PROCEEDINGS VOLUME 8493
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
Interferometry XVI: Techniques and Analysis
Proceedings Volume 8493 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8493
Proc. SPIE 8493, Front Matter: Volume 8493, 849301 (13 September 2012); doi: 10.1117/12.2000477
On the Fringe
Proc. SPIE 8493, Measurement and modeling of the thermal behavior of a laboratory DASH interferometer, 849302 (13 September 2012); doi: 10.1117/12.928984
Proc. SPIE 8493, Digital holography reconstruction algorithms to estimate the morphology and depth of nonspherical absorbing particles, 849303 (13 September 2012); doi: 10.1117/12.928869
Proc. SPIE 8493, Spectrally resolved complex transmittance measurements of infrared nanostructured devices, 849304 (13 September 2012); doi: 10.1117/12.929742
Proc. SPIE 8493, A digital gradient sensing method for evaluating orthogonal stress gradients in transparent solids subjected to mechanical loads, 849305 (13 September 2012); doi: 10.1117/12.930634
Proc. SPIE 8493, An interferometric observation of topological effect by novel axially symmetrical wave plate, 849306 (13 September 2012); doi: 10.1117/12.930456
Optical Coherence Tomography
Proc. SPIE 8493, Nondestructive metrology of layered polymeric optical materials using optical coherence tomography, 849307 (13 September 2012); doi: 10.1117/12.930071
Proc. SPIE 8493, Characterization of ink-jet printed RGB color filters with spectral domain optical coherence tomography, 849308 (13 September 2012); doi: 10.1117/12.929681
Proc. SPIE 8493, Wavelength-scanning polarimetric interferometry using channeled spectroscopic polarization state generator, 849309 (13 September 2012); doi: 10.1117/12.929724
Proc. SPIE 8493, Composite low-coherence interferometer for imaging of immersed tissue with high accuracy, 84930A (13 September 2012); doi: 10.1117/12.929126
Spatial Structures and Aberrations
Proc. SPIE 8493, Sub-angstrom surface metrology with a virtual reference interferometer, 84930B (13 September 2012); doi: 10.1117/12.928975
Proc. SPIE 8493, Comparison of the area structure function to alternate approaches for optical surface characterization, 84930C (13 September 2012); doi: 10.1117/12.929166
Proc. SPIE 8493, Diffraction effects for interferometric measurements due to imaging aberrations, 84930D (13 September 2012); doi: 10.1117/12.930104
Proc. SPIE 8493, Fitting high-order Zernike polynomials to finite data, 84930E (13 September 2012); doi: 10.1117/12.930774
Calibration Techniques
Proc. SPIE 8493, Calibrating the sag due to gravity of horizontal interferometer reference flats, 84930F (13 September 2012); doi: 10.1117/12.929968
Proc. SPIE 8493, Absolute interferometric tests of spherical surfaces based on rotational and translational shears, 84930G (13 September 2012); doi: 10.1117/12.930030
Proc. SPIE 8493, Self calibration for slope-dependent errors in optical profilometry by using the random ball test, 84930H (13 September 2012); doi: 10.1117/12.928504
Fringe Analysis
Proc. SPIE 8493, How to remove fundamental-frequency phase errors from phase-shifting results, 84930I (13 September 2012); doi: 10.1117/12.928687
Proc. SPIE 8493, Error estimation of phase detection algorithms and comparison of window functions, 84930J (13 September 2012); doi: 10.1117/12.929785
Proc. SPIE 8493, Regularized self-tuning phase demodulation for phase-shifting interferometry with arbitrary phase shifts, 84930K (13 September 2012); doi: 10.1117/12.929756
Proc. SPIE 8493, Analyzing of fringe patterns polluted by noise and nonlinearity using S-Transform, 84930L (13 September 2012); doi: 10.1117/12.929112
Proc. SPIE 8493, Sinusoidal wavelength-scanning interferometer for profile measurement of metal surfaces, 84930M (13 September 2012); doi: 10.1117/12.929137
Unwrapping Techniques
Proc. SPIE 8493, Dynamic four-dimensional microscope system with automated background leveling, 84930N (13 September 2012); doi: 10.1117/12.929338
Proc. SPIE 8493, Generalized theory of phase unwrapping: approaches and optimal wavelength selection strategies for multiwavelength interferometric techniques, 84930O (13 September 2012); doi: 10.1117/12.929874
Proc. SPIE 8493, Recursive linear systems for phase unwrapping, 84930P (13 September 2012); doi: 10.1117/12.928579
Proc. SPIE 8493, Phase unwrapping fitting local planes to phase gradient, 84930Q (25 September 2012); doi: 10.1117/12.928891
Specular and Translucent Object Measurement
Proc. SPIE 8493, Deflectometry challenges interferometry: the competition gets tougher!, 84930R (13 September 2012); doi: 10.1117/12.957465
Proc. SPIE 8493, Optimization of dynamic structured illumination for surface slope measurements, 84930S (13 September 2012); doi: 10.1117/12.928973
Proc. SPIE 8493, Recovering shapes of specular objects in motion via normal vector map consistency, 84930T (13 September 2012); doi: 10.1117/12.954564
Proc. SPIE 8493, Fast error simulation of optical 3D measurements at translucent objects, 84930U (13 September 2012); doi: 10.1117/12.928409
Digital Holography
Proc. SPIE 8493, Single-shot multiwavelength shape measurements with restricted aperture, 84930V (13 September 2012); doi: 10.1117/12.929782
Proc. SPIE 8493, Instantaneously captured images using multiwavelength digital holography, 84930W (25 September 2012); doi: 10.1117/12.932280
Proc. SPIE 8493, Accurate and quantitative phase retrieval methods for a series of defocused images with application to in-line Gabor microscopy, 84930X (13 September 2012); doi: 10.1117/12.929303
Strain and Shape Measurement
Proc. SPIE 8493, Image quality improvement of an achromatic DSPI interferometer, 84930Z (13 September 2012); doi: 10.1117/12.930499
Proc. SPIE 8493, 3D data processing with advanced computer graphics tools, 849310 (13 September 2012); doi: 10.1117/12.930376
Proc. SPIE 8493, Analysis of solving the point correspondence problem by trifocal tensor for real-time phase measurement profilometry, 849311 (13 September 2012); doi: 10.1117/12.929211
Proc. SPIE 8493, Improve Fourier transform profilometry by locally area modulating squared binary structured pattern, 849312 (13 September 2012); doi: 10.1117/12.927439
Poster Session
Proc. SPIE 8493, A real-time adaptive phase-shifting interferometry, 849313 (13 September 2012); doi: 10.1117/12.929177
Proc. SPIE 8493, Towards a general theory for MxN pixelated carrier interferometry, 849315 (13 September 2012); doi: 10.1117/12.929341
Proc. SPIE 8493, Study of the refractometric stability of an interferometer equipment for gauge block calibration, 849316 (13 September 2012); doi: 10.1117/12.929266
Proc. SPIE 8493, Fabrication of Mach-Zehnder interferometers with conventional fiber optics in detection applications of micro-displacement and liquids, 849317 (13 September 2012); doi: 10.1117/12.929822
Proc. SPIE 8493, Evaluation of interferometric patterns of supersonic fluid flows by the differential Fourier transform method, 849318 (13 September 2012); doi: 10.1117/12.929263
Proc. SPIE 8493, Polynomial fitting model for phase reconstruction: interferograms with high fringe density, 849319 (25 September 2012); doi: 10.1117/12.956500
Proc. SPIE 8493, Selection of phase-recovery algorithms for fringe processing in optical measurement of micro-surface, 84931B (13 September 2012); doi: 10.1117/12.927783
Proc. SPIE 8493, Digital holographic interferometry applied to mixed-mode fracture analysis, 84931C (13 September 2012); doi: 10.1117/12.931661
Proc. SPIE 8493, SCOTS: a useful tool for specifying and testing optics in slope space, 84931D (13 September 2012); doi: 10.1117/12.931112
Proc. SPIE 8493, Precision improving of double beam shadow moire interferometer by phase shifting interferometry for the stress of flexible substrate, 84931E (13 September 2012); doi: 10.1117/12.929509
Proc. SPIE 8493, Photorefractive moiré like pattern as optical numerical code generator, 84931F (13 September 2012); doi: 10.1117/12.931660
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