PROCEEDINGS VOLUME 8417
6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2012) | 26-29 APRIL 2012
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
IN THIS VOLUME

0 Sessions, 146 Papers, 0 Presentations
session 3-1  (5)
session 3-2  (7)
session 3-3  (4)
Poster  (129)
6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES (AOMATT 2012)
26-29 April 2012
Xiamen, China
Front Matter: Volume 8417
Proc. SPIE 8417, Front Matter: Volume 8417, 841701 (15 October 2012); doi: 10.1117/12.2009279
session 3-1
Proc. SPIE 8417, Research on sensing characteristics of low-finesse fiber-optic Fabry-Perot cavity, 841702 (15 October 2012); doi: 10.1117/12.966803
Proc. SPIE 8417, Design of a panoramic annular lens with a horizontal symmetric FOV, 841703 (15 October 2012); doi: 10.1117/12.974921
Proc. SPIE 8417, Comparison and analysis of three different methods for the paraboloid testing, 841704 (15 October 2012); doi: 10.1117/12.977929
Proc. SPIE 8417, Analysis of the configuration of the modulation elements in an intracavity modulation laser, 841705 (15 October 2012); doi: 10.1117/12.975799
Proc. SPIE 8417, Confocal microscope method for curvature radius measurement of small lens, 841706 (15 October 2012); doi: 10.1117/12.966325
session 3-2
Proc. SPIE 8417, 3D detection technique of surface defects for heavy rail based on binocular stereo vision, 841707 (15 October 2012); doi: 10.1117/12.979738
Proc. SPIE 8417, Cylindrically symmetric vector beams obtained by overlapping optical vortices, 841708 (15 October 2012); doi: 10.1117/12.975742
Proc. SPIE 8417, Two-dimensional interferogram extrapolation method using linear carrier-frequency, 841709 (15 October 2012); doi: 10.1117/12.978256
Proc. SPIE 8417, Photogrammetric scale-bar measurement method based on microscopic image aiming, 84170A (15 October 2012); doi: 10.1117/12.974264
Proc. SPIE 8417, Phase error analysis for birefringent homogeneity measurements of large-scale optical materials with spherical mirror, 84170B (15 October 2012); doi: 10.1117/12.975829
Proc. SPIE 8417, Research on measurement of the infrared characteristic of trails produced by solid engine, 84170C (15 October 2012); doi: 10.1117/12.978281
Proc. SPIE 8417, Transient laser scattering properties of short pulses by a bubble in the sea water, 84170D (15 October 2012); doi: 10.1117/12.971421
session 3-3
Proc. SPIE 8417, Development of a computer-aided alignment simulator for an EO/IR dual-band airborne camera, 84170E (15 October 2012); doi: 10.1117/12.2002562
Proc. SPIE 8417, Two-dimensional structural surface measurement based on spectrally resolved white-light interferometry, 84170F (15 October 2012); doi: 10.1117/12.964378
Proc. SPIE 8417, New half-film method for measuring Al2O3 film MTF of 3rd generation image intensifier, 84170G (15 October 2012); doi: 10.1117/12.975927
Proc. SPIE 8417, Characterization of optical components using contact and non-contact interferometry techniques: advanced metrology for optical components, 84170H (15 October 2012); doi: 10.1117/12.2002563
Poster
Proc. SPIE 8417, Study of exposure process of photoresist using phase-modulated ellipsometer, 84170I (15 October 2012); doi: 10.1117/12.970644
Proc. SPIE 8417, Polarized bidirectional reflectance distribution function for optical substrate and different films, 84170J (15 October 2012); doi: 10.1117/12.974317
Proc. SPIE 8417, Research of processing method for infrared image of sandwich structure composite, 84170K (15 October 2012); doi: 10.1117/12.978926
Proc. SPIE 8417, The computer-aided alignment study of three-mirror off-axis field bias optical system, 84170L (15 October 2012); doi: 10.1117/12.970651
Proc. SPIE 8417, Development of two-framing camera with large format and ultrahigh speed, 84170M (15 October 2012); doi: 10.1117/12.970286
Proc. SPIE 8417, Aerial camera auto focusing system, 84170N (15 October 2012); doi: 10.1117/12.970285
Proc. SPIE 8417, Analyze and research the Moire fringe with information entropy theory, 84170O (15 October 2012); doi: 10.1117/12.965545
Proc. SPIE 8417, Simulation of the TPIF collection efficiency and the improvement of the collection device, 84170P (15 October 2012); doi: 10.1117/12.977193
Proc. SPIE 8417, Compensation method for random drifts of laser beams based on moving average feedback control, 84170Q (15 October 2012); doi: 10.1117/12.963472
Proc. SPIE 8417, Wavefront error sensing based on phase diversity technology and image restoration, 84170R (15 October 2012); doi: 10.1117/12.970394
Proc. SPIE 8417, Research on digital holographic interferometry based on EALCD in three dimensional deformation measurements of objects, 84170S (15 October 2012); doi: 10.1117/12.976312
Proc. SPIE 8417, Analysis of the stealth methods for 'cat's eye' targets, 84170T (15 October 2012); doi: 10.1117/12.974262
Proc. SPIE 8417, New method for measuring the laser-induced damage threshold of optical thin film, 84170U (15 October 2012); doi: 10.1117/12.975932
Proc. SPIE 8417, Judgement and analysis of optical film laser-induced damage, 84170V (15 October 2012); doi: 10.1117/12.973980
Proc. SPIE 8417, Study on the precision measurement of high-flux large aperture sampling grating, 84170W (15 October 2012); doi: 10.1117/12.2002127
Proc. SPIE 8417, Analysis and experiment of random ball test, 84170X (15 October 2012); doi: 10.1117/12.971456
Proc. SPIE 8417, Laser alignment measurement model with double beam, 84170Y (15 October 2012); doi: 10.1117/12.979883
Proc. SPIE 8417, Study on the measurement of thin film thickness with fringe scanning method, 84170Z (15 October 2012); doi: 10.1117/12.973702
Proc. SPIE 8417, Test methods of dynamic range for infrared optical system with wide field of view, 841710 (15 October 2012); doi: 10.1117/12.979251
Proc. SPIE 8417, Wavelength demodulation based on balance structure of PZT stack and reference gratings, 841711 (15 October 2012); doi: 10.1117/12.970613
Proc. SPIE 8417, Development of the flatness standard equipment, 841712 (15 October 2012); doi: 10.1117/12.971458
Proc. SPIE 8417, Method to measurement of the thin film thickness based on digital Moiré technique, 841713 (15 October 2012); doi: 10.1117/12.973675
Proc. SPIE 8417, Study on thermal damage of Diamond-like carbon films based on the finite element method, 841714 (15 October 2012); doi: 10.1117/12.973696
Proc. SPIE 8417, Influence of alignment error and random noise on interferometry flat sub-aperture stitching, 841715 (15 October 2012); doi: 10.1117/12.966324
Proc. SPIE 8417, Hindle test of SiC convex conic hyperboloid, 841716 (15 October 2012); doi: 10.1117/12.971203
Proc. SPIE 8417, Photon-counting image assessment based on standard mutual information using improved 2D entropy, 841717 (15 October 2012); doi: 10.1117/12.975826
Proc. SPIE 8417, Laboratory prototype of image slicer integral field unit for 1m telescope, 841718 (15 October 2012); doi: 10.1117/12.973669
Proc. SPIE 8417, Research on method for improving measurement precision of CCD laser collimation system with adaptability to the environment, 841719 (15 October 2012); doi: 10.1117/12.971199
Proc. SPIE 8417, Multi-object fixed delay Michelson interferometer for astronomical observation, 84171A (15 October 2012); doi: 10.1117/12.977275
Proc. SPIE 8417, Measurement of power spectral density of optical super-smooth surface, 84171B (15 October 2012); doi: 10.1117/12.970308
Proc. SPIE 8417, Influence of thermal distortion in mirrors on the propagation of high power lasers, 84171C (15 October 2012); doi: 10.1117/12.958609
Proc. SPIE 8417, Parameters measurement of rigid gas permeable contact lens based on optical coherence tomography, 84171D (15 October 2012); doi: 10.1117/12.975631
Proc. SPIE 8417, Focal length measurement of microlens-array by the clarity function of digital image, 84171E (15 October 2012); doi: 10.1117/12.973641
Proc. SPIE 8417, Laser-induced breakdown spectroscopy detection of heavy metal in water based on graphite conch method, 84171G (15 October 2012); doi: 10.1117/12.975821
Proc. SPIE 8417, Free-form surface measuring method based on optical theodolite measuring system, 84171H (15 October 2012); doi: 10.1117/12.971439
Proc. SPIE 8417, New type of alga photosynthesis activity modulation fluorometer in situ, 84171I (15 October 2012); doi: 10.1117/12.978762
Proc. SPIE 8417, Compact star simulator with very high accuracy, 84171J (15 October 2012); doi: 10.1117/12.978234
Proc. SPIE 8417, Study on the new manufacturing and testing technologies of Free-form surface optics, 84171K (15 October 2012); doi: 10.1117/12.975177
Proc. SPIE 8417, Kalman filter for noise removal in optical fiber sensing system, 84171L (15 October 2012); doi: 10.1117/12.977936
Proc. SPIE 8417, Infrared face recognition based on multiwavelet transform and PCA, 84171M (15 October 2012); doi: 10.1117/12.975779
Proc. SPIE 8417, Application of laser differential confocal technique in back vertex power measurement for phoropters, 84171N (15 October 2012); doi: 10.1117/12.975924
Proc. SPIE 8417, New approach to accuracy enhancement and traceability realization of radius of curvature measurement, 84171O (15 October 2012); doi: 10.1117/12.975818