PROCEEDINGS VOLUME 8678
SHORT-WAVELENGTH IMAGING AND SPECTROSCOPY | 10-11 SEPTEMBER 2012
Short-Wavelength Imaging and Spectroscopy Sources
IN THIS VOLUME

0 Sessions, 15 Papers, 0 Presentations
Applications  (4)
SHORT-WAVELENGTH IMAGING AND SPECTROSCOPY
10-11 September 2012
Bern, Switzerland
Front Matter: Volume 8678
Proc. SPIE 8678, Front Matter: Volume 8678, 867801 (31 January 2013); doi: 10.1117/12.2017032
Light Sources
Proc. SPIE 8678, Ultrafast phenomena at the nanoscale: novel science opportunities at the SwissFEL X-ray Laser, 867802 (11 December 2012); doi: 10.1117/12.2011126
Proc. SPIE 8678, Plasma-based XUV lasers, 867803 (11 December 2012); doi: 10.1117/12.2008657
Proc. SPIE 8678, Vacuum-ultraviolet lasers and spectroscopy, 867804 (11 December 2012); doi: 10.1117/12.2011196
Proc. SPIE 8678, Modelization of seeded soft x-ray lasers using plasma amplifiers from solid, 867805 (11 December 2012); doi: 10.1117/12.2011191
Proc. SPIE 8678, Comparison of laboratory-scale XUV laser with xFELs, 867806 (11 December 2012); doi: 10.1117/12.2008733
Proc. SPIE 8678, Lab-scale EUV nano-imaging employing a gas-puff-target source: image quality versus plasma radiation characteristics, 867807 (11 December 2012); doi: 10.1117/12.2006090
Optics and Methods
Proc. SPIE 8678, Laboratory full-field transmission x-ray microscopy, 867808 (11 December 2012); doi: 10.1117/12.2011142
Proc. SPIE 8678, Ptychography: early history and 3D scattering effects, 867809 (11 December 2012); doi: 10.1117/12.2008493
Proc. SPIE 8678, Schwarzschild objective and similar two-mirror systems , 86780A (11 December 2012); doi: 10.1117/12.2002118
Proc. SPIE 8678, Using submicron-resolution LiF crystal and film x-ray detectors for the near and far fields in-situ characterization of soft x-ray laser beams, 86780B (11 December 2012); doi: 10.1117/12.2003489
Applications
Proc. SPIE 8678, Investigating the effects of laser intensity and pulse duration on 6.7-nm BEUV emission from Gadolinium plasma, 86780C (11 December 2012); doi: 10.1117/12.2015164
Proc. SPIE 8678, Elemental analysis with x-ray fluorescence spectrometry, 86780D (11 December 2012); doi: 10.1117/12.2010944
Proc. SPIE 8678, X-ray spectromicroscopy, 86780E (11 December 2012); doi: 10.1117/12.2009660
Proc. SPIE 8678, Imaging with plasma based extreme ultraviolet sources, 86780F (11 December 2012); doi: 10.1117/12.2011139
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