169, MRF with adjustable pH, 816902 (22 September 2011); doi: 10.1117/12.902235
Proc. SPIE 8169, Stress polishing of E-ELT segment at LAM: full-scale demonstrator status, 816903 (30 September 2011); doi: 10.1117/12.896704
Proc. SPIE 8169, Manufacturing and testing of the large lenses for Dark Energy Survey (DES) at SESO, 816904 (22 September 2011); doi: 10.1117/12.896823
Proc. SPIE 8169, TMA optics for HISUI HSS and MSS imagers, 816905 (3 October 2011); doi: 10.1117/12.902236
Proc. SPIE 8169, Fused silica long-term stability: case studies, 816906 (22 September 2011); doi: 10.1117/12.896758
Conventional Optics: Manufacturing and Testing II
Proc. SPIE 8169, Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV), 816907 (21 September 2011); doi: 10.1117/12.896714
Proc. SPIE 8169, Experimental determination of aberration in lithographic lens by aerial image, 816909 (30 September 2011); doi: 10.1117/12.896319
Conventional Optics: Manufacturing and Testing III
Proc. SPIE 8169, Wavefront reconstruction and piston measurement using Ronchi test, 81690A (22 September 2011); doi: 10.1117/12.896988
Microoptics and Microstructures I
Proc. SPIE 8169, Wafer-level micro-optics: trends in manufacturing, testing, and packaging, 81690C (30 September 2011); doi: 10.1117/12.897114
Proc. SPIE 8169, Fabrication and testing of highly efficient resonance domain diffractive optical elements, 81690D (22 September 2011); doi: 10.1117/12.898991
Microoptics and Microstructures II
Proc. SPIE 8169, Method for the characterization of Fresnel lens flux transfer performance, 81690E (22 September 2011); doi: 10.1117/12.896870
Proc. SPIE 8169, Manufacturing, testing, and metrology of axi-symmetric circular phase masks for stellar coronagraphy, 81690G (30 September 2011); doi: 10.1117/12.897010
Proc. SPIE 8169, Fabrication of bilayer wire grid polarizer using replicated polymer nano grating, 81690H (22 September 2011); doi: 10.1117/12.896756
Scattering and Photometry I
Proc. SPIE 8169, Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatings, 81690K (30 September 2011); doi: 10.1117/12.896730
Proc. SPIE 8169, Spectrophotometric bench dedicated to the characterization of micro-patterned optical coatings, 81690N (30 September 2011); doi: 10.1117/12.896822
Scattering and Photometry II
Proc. SPIE 8169, SCPEM-based polarization modulation ellipsometry in the NIR, 81690O (30 September 2011); doi: 10.1117/12.896914
Proc. SPIE 8169, Roughness characterization of large EUV mirror optics by laser light scattering, 81690P (30 September 2011); doi: 10.1117/12.896792
Proc. SPIE 8169, 3D features measurement using YieldStar: an angle resolved polarized scatterometer, 81690Q (30 September 2011); doi: 10.1117/12.897582
Proc. SPIE 8169, Impact of surface roughness on the scatter losses and the scattering distribution of surfaces and thin film coatings, 81690R (30 September 2011); doi: 10.1117/12.896989
Surface Profile Measurement I
Proc. SPIE 8169, Isara 400 ultra-precision CMM, 81690T (30 September 2011); doi: 10.1117/12.902237
Proc. SPIE 8169, Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler, 81690V (22 September 2011); doi: 10.1117/12.896724
Proc. SPIE 8169, Phase-shifting fringe projection system using freeform optics, 81690W (30 September 2011); doi: 10.1117/12.896819
Surface Profile Measurement II
Proc. SPIE 8169, Data handling and representation of freeform surfaces, 81690X (1 October 2011); doi: 10.1117/12.896848
Proc. SPIE 8169, Adaptive two-beam interferometer for testing optical surfaces, 81690Y (22 September 2011); doi: 10.1117/12.896786
Proc. SPIE 8169, Adaptive null test system using a ferrofluid deformable mirror, 81690Z (30 September 2011); doi: 10.1117/12.896923
Proc. SPIE 8169, Optical method for the surface topographic characterization of Fresnel lenses, 816910 (22 September 2011); doi: 10.1117/12.896952
Poster Session
Proc. SPIE 8169, Extremely aspheric surfaces: toward a manufacturing process based on active optics, 816912 (1 October 2011); doi: 10.1117/12.896578
Proc. SPIE 8169, Two-dimensional thickness measurement of a dielectric thin layer on a metal by use of surface-plasmon-resonance-based ellipsometry, 816913 (30 September 2011); doi: 10.1117/12.896767
Proc. SPIE 8169, Wavefront instabilities in thin glass mirrors, 816914 (30 September 2011); doi: 10.1117/12.896773
Proc. SPIE 8169, Absolute calibration of three reference flats based on an iterative algorithm: study and implementation, 816915 (22 September 2011); doi: 10.1117/12.896784
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