PROCEEDINGS VOLUME 8504
SPIE OPTICAL ENGINEERING + APPLICATIONS | 12-16 AUGUST 2012
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
IN THIS VOLUME

0 Sessions, 20 Papers, 0 Presentations
Optics I  (2)
Detectors  (2)
Applications  (4)
Lasers  (3)
Proceedings Volume 8504 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
12-16 August 2012
San Diego, California, United States
Front Matter: Volume 8504
Proc. SPIE 8504, Front Matter: Volume 8504, 850401 (13 November 2012); doi: 10.1117/12.2012088
Diagnostics I
Proc. SPIE 8504, The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results, 850404 (15 October 2012); doi: 10.1117/12.929749
Proc. SPIE 8504, X-ray imaging and imaging spectroscopy of fusion plasmas and light-source experiments with spherical optics and pixel array detectors, 850405 (15 October 2012); doi: 10.1117/12.930063
Optics I
Proc. SPIE 8504, Design of an x-ray split- and delay-unit for the European XFEL, 850407 (15 October 2012); doi: 10.1117/12.965547
Proc. SPIE 8504, Mirror-based soft x-ray split-and-delay system for femtosecond pump-probe experiments at LCLS, 850409 (15 October 2012); doi: 10.1117/12.928538
Detectors
Proc. SPIE 8504, Bunch by bunch beam monitoring in 3rd and 4th generation light sources by means of single crystal diamond detectors and quantum well devices, 85040D (19 October 2012); doi: 10.1117/12.929668
Applications
Proc. SPIE 8504, Developing a platform for high-resolution phase contrast imaging of high pressure shock waves in matter, 85040F (17 October 2012); doi: 10.1117/12.929882
Proc. SPIE 8504, Resonant soft x-ray scattering endstation for time-resolved pump-probe measurements at LCLS, 85040G (15 October 2012); doi: 10.1117/12.931492
Proc. SPIE 8504, Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals, 85040H (17 October 2012); doi: 10.1117/12.929294
Proc. SPIE 8504, Hard x-ray delay line for x-ray photon correlation spectroscopy and jitter-free pump-probe experiments at LCLS, 85040I (17 October 2012); doi: 10.1117/12.929759
Lasers
Proc. SPIE 8504, Pump-probe laser development for the European X-ray Free-Electron Laser facility, 85040L (15 October 2012); doi: 10.1117/12.928961
Proc. SPIE 8504, Applying field mapping refractive beam shapers to improve irradiation of photocathode of FEL, 85040N (19 October 2012); doi: 10.1117/12.930274
Diagnostics II
Proc. SPIE 8504, X-ray photon diagnostics devices for the European XFEL, 85040R (15 October 2012); doi: 10.1117/12.929710
Proc. SPIE 8504, A hard X-ray transmissive single-shot spectrometer for FEL sources, 85040S (15 October 2012); doi: 10.1117/12.930943
Proc. SPIE 8504, Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL, 85040U (15 October 2012); doi: 10.1117/12.929805
Poster Session
Proc. SPIE 8504, ultra-thin Bragg crystals for LCLS beam-sharing operation, 85040V (17 October 2012); doi: 10.1117/12.930944
Proc. SPIE 8504, Initial evaluation of the European XFEL undulator commissioning spectrometer with a single channel-cut crystal, 85040X (15 October 2012); doi: 10.1117/12.929755
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