PROCEEDINGS VOLUME 8563
PHOTONICS ASIA | 5-7 NOVEMBER 2012
Optical Metrology and Inspection for Industrial Applications II
IN THIS VOLUME

0 Sessions, 41 Papers, 0 Presentations
3D Methods I  (3)
NDT Methods  (2)
Proceedings Volume 8563 is from: Logo
PHOTONICS ASIA
5-7 November 2012
Beijing, China
Front Matter: Volume 8563
Proc. SPIE 8563, Front Matter: Volume 8563, 856301 (7 January 2013); doi: 10.1117/12.2017914
Metrology Modeling and Simulation
Proc. SPIE 8563, Multi-frequency sweeping interferometry using spatial optical frequency modulation, 856302 (20 November 2012); doi: 10.1117/12.999555
Proc. SPIE 8563, Simulation of real-time large-scale absolute distance measurement with a pair of femtosecond frequency comb lasers, 856303 (20 November 2012); doi: 10.1117/12.999976
Proc. SPIE 8563, An approach to compensate the object movement errors in phase shifting profilometry, 856304 (20 November 2012); doi: 10.1117/12.1000086
Proc. SPIE 8563, A composite quality-guided phase unwrapping algorithm for fast 3D profile measurement, 856305 (20 November 2012); doi: 10.1117/12.1000087
Metrology Calibration
Proc. SPIE 8563, A data processing method to improve the accuracy of depth measurement by binocular stereo vision system, 856306 (20 November 2012); doi: 10.1117/12.999811
Proc. SPIE 8563, Coordinates calibration in precision detection of 3D optical deformation measurement system, 856307 (20 November 2012); doi: 10.1117/12.2000586
Proc. SPIE 8563, Ball-bar based self-calibration technique for five-axis optical measurement system, 856308 (4 December 2012); doi: 10.1117/12.2001247
Proc. SPIE 8563, A new 3D measurement method and its calibration based on the combination of binocular and monocular vision, 856309 (20 November 2012); doi: 10.1117/12.2001255
Metrology Applications I
Proc. SPIE 8563, Imaging Stokes polarimeter by dual rotating retarder and analyzer and its application of evaluation of Japanese lacquer, 85630A (20 November 2012); doi: 10.1117/12.999829
Proc. SPIE 8563, Absolute measurement of optical surface profile with a Fizeau interferometer, 85630B (20 November 2012); doi: 10.1117/12.2000145
Proc. SPIE 8563, Spindle error motion measurement using concentric circle grating and phase modulation interferometers, 85630C (20 November 2012); doi: 10.1117/12.2000812
3D Methods I
Proc. SPIE 8563, Circular gratings' moiré effect for projection measurement in volume optical computerized tomography with two-step phase-shifting method, 85630F (4 December 2012); doi: 10.1117/12.999801
Proc. SPIE 8563, Phase shift reflectometry for sub-surface defect detection, 85630G (6 December 2012); doi: 10.1117/12.1000032
Proc. SPIE 8563, Continuous turbine blade creep measurement based on Moiré, 85630H (20 November 2012); doi: 10.1117/12.2000283
3D Methods II
Proc. SPIE 8563, Towards a one step geometric calibration of an optical coherence tomography, 85630J (20 November 2012); doi: 10.1117/12.999276
Proc. SPIE 8563, Real-time displacement measurement using VCSEL interferometer, 85630K (20 November 2012); doi: 10.1117/12.999720
Proc. SPIE 8563, Small size probe for inner profile measurement of pipes using optical fiber ring beam device, 85630L (20 November 2012); doi: 10.1117/12.999878
Proc. SPIE 8563, Fiber-optic confocal probe with an integrated real-time apex finder for high-precision center thickness measurement of ball lenses, 85630M (20 November 2012); doi: 10.1117/12.999967
Proc. SPIE 8563, OCT for industrial applications, 85630N (20 November 2012); doi: 10.1117/12.2000462
Metrology Applications II
Proc. SPIE 8563, Extended depth of field for visual measurement systems with depth-invariant magnification, 85630O (20 November 2012); doi: 10.1117/12.999609
Proc. SPIE 8563, Simultaneous measurement of birefringence magnitude and direction using Wollaston prism, 85630P (20 November 2012); doi: 10.1117/12.999670
Proc. SPIE 8563, Image detection of inner wall surface of holes in metal sheets through polarization using a 3D TV monitor, 85630Q (20 November 2012); doi: 10.1117/12.999726
Proc. SPIE 8563, Industrial surface finish method comparison for fine finish measurements, 85630R (20 November 2012); doi: 10.1117/12.2000179
NDT Methods
Proc. SPIE 8563, Temporal phase retrieval in dynamic speckle interferometry by adaptive emperical mode decomposition, 85630U (20 November 2012); doi: 10.1117/12.999617
Proc. SPIE 8563, Holographic approach to detection of delamination areas in layered polymeric waveguides by means of strain solitons, 85630V (20 November 2012); doi: 10.1117/12.999709
Poster Session
Proc. SPIE 8563, Research of dynamic detecting the raw silk fineness on line by a linear CCD and FPGA, 85630W (20 November 2012); doi: 10.1117/12.999269
Proc. SPIE 8563, An optoelectronic system for the in-flight measurement of helicopter rotor blades' motions and strains, 85630X (20 November 2012); doi: 10.1117/12.999279
Proc. SPIE 8563, A speed auto-adaptable system for high speed inspection of rail-track defects, 85630Y (20 November 2012); doi: 10.1117/12.999324
Proc. SPIE 8563, Simultaneous measurements of atmospheric NO2 and HONO using IBBCEAS with a near-ultraviolet LED, 856310 (20 November 2012); doi: 10.1117/12.999572
Proc. SPIE 8563, Research on the video detection device in the invisible part of stay cable anchorage system, 856312 (20 November 2012); doi: 10.1117/12.999765
Proc. SPIE 8563, Dynamic measurements by the color grating projection method using a two-step Fourier transform method, 856313 (20 November 2012); doi: 10.1117/12.999769
Proc. SPIE 8563, Multiple-pulse-train-interference-based measurement of refractive index of air using femtosecond optical frequency comb, 856314 (20 November 2012); doi: 10.1117/12.999797
Proc. SPIE 8563, Use of ellipsometer to determine the optical properties of the satellite surface coated materials, 856315 (26 November 2012); doi: 10.1117/12.999870
Proc. SPIE 8563, Traceable dual-frequency measurement of Zeeman split He-Ne lasers using an optical frequency comb locked external cavity diode laser, 856316 (20 November 2012); doi: 10.1117/12.999955
Proc. SPIE 8563, A method for phase unwrapping base digital spackle correlation, 856317 (20 November 2012); doi: 10.1117/12.999965
Proc. SPIE 8563, Analysis of non-uniformity of irradiance measurement uncertainties of a pulsed solar simulator, 856318 (20 November 2012); doi: 10.1117/12.981437
Proc. SPIE 8563, Geometric calibration and accuracy assessment of a multispectral imager on UAVs, 856319 (20 November 2012); doi: 10.1117/12.2000652
Proc. SPIE 8563, Technology of optical azimuth transmission, 85631A (20 November 2012); doi: 10.1117/12.2001199
Proc. SPIE 8563, Algorithm research of high-precision optical interferometric phase demodulation based on FPGA, 85631E (20 November 2012); doi: 10.1117/12.999580
Proc. SPIE 8563, Interferometric determination of the silicon sphere diameter using a laser frequency tuning system calibrated by a Fabry-Perot cavity, 85631G (20 November 2012); doi: 10.1117/12.982012
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