PROCEEDINGS VOLUME 8492
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
Optical System Contamination: Effects, Measurements, and Control 2012
Proceedings Volume 8492 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8492
Proc. SPIE 8492, Front Matter: Volume 8492, 849201 (15 October 2012); doi: 10.1117/12.2013717
Contamination, Optical, and Thermal Coatings Development, Testing, and Measurements
Proc. SPIE 8492, Chromate conversion coating: Iridite 14-2 thermal/optical characterization, 849202 (15 October 2012); doi: 10.1117/12.958611
Proc. SPIE 8492, Development and testing of molecular adsorber coatings, 849203 (15 October 2012); doi: 10.1117/12.964419
Proc. SPIE 8492, Pre-launch testing and evaluation of typical mirror coatings for space optical instruments, 849206 (15 October 2012); doi: 10.1117/12.964693
Contamination Effects, Measurement, and Mitigation I
Proc. SPIE 8492, Measurement of the accumulation of water ice on optical components in cryogenic vacuum environments, 849207 (15 October 2012); doi: 10.1117/12.929089
Proc. SPIE 8492, Measurement of cryogenic ice sublimation using quartz crystal microbalances, 849208 (15 October 2012); doi: 10.1117/12.946495
Proc. SPIE 8492, Application of ASTM E-1559 apparatus to study H2O desorption, 849209 (15 October 2012); doi: 10.1117/12.946556
Proc. SPIE 8492, Evaluation of bakeout effectiveness by optical measurement of a contaminated surface, 84920A (15 October 2012); doi: 10.1117/12.929453
Contamination Effects, Measurement, and Mitigation II
Proc. SPIE 8492, Volatile contaminant materials: relationship between condensate, effluent and bulk composition, 84920C (15 October 2012); doi: 10.1117/12.930497
Proc. SPIE 8492, VUV modification of surfaces to induce film formation, 84920D (15 October 2012); doi: 10.1117/12.931009
Proc. SPIE 8492, On small disturbance ascent vent behavior, 84920E (18 October 2012); doi: 10.1117/12.946557
Proc. SPIE 8492, Assessment of particle deposition inside payload fairing from launch vehicle plume contribution, 84920F (15 October 2012); doi: 10.1117/12.931022
Contamination Control, Monitoring, and Verification
Proc. SPIE 8492, Next generation nano-contamination monitoring, 84920H (15 October 2012); doi: 10.1117/12.928996
Proc. SPIE 8492, Comparison of particle sampling results from tape lifts and solvent rinses, 84920I (15 October 2012); doi: 10.1117/12.932461
Proc. SPIE 8492, Micromachined reference samples for particle counting, 84920J (15 October 2012); doi: 10.1117/12.940174
Proc. SPIE 8492, Investigation of various clean room gloves for cleanliness, 84920K (15 October 2012); doi: 10.1117/12.966857
Proc. SPIE 8492, Operations of cleanrooms during a forest fire including protocols and monitoring results, 84920L (15 October 2012); doi: 10.1117/12.966274
Poster Session
Proc. SPIE 8492, Optical throughput model, 84920M (15 October 2012); doi: 10.1117/12.930612
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