PROCEEDINGS VOLUME 8769
INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN2013) | 9-11 APRIL 2013
International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
INTERNATIONAL CONFERENCE ON OPTICS IN PRECISION ENGINEERING AND NANOTECHNOLOGY (ICOPEN2013)
9-11 April 2013
Singapore, Singapore
Front Matter: Volume 8769
Proc. SPIE 8769, Front Matter: Volume 8769, 876901 (1 July 2013); doi: 10.1117/12.2032090
Keynote Presentation
Proc. SPIE 8769, Surface form metrology of micro-optics, 876902 (22 June 2013); doi: 10.1117/12.2019243
Special Invited Presentations
Proc. SPIE 8769, 3D shape and eccentricity measurements of fast rotating rough objects by two mutually tilted interference fringe systems, 876903 (22 June 2013); doi: 10.1117/12.2020955
Proc. SPIE 8769, Interferometric measurement of functional surfaces, 876904 (22 June 2013); doi: 10.1117/12.2021478
Proc. SPIE 8769, Making, testing, applying: some progress in the field of micro-optics at ITO, 876905 (22 June 2013); doi: 10.1117/12.2020249
Proc. SPIE 8769, Micro-probing system for coordinate metrology using a particle controlled by optical radiation pressure based on standing wave scale sensing method, 876906 (22 June 2013); doi: 10.1117/12.2021261
Proc. SPIE 8769, Optical metrology of semiconductor wafers in lithography, 876907 (22 June 2013); doi: 10.1117/12.2021169
Special Session: Surface Metrology and Precision Engineering I
Proc. SPIE 8769, Real-time 3D capturing-visualization conversion for light field microscopy, 876908 (22 June 2013); doi: 10.1117/12.2021059
Proc. SPIE 8769, Pixel length calibration using a pattern matching method for secondary-electron images, 876909 (22 June 2013); doi: 10.1117/12.2021086
Proc. SPIE 8769, Toroidal surface measurement with elliptical lenslet array, 87690A (22 June 2013); doi: 10.1117/12.2021097
Proc. SPIE 8769, Gated imaging for multi-layer wave-front sensing and surface reconstruction, 87690B (22 June 2013); doi: 10.1117/12.2020845
Optical Metrology and Instrumentation I
Proc. SPIE 8769, High speed digital holographic interferometry for hypersonic flow visualization, 87690C (22 June 2013); doi: 10.1117/12.2020767
Proc. SPIE 8769, Dynamic measurement for the solution concentration variation using digital holographic interferometry and discussion for the measuring accuracy, 87690D (22 June 2013); doi: 10.1117/12.2020155
Proc. SPIE 8769, A reference workpiece for voxel size correction in x-ray computed tomography, 87690E (22 June 2013); doi: 10.1117/12.2020916
Proc. SPIE 8769, Method to obtain the high contrast images of blood vessel for oxygen saturation calculation, 87690F (22 June 2013); doi: 10.1117/12.2018937
Proc. SPIE 8769, Dual wavelength digital holography for improving the measurement accuracy, 87690G (22 June 2013); doi: 10.1117/12.2020394
Proc. SPIE 8769, Measurement of the shape of objects by two wavelength interferometry, 87690H (22 June 2013); doi: 10.1117/12.2019001
Proc. SPIE 8769, Free and global pose calibration of a rotating laser monocular vision sensor for robotic 3D measurement system, 87690I (22 June 2013); doi: 10.1117/12.2018214
Optical Metrology and Instrumentation II
Proc. SPIE 8769, Measurement and standardization of eye safety for optical radiation of LED products, 87690J (22 June 2013); doi: 10.1117/12.2019049
Proc. SPIE 8769, Investigation of bias radiation effect on PV cell measurement, 87690K (22 June 2013); doi: 10.1117/12.2021519
Proc. SPIE 8769, Effects of integrating sphere conditions on the sphere uniformity, 87690L (22 June 2013); doi: 10.1117/12.2021043
Proc. SPIE 8769, Study of applying fiber based laser with the primary standard for optical power and improvement of spectral responsivity scales in near IR range, 87690M (22 June 2013); doi: 10.1117/12.2021600
Proc. SPIE 8769, Estimation of the sampling interval error for LED measurement with a goniophotometer, 87690N (22 June 2013); doi: 10.1117/12.2021051
Proc. SPIE 8769, Rugometric and microtopographic inspection of teeth enamel, 87690O (22 June 2013); doi: 10.1117/12.2016662
Special Session: Digital Image Correlation I
Proc. SPIE 8769, Automated and accurate initialization of digital image correlation for large deformation measurement, 87690P (22 June 2013); doi: 10.1117/12.2017687
Proc. SPIE 8769, Systematic errors in digital image correlation induced by environment temperature variation around the digital camera, 87690Q (22 June 2013); doi: 10.1117/12.2019198
Proc. SPIE 8769, Digital image correlation using energy minimization in full-field displacement and strain measurement, 87690R (22 June 2013); doi: 10.1117/12.2019069
Proc. SPIE 8769, The elimination of pseudo strains in 2D-DIC caused by out-of-plane translation using light strip method, 87690S (22 June 2013); doi: 10.1117/12.2018827
Precision Measurement and Image Processing I
Proc. SPIE 8769, The hype cycle in 3D displays: inherent limits of autostereoscopy, 87690T (22 June 2013); doi: 10.1117/12.2014438
Proc. SPIE 8769, An image-processing software package: UU and Fig for optical metrology applications, 87690U (22 June 2013); doi: 10.1117/12.2021357
Proc. SPIE 8769, Solving inverse problems for off-axis holography using Twist, 87690V (22 June 2013); doi: 10.1117/12.2019059
Proc. SPIE 8769, Multi-point laser coherent detection system and its applications in experimental mechanics, 87690W (22 June 2013); doi: 10.1117/12.2016664
Proc. SPIE 8769, Multiple image encryption based on known-plaintext attack and modified G-S phase retrieval algorithm, 87690X (22 June 2013); doi: 10.1117/12.2014462
Proc. SPIE 8769, Variable-focus cylindrical liquid lens array, 87690Y (22 June 2013); doi: 10.1117/12.2021322
Precision Measurement and Image Processing II
Proc. SPIE 8769, Analysis of grating inscribed micro-cantilever for high resolution AFM probe, 87690Z (22 June 2013); doi: 10.1117/12.2020330
Proc. SPIE 8769, Using modulation transfer function for estimate measurement errors of the digital image correlation method, 876910 (22 June 2013); doi: 10.1117/12.2021045
Proc. SPIE 8769, Dynamic focal spots registration algorithm for freeform surface measurement, 876911 (22 June 2013); doi: 10.1117/12.2021107
Proc. SPIE 8769, The in-situ 3D measurement system combined with CNC machine tools, 876912 (22 June 2013); doi: 10.1117/12.2021111
Proc. SPIE 8769, Camera calibration and 3D surface reconstruction for multi-camera semi-circular DIC system, 876913 (22 June 2013); doi: 10.1117/12.2021044
Proc. SPIE 8769, An experimental analysis of the real contact area between an electrical contact and a glass plane, 876914 (22 June 2013); doi: 10.1117/12.2021355
Special Session: Dynamics Measurement
Proc. SPIE 8769, Interferometrical techniques for the investigation of dynamic events, 876915 (22 June 2013); doi: 10.1117/12.2019053
Proc. SPIE 8769, Monitoring the rotation status of wind turbine blades using high-speed camera system, 876916 (22 June 2013); doi: 10.1117/12.2018929
Proc. SPIE 8769, Some discussion on high-speed-imaging-based optical coherent measurement , 876917 (22 June 2013); doi: 10.1117/12.2016663
Optical Metrology and Instrumentation III
Proc. SPIE 8769, A phase-stepped white light ellipsometer, 876918 (22 June 2013); doi: 10.1117/12.2018961
Proc. SPIE 8769, One-dimensional surface profile measurement by detection of reflecting direction of a scanned laser beam, 876919 (22 June 2013); doi: 10.1117/12.2020983
Proc. SPIE 8769, Full-field displacement measurement by double symmetrical illumination through reflection holograms , 87691A (22 June 2013); doi: 10.1117/12.2017990
Proc. SPIE 8769, Temperature effect on measurements of spectral responsivity of reference solar cell, 87691B (22 June 2013); doi: 10.1117/12.2021520
Proc. SPIE 8769, Study on fabricating of micro-pyramid array by precision diamond turning, 87691C (22 June 2013); doi: 10.1117/12.2021119
Optical Metrology and Instrumentation IV
Proc. SPIE 8769, Simultaneous microstructuring and functionalisation of surfaces with picosecond laser, 87691D (22 June 2013); doi: 10.1117/12.2019055
Proc. SPIE 8769, A simulation study on the inspection of transparent circuits with narrow line widths by using a PDLC/ITO film, 87691E (22 June 2013); doi: 10.1117/12.2021027
Proc. SPIE 8769, Development of a 3D laser scanning system for the cavity, 87691F (22 June 2013); doi: 10.1117/12.2020749
Special Session: 3D Shape Measurement
Proc. SPIE 8769, State of the art of compact optical 3D profile measurement apparatuses: from outer surface to inner surface measurement, 87691G (25 June 2013); doi: 10.1117/12.2021094
Proc. SPIE 8769, Research progress and application of dynamic three-dimensional shape measurement, 87691H (22 June 2013); doi: 10.1117/12.2021033
Proc. SPIE 8769, Three-dimensional imaging and display of real-existing scene using fringe, 87691I (22 June 2013); doi: 10.1117/12.2018488
Proc. SPIE 8769, Characteristic evaluation of linear LED grating projector for high-speed shape measurement, 87691J (22 June 2013); doi: 10.1117/12.2021246
Proc. SPIE 8769, Specular 3D shape measurement with a compact fringe reflection system, 87691K (22 June 2013); doi: 10.1117/12.2018927
Proc. SPIE 8769, Carrier frequency removal in phase measuring deflectometry with non-telecentric imaging, 87691L (22 June 2013); doi: 10.1117/12.2018711
Precision Measurement and Image Processing III
Proc. SPIE 8769, Joint transform correlator using JPEG-compressed reference images, 87691M (22 June 2013); doi: 10.1117/12.2018835