PROCEEDINGS VOLUME 8494
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
Interferometry XVI: Applications
Proceedings Volume 8494 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8494
Proc. SPIE 8494, Front Matter: Volume 8494, 849401 (13 September 2012); doi: 10.1117/12.2000476
Micro- and Nano-scale Measurements
Proc. SPIE 8494, Characterization of 3D MEMS structural dynamics with a conformal multi-channel fiber optic heterodyne vibrometer, 849402 (13 September 2012); doi: 10.1117/12.930570
Proc. SPIE 8494, Micromachined array-type Mirau interferometer for MEMS metrology, 849403 (13 September 2012); doi: 10.1117/12.932226
Proc. SPIE 8494, Interferometric and tomographic investigations of polymer microtips fabricated at the extremity of optical fibers, 849404 (13 September 2012); doi: 10.1117/12.940779
Proc. SPIE 8494, Calibration of the DOE lens array based multipoint diffraction strain sensor, 849405 (13 September 2012); doi: 10.1117/12.928023
Characterization of Dynamic Events I
Proc. SPIE 8494, A 14-channel multipoint vibrometry system using dynamic holography, 849406 (13 September 2012); doi: 10.1117/12.929734
Proc. SPIE 8494, Eliminating atmospheric optical noise through digital holography, 849407 (13 September 2012); doi: 10.1117/12.930310
Proc. SPIE 8494, Calibration method using sampling moire method for phase-shifting digital holography with multiple imaging devices, 849408 (13 September 2012); doi: 10.1117/12.930744
Proc. SPIE 8494, Digital holographic otoscope for measurements of the human tympanic membrane in vivo, 849409 (13 September 2012); doi: 10.1117/12.954633
Characterization of Dynamic Events II
Proc. SPIE 8494, Investigation of thermomechanical effects of lighting conditions on canvas paintings by laser shearography, 84940A (13 September 2012); doi: 10.1117/12.958089
Proc. SPIE 8494, Improvements in the marking of defects on large structures surfaces during shearographic inspection, 84940B (13 September 2012); doi: 10.1117/12.929553
Proc. SPIE 8494, Dynamic displacement distribution measurement of deforming structure using sampling moire camera, 84940C (13 September 2012); doi: 10.1117/12.924048
Proc. SPIE 8494, A fisheye lens as a photonic Doppler velocimetry probe, 84940D (13 September 2012); doi: 10.1117/12.930195
Proc. SPIE 8494, A polarization-based frequency scanning interferometer and the signal processing acceleration method based on parallel processing architecture, 84940E (13 September 2012); doi: 10.1117/12.930369
Novel Methods and Applications
Proc. SPIE 8494, 3D measurement system on the basis of a tailored free-form mirror, 84940F (25 September 2012); doi: 10.1117/12.928577
Proc. SPIE 8494, Absolute optical surface measurement with deflectometry, 84940G (13 September 2012); doi: 10.1117/12.928690
Proc. SPIE 8494, A next-generation optical surface form inspection instrument for high-volume production applications, 84940H (13 September 2012); doi: 10.1117/12.928888
NDT and Materials Characterization
Proc. SPIE 8494, Toward real-time clamping load measurement using DSPI, 84940I (13 September 2012); doi: 10.1117/12.918797
Proc. SPIE 8494, Point diffraction interferometer for measurement of the refraction index of a glass plate, 84940J (25 September 2012); doi: 10.1117/12.928889
Proc. SPIE 8494, Measuring of temperatures of phase objects using a point-diffraction interferometer plate made with the thermocavitation process, 84940K (25 September 2012); doi: 10.1117/12.927851
Proc. SPIE 8494, Aberration compensation and position scanning of a subaperture stitching algorithm, 84940L (13 September 2012); doi: 10.1117/12.930317
Fringe and Image Processing
Proc. SPIE 8494, Measurement of amorphous corundum layers by self-focusing optical coherence tomography system with matrix detector, 84940M (13 September 2012); doi: 10.1117/12.929278
Proc. SPIE 8494, Non-uniform projection angle processing in computed tomography, 84940N (13 September 2012); doi: 10.1117/12.928045
Poster Session
Proc. SPIE 8494, Interferometer inspection of local defect type Young-Chalmers, 84940O (13 September 2012); doi: 10.1117/12.930049
Proc. SPIE 8494, A modified phase unwrapping algorithm based on phase filtering, 84940P (13 September 2012); doi: 10.1117/12.945218
Proc. SPIE 8494, Quantitative phase microscopy for the study of bone cells on multiple roughness surfaces, 84940Q (13 September 2012); doi: 10.1117/12.928437
Proc. SPIE 8494, The spectrum of a bent fiber Fabry-Perot interferometer under small variations of the refractive index of the environment, 84940R (13 September 2012); doi: 10.1117/12.929377
Proc. SPIE 8494, Determination of failure mechanisms for AlN-based microcantilevers with use of Twyman-Green interferometry, 84940T (13 September 2012); doi: 10.1117/12.932225
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