Front Matter: Volume 8445
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844501 (13 September 2012); doi: 10.1117/12.2000082
Sparse Aperture Imaging
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844502 (1 September 2012); doi: 10.1117/12.925794
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844503 (12 September 2012); doi: 10.1117/12.925838
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844504 (12 September 2012); doi: 10.1117/12.925883
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844505 (12 September 2012); doi: 10.1117/12.926012
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844506 (12 September 2012); doi: 10.1117/12.928884
Science I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844507 (12 September 2012); doi: 10.1117/12.926548
Air and Space Interferometers
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844508 (12 September 2012); doi: 10.1117/12.926376
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844509 (12 September 2012); doi: 10.1117/12.924998
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450A (12 September 2012); doi: 10.1117/12.926812
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450B (12 September 2012); doi: 10.1117/12.926920
Current Facilities and Instruments I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450C (12 September 2012); doi: 10.1117/12.925462
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450D (12 September 2012); doi: 10.1117/12.925323
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450E (12 September 2012); doi: 10.1117/12.926404
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450F (12 September 2012); doi: 10.1117/12.926426
Science II
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450G (12 September 2012); doi: 10.1117/12.926881
Current Facilities and Instruments II
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450H (12 September 2012); doi: 10.1117/12.926452
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450I (12 September 2012); doi: 10.1117/12.925671
Science III
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450J (12 September 2012); doi: 10.1117/12.925503
Current Facilities and Instruments III
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450K (12 September 2012); doi: 10.1117/12.925223
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450L (12 September 2012); doi: 10.1117/12.979895
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450M (12 September 2012); doi: 10.1117/12.924995
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450N (12 September 2012); doi: 10.1117/12.924946
Science IV
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450O (12 September 2012); doi: 10.1117/12.925456
Planned Facilities and Instruments I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450P (12 September 2012); doi: 10.1117/12.926516
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450Q (12 September 2012); doi: 10.1117/12.927027
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450R (12 September 2012); doi: 10.1117/12.926238
Science V
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450S (12 September 2012); doi: 10.1117/12.926214
Planned Facilities and Instruments II
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450U (12 September 2012); doi: 10.1117/12.926746
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450V (12 September 2012); doi: 10.1117/12.926267
Science VI
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450W (12 September 2012); doi: 10.1117/12.926595
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450X (12 September 2012); doi: 10.1117/12.926642
Current Facilities and Instruments IV
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450Y (12 September 2012); doi: 10.1117/12.926433
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84450Z (12 September 2012); doi: 10.1117/12.926909
Future I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844511 (12 September 2012); doi: 10.1117/12.926168
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844512 (12 September 2012); doi: 10.1117/12.926541
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844513 (12 September 2012); doi: 10.1117/12.926875
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844514 (12 September 2012); doi: 10.1117/12.920997
Technology
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844515 (12 September 2012); doi: 10.1117/12.925636
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844516 (12 September 2012); doi: 10.1117/12.925942
Software and Data Reduction
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844517 (12 September 2012); doi: 10.1117/12.925280
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844519 (12 September 2012); doi: 10.1117/12.925898
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451A (12 September 2012); doi: 10.1117/12.925881
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451B (12 September 2012); doi: 10.1117/12.925689
Software and Image Reconstruction I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451C (12 September 2012); doi: 10.1117/12.926862
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451D (12 September 2012); doi: 10.1117/12.926274
Software and Image Reconstruction II
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451E (12 September 2012); doi: 10.1117/12.924907
Science VII
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451F (12 September 2012); doi: 10.1117/12.925157
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451G (12 September 2012); doi: 10.1117/12.925521
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451H (12 September 2012); doi: 10.1117/12.926801
Critical Sub-Systems I
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451I (12 September 2012); doi: 10.1117/12.926399
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451K (12 September 2012); doi: 10.1117/12.925450
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451L (12 September 2012); doi: 10.1117/12.927136
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451M (12 September 2012); doi: 10.1117/12.925193
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451N (12 September 2012); doi: 10.1117/12.925457
Critical Sub-Systems II
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451O (12 September 2012); doi: 10.1117/12.926813
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451P (12 September 2012); doi: 10.1117/12.926147
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451Q (12 September 2012); doi: 10.1117/12.925684
Science VIII
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451R (12 September 2012); doi: 10.1117/12.926380
Critical Sub-Systems III
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451T (12 September 2012); doi: 10.1117/12.925593
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451U (12 September 2012); doi: 10.1117/12.925391
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451V (12 September 2012); doi: 10.1117/12.926316
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451W (12 September 2012); doi: 10.1117/12.925289
Observing Techniques
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451X (12 September 2012); doi: 10.1117/12.925781
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84451Z (12 September 2012); doi: 10.1117/12.926127
Posters: Observation Techniques
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844520 (12 September 2012); doi: 10.1117/12.924999
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844521 (12 September 2012); doi: 10.1117/12.925238
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844522 (12 September 2012); doi: 10.1117/12.925445
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844524 (12 September 2012); doi: 10.1117/12.926544
Posters: Technology
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844525 (12 September 2012); doi: 10.1117/12.925350
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844526 (12 September 2012); doi: 10.1117/12.926045
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844527 (12 September 2012); doi: 10.1117/12.926171
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452A (12 September 2012); doi: 10.1117/12.926660
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452B (12 September 2012); doi: 10.1117/12.927232
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452C (12 September 2012); doi: 10.1117/12.926237
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452D (12 September 2012); doi: 10.1117/12.926221
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452E (12 September 2012); doi: 10.1117/12.926737
Posters: Aperture Masking
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452G (12 September 2012); doi: 10.1117/12.926204
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452H (12 September 2012); doi: 10.1117/12.926270
Posters: Facilities
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452I (12 September 2012); doi: 10.1117/12.925905
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452J (12 September 2012); doi: 10.1117/12.926285
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452K (12 September 2012); doi: 10.1117/12.926501
Posters: Future Interferometers
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452L (12 September 2012); doi: 10.1117/12.925782
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452M (12 September 2012); doi: 10.1117/12.925953
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452N (12 September 2012); doi: 10.1117/12.926161
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452P (12 September 2012); doi: 10.1117/12.926707
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452Q (12 September 2012); doi: 10.1117/12.927433
Posters: Critical Sub-Systems
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452R (12 September 2012); doi: 10.1117/12.925129
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452S (12 September 2012); doi: 10.1117/12.925151
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452T (12 September 2012); doi: 10.1117/12.925154
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452U (12 September 2012); doi: 10.1117/12.925166
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452V (12 September 2012); doi: 10.1117/12.925312
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452W (12 September 2012); doi: 10.1117/12.925421
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452X (12 September 2012); doi: 10.1117/12.925556
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452Y (12 September 2012); doi: 10.1117/12.925578
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452Z (12 September 2012); doi: 10.1117/12.925836
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844530 (12 September 2012); doi: 10.1117/12.925918
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844531 (12 September 2012); doi: 10.1117/12.925920
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844532 (12 September 2012); doi: 10.1117/12.925931
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844533 (12 September 2012); doi: 10.1117/12.925992
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844534 (12 September 2012); doi: 10.1117/12.925993
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844535 (12 September 2012); doi: 10.1117/12.926005
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844536 (12 September 2012); doi: 10.1117/12.926017
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844538 (12 September 2012); doi: 10.1117/12.926036
Proc. SPIE 8445, Optical and Infrared Interferometry III, 844539 (12 September 2012); doi: 10.1117/12.926531
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453A (12 September 2012); doi: 10.1117/12.926559
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453B (12 September 2012); doi: 10.1117/12.979670
Posters: Software and Data Reduction
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453C (12 September 2012); doi: 10.1117/12.925023
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453D (1 September 2012); doi: 10.1117/12.925539
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453E (12 September 2012); doi: 10.1117/12.925545
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453F (12 September 2012); doi: 10.1117/12.925729
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453G (12 September 2012); doi: 10.1117/12.925818
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453H (12 September 2012); doi: 10.1117/12.925940
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453J (12 September 2012); doi: 10.1117/12.926456
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453K (12 September 2012); doi: 10.1117/12.926508
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453L (12 September 2012); doi: 10.1117/12.927016
Posters: Various
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84453M (12 September 2012); doi: 10.1117/12.926915
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