PROCEEDINGS VOLUME 8202
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011) | 6-9 NOVEMBER 2011
2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011)
6-9 November 2011
Beijing, Beijing, China
Poster Session: Solid State Lighting and Display Technologies
Proc. SPIE 8202, Accelerated aging test on LEDs life estimation, 820202 (29 November 2011); doi: 10.1117/12.906118
Proc. SPIE 8202, A new type of stereoscopic 3D mini-projector, 820203 (29 November 2011); doi: 10.1117/12.907074
Proc. SPIE 8202, Luminescence properties of Eu2+/Dy3+ co-doped high silica glass for white LED, 820204 (29 November 2011); doi: 10.1117/12.907219
Holography, Speckle Pattern, Interferometry and Applications I
Proc. SPIE 8202, Comparison and analysis on the methods of improving the image quality in digital hologram reconstruction, 820205 (29 November 2011); doi: 10.1117/12.906663
Proc. SPIE 8202, Accuracy of a multiple height-transfer interferometric technique for absolute distance metrology, 820206 (29 November 2011); doi: 10.1117/12.906909
Proc. SPIE 8202, Three-dimensional information encryption with optical asymmetric cryptography and digital interferometry, 820207 (29 November 2011); doi: 10.1117/12.907249
Holography, Speckle Pattern, Interferometry and Applications II
Proc. SPIE 8202, A location quantization algorithm for three-dimensional information display by using pure-phase computer-generated hologram, 820208 (29 November 2011); doi: 10.1117/12.907253
Proc. SPIE 8202, The application of DOE in uniform illumination for large area digital speckle pattern interferometry, 820209 (29 November 2011); doi: 10.1117/12.903997
Proc. SPIE 8202, Robust digital speckle photography based on radon and Fourier-Mellin transforms, 82020A (29 November 2011); doi: 10.1117/12.904375
Poster Session: Holography, Speckle Pattern, Interferometry and Application
Proc. SPIE 8202, Study of nanometer-level precise phase-shift system used in electronic speckle shearography and phase-shift pattern interferometry, 82020B (29 November 2011); doi: 10.1117/12.902735
Proc. SPIE 8202, Design and manufacture of transmission volume phase holographic grating used in VIS/NIR wave band, 82020C (29 November 2011); doi: 10.1117/12.904962
Proc. SPIE 8202, Laser holographic projection based on interference, 82020D (29 November 2011); doi: 10.1117/12.906533
Micro/Nano Manufacturing and Metrology I
Proc. SPIE 8202, The numerical calculation and analysis for designing a polarization beam splitter based on a rectangular phase grating, 82020E (29 November 2011); doi: 10.1117/12.917484
Proc. SPIE 8202, Studies of the super-smooth mirror roughness by grazing incidence x-ray scattering method, 82020F (29 November 2011); doi: 10.1117/12.917959
Proc. SPIE 8202, A novel in-situ measuring technique for aspheric surface, 82020G (29 November 2011); doi: 10.1117/12.903600
Proc. SPIE 8202, A novel method to calibrate fiber optical tweezers, 82020H (29 November 2011); doi: 10.1117/12.905298
Micro/Nano Manufacturing and Metrology II
Proc. SPIE 8202, Research on motion generation for machining axisymmetric aspheric convex surface, 82020I (30 November 2011); doi: 10.1117/12.917487
Proc. SPIE 8202, Theoretical analysis of optical properties of regular and flexible surface microstructured silicon, 82020J (29 November 2011); doi: 10.1117/12.907345
Proc. SPIE 8202, The simulation research of multi-core optical fiber near-field optical tweezers, 82020K (30 November 2011); doi: 10.1117/12.905308
Proc. SPIE 8202, Research on the h-BN films for high frequency SAW devices, 82020L (29 November 2011); doi: 10.1117/12.905402
Proc. SPIE 8202, Enhanced infrared normal spectral emissivity of microstructured silicon at 200 to 400 degrees C, 82020M (29 November 2011); doi: 10.1117/12.905519
Micro/Nano Manufacturing and Metrology III
Proc. SPIE 8202, Ultra-precision turning of complex spiral optical delay line, 82020N (29 November 2011); doi: 10.1117/12.911858
Proc. SPIE 8202, Simulation research on diamond cutting of mold steel using SPH method, 82020O (30 November 2011); doi: 10.1117/12.916665
Proc. SPIE 8202, The influence of refractive index profile on the numeric aperture in a double-layer large-core fiber, 82020P (29 November 2011); doi: 10.1117/12.907232
Proc. SPIE 8202, A new kind of high birefringence photonic crystal fibers with square-lattice cladding, 82020Q (29 November 2011); doi: 10.1117/12.907233
Proc. SPIE 8202, Analysis of the vectorial diffraction characteristics of grating light modulators for MOEMS spectrometer, 82020R (30 November 2011); doi: 10.1117/12.907338
Proc. SPIE 8202, VLS growth of GaAs/InGaAs/GaAs axial double-heterostructure nanowires, 82020S (29 November 2011); doi: 10.1117/12.921312
Poster Session: Micro/Nano Manufacturing and Metrology
Proc. SPIE 8202, Study of the vapor cell size at high sensitive Cs magnetometer, 82020T (29 November 2011); doi: 10.1117/12.904724
Proc. SPIE 8202, Spatial separation on the reflected intensity of electromagnetic wavepackets in single film structure, 82020U (29 November 2011); doi: 10.1117/12.904821
Proc. SPIE 8202, Characterization of the polarization beam splitters based on optical micro/nano-fiber, 82020V (29 November 2011); doi: 10.1117/12.904836
Proc. SPIE 8202, Surface plasmon polaritions excitation by radially polarized vortex beams, 82020W (29 November 2011); doi: 10.1117/12.904899
Proc. SPIE 8202, Subwavelength binary blazed grating optical switch based on TiO2-on-SiO2, 82020X (29 November 2011); doi: 10.1117/12.905171
Proc. SPIE 8202, The research of measuring special optical fiber refractive index profiles by refracted near-field method, 82020Y (29 November 2011); doi: 10.1117/12.906262
Proc. SPIE 8202, Calculation of duty cycle of beam sampling grating mask and analysis on diffraction efficiency uniformity of beam sampling grating, 82020Z (29 November 2011); doi: 10.1117/12.906516
Proc. SPIE 8202, Fabrication of annular waveguide layer capillary optical fiber preform and temperature field distribution during fiber draw, 820210 (29 November 2011); doi: 10.1117/12.906519
Proc. SPIE 8202, The polishing detection method of side-polished fiber, 820211 (29 November 2011); doi: 10.1117/12.906590
Proc. SPIE 8202, Design of micro-optical tweezers, 820212 (29 November 2011); doi: 10.1117/12.906996
Proc. SPIE 8202, A method of fabricating blazed grating by homogenous grating mask, 820213 (29 November 2011); doi: 10.1117/12.907013
Proc. SPIE 8202, Research on the property of electro-deposited Ni-Fe-SiC alloy for MEMS, 820214 (29 November 2011); doi: 10.1117/12.907055
Proc. SPIE 8202, Design and fabrication of the progressive addition lenses, 820215 (29 November 2011); doi: 10.1117/12.907057
Proc. SPIE 8202, Research on key technique of microscopy three-dimensional image reconstruction based on piezoelectric ceramics, 820216 (30 November 2011); doi: 10.1117/12.907209
Proc. SPIE 8202, Study on infrared absorption of tungsten nanofilms, 820217 (29 November 2011); doi: 10.1117/12.911878
Proc. SPIE 8202, Low chromatic aberration of gradient refractive index rod lens for K+/Tl+ ion exchange, 820218 (29 November 2011); doi: 10.1117/12.911958
Proc. SPIE 8202, Research on coupling efficiency of optical coherence tomography system with gradient refractive index rod lens, 820219 (29 November 2011); doi: 10.1117/12.911959
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