PROCEEDINGS VOLUME 8777
SPIE OPTICS + OPTOELECTRONICS | 15-18 APRIL 2013
Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Proceedings Volume 8777 is from: Logo
SPIE OPTICS + OPTOELECTRONICS
15-18 April 2013
Prague, Czech Republic
Front Matter: Volume 8777
Proc. SPIE 8777, Front Matter: Volume 8777, 877701 (17 May 2013); doi: 10.1117/12.2030674
Optics at Facilities
Proc. SPIE 8777, Development, experimental performance and damage properties of x-ray optics for the LCLS free-electron laser, 877702 (6 August 2013); doi: 10.1117/12.2019197
Damage by Short Pulses I
Proc. SPIE 8777, VUV-UV multiwavelength excitation process for high-quality ablation of fused silica, 877704 (9 May 2013); doi: 10.1117/12.2019720
Proc. SPIE 8777, Characterisation of EUV damage thresholds and imaging performance of Mo/Si multilayer mirrors, 877705 (3 May 2013); doi: 10.1117/12.2016980
Proc. SPIE 8777, Responses of organic and inorganic materials to intense EUV radiation from laser-produced plasmas, 877706 (9 May 2013); doi: 10.1117/12.2019048
Proc. SPIE 8777, Application of EUV optics to surface modification of materials, 877707 (3 May 2013); doi: 10.1117/12.2020158
Proc. SPIE 8777, EUV induced ablation and surface modification of poly(vinylidene fluoride) irradiated in vacuum or gaseous environment, 877708 (3 May 2013); doi: 10.1117/12.2021152
Mechanisms and Theory
Proc. SPIE 8777, Non-thermal phase transitions in semiconductors under femtosecond XUV irradiation, 877709 (3 May 2013); doi: 10.1117/12.2019123
Proc. SPIE 8777, Hydrodynamics and detailed atomic physics treatment of x-ray free-electron-laser interaction with matter, 87770A (3 May 2013); doi: 10.1117/12.2019065
Proc. SPIE 8777, Global sensitivity analysis of the XUV-ABLATOR code, 87770C (3 May 2013); doi: 10.1117/12.2017542
Proc. SPIE 8777, Mechanisms of structural changes induced by electronic excitations in solids, 87770D (3 May 2013); doi: 10.1117/12.2019250
Proc. SPIE 8777, Theoretical investigation of scattering properties of crystal exposed to the XFEL femtosecond pulse, 87770E (3 May 2013); doi: 10.1117/12.2017453
Damage by Ultrashort Pulses II
Proc. SPIE 8777, Multiple free electron laser pulse illumination of a carbon coated silicon substrate, 87770F (3 May 2013); doi: 10.1117/12.2017248
Proc. SPIE 8777, Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL, 87770H (3 May 2013); doi: 10.1117/12.2017725
Damage by Ultrashort Pulses III
Proc. SPIE 8777, Thermal effects on Co/Mo2C multilayer mirrors studied by soft x-ray standing wave enhanced photoemission spectroscopy, 87770I (3 May 2013); doi: 10.1117/12.2017252
Proc. SPIE 8777, Fragmentation of clusters and recombination induced by intense and ultrashort x-ray laser pulses, 87770J (3 May 2013); doi: 10.1117/12.2019299
Damage to Detectors
Proc. SPIE 8777, Study of high-dose x-ray radiation damage of silicon sensors, 87770K (3 May 2013); doi: 10.1117/12.2019514
Experimental Techniques
Proc. SPIE 8777, An interferometric diagnostic for the experimental study of dynamics of solids exposed to intense and ultrashort radiation, 87770M (3 May 2013); doi: 10.1117/12.2018982
Proc. SPIE 8777, A new method of determination of ablation threshold contour in the spot of focused XUV laser beam of nanosecond duration, 87770N (3 May 2013); doi: 10.1117/12.2020261
Proc. SPIE 8777, RF plasma cleaning of mirror surfaces: characterization, optimization, and surface physics aspects of plasma cleaning, 87770P (3 May 2013); doi: 10.1117/12.2019216
Poster Session
Proc. SPIE 8777, Study of EUV and x-ray radiation hardness of silicon photodiodes, 87770R (3 May 2013); doi: 10.1117/12.2017478
Proc. SPIE 8777, Electron kinetics in liquid water excited by a femtosecond VUV laser pulse, 87770S (3 May 2013); doi: 10.1117/12.2020451
Proc. SPIE 8777, Characterizing the focus of a multilayer coated off-axis parabola for FLASH beam at λ = 4.3 nm, 87770T (3 May 2013); doi: 10.1117/12.2022403
Proc. SPIE 8777, King's College laser plasma x-ray source design, 87770U (3 May 2013); doi: 10.1117/12.2027264
Astronomical X-ray Optics
Proc. SPIE 8777, X-ray optic developments at NASA's MSFC, 87770W (3 May 2013); doi: 10.1117/12.2021526
Proc. SPIE 8777, Hybrid x-ray optical system for space astrophysics, 87770X (3 May 2013); doi: 10.1117/12.2017205
Proc. SPIE 8777, Ray-tracing study of the eROSITA telescope, 87770Y (3 May 2013); doi: 10.1117/12.2016921
Proc. SPIE 8777, Slumping of Si wafers at high temperature, 87770Z (9 May 2013); doi: 10.1117/12.2021586
Proc. SPIE 8777, Simple and fast algorithm for computer simulations of reflective optical systems, 877710 (9 May 2013); doi: 10.1117/12.2017611
Proc. SPIE 8777, NANOX: proposed Nano-Satellite X-Ray Mission, 877711 (9 May 2013); doi: 10.1117/12.2017612
Diffractive and Refractive X-ray Optics
Proc. SPIE 8777, Concepts for rapid tuning and switching of x-ray energies, 877712 (3 May 2013); doi: 10.1117/12.2017446
Proc. SPIE 8777, The impact of novel 3D diffraction optics development, 877713 (3 May 2013); doi: 10.1117/12.2021517
Proc. SPIE 8777, X-ray refractive optics as a Fourier transformer for high resolution diffraction, 877716 (3 May 2013); doi: 10.1117/12.2021476
X-ray Microscopes and Active X-ray Optics
Proc. SPIE 8777, Adaptive x-ray optics development at AOA-Xinetics, 877717 (3 May 2013); doi: 10.1117/12.2017461
Proc. SPIE 8777, Active x-ray optics, 877718 (9 May 2013); doi: 10.1117/12.2021469
Proc. SPIE 8777, Water-window microscopy using compact, laser-plasma source based on Ar/He double stream gas-puff target, 877719 (3 May 2013); doi: 10.1117/12.2021154
Multilayer X-ray Optics
Proc. SPIE 8777, Spectral filtering optimization of a measuring channel of an x-ray broadband spectrometer, 87771B (3 May 2013); doi: 10.1117/12.2016832
Proc. SPIE 8777, Single and multi-channel Al-based multilayer systems for space applications in EUV range, 87771C (3 May 2013); doi: 10.1117/12.2017058
Proc. SPIE 8777, Multilayer reflective polarizers for the far ultraviolet, 87771D (3 May 2013); doi: 10.1117/12.2017444
Proc. SPIE 8777, Narrowband coatings for the 100-105 nm range, 87771E (3 May 2013); doi: 10.1117/12.2017482
Proc. SPIE 8777, Optical performance, structure, and thermal stability of Al/Zr multilayers working at above 17nm, 87771F (3 May 2013); doi: 10.1117/12.2017590
Coherent Radiation/Lasers
Proc. SPIE 8777, EUV optics in photoionization experiments, 87771H (3 May 2013); doi: 10.1117/12.2018422
X-ray Holography and Integrated Devices and Systems
Proc. SPIE 8777, A novel monochromator for ultrashort soft x-ray pulses, 87771J (3 May 2013); doi: 10.1117/12.2021599
Proc. SPIE 8777, 4H-SiC and novel SI GaAs-based M-S-M radiation hard photodetectors applicable in UV, EUV, and soft x-ray detection: design, technology, and performance testing, 87771K (3 May 2013); doi: 10.1117/12.2021729
Back to Top