PROCEEDINGS VOLUME 8848
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
Advances in X-Ray/EUV Optics and Components VIII
IN THIS VOLUME

0 Sessions, 33 Papers, 0 Presentations
Metrology  (5)
Proceedings Volume 8848 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter: Volume 8848
Proc. SPIE 8848, Front Matter: Volume 8848, 884801 (18 October 2013); doi: 10.1117/12.2048408
Novel Developments
Proc. SPIE 8848, Two-dimensional sub-5-nm hard x-ray focusing with MZP, 884802 (27 September 2013); doi: 10.1117/12.2025389
Proc. SPIE 8848, Thin crystal development and applications for hard x-ray free-electron lasers, 884804 (27 September 2013); doi: 10.1117/12.2023465
Proc. SPIE 8848, Design of novel x-ray optical system for rocket experiment, 884805 (27 September 2013); doi: 10.1117/12.2023984
Proc. SPIE 8848, High-speed photon energy tuning of x-rays with high duty cycle by use of Clessidra prism arrays, 884806 (27 September 2013); doi: 10.1117/12.2023921
Focusing Techniques
Proc. SPIE 8848, Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging, 884807 (27 September 2013); doi: 10.1117/12.2024127
Proc. SPIE 8848, X-ray tomography of high pressure fuel spray by polycapillary optics, 884808 (27 September 2013); doi: 10.1117/12.2024293
Proc. SPIE 8848, Sagittal focusing inducing energy structure in medium to high energy resolution x-ray monochromators, 884809 (27 September 2013); doi: 10.1117/12.2023616
Proc. SPIE 8848, Aberrations in saw-tooth refractive lenses in short focal length x-ray focusing, 88480A (8 October 2013); doi: 10.1117/12.2027722
X-Ray Mirrors
Proc. SPIE 8848, K-B bendable system optimization at FERMI@Elettra FEL: impact of different spatial wavelengths on the spot size, 88480B (27 September 2013); doi: 10.1117/12.2023024
Proc. SPIE 8848, Development of a numerically controlled elastic emission machining system for fabricating mandrels of ellipsoidal focusing mirrors used in soft x-ray microscopy, 88480C (27 September 2013); doi: 10.1117/12.2023940
Proc. SPIE 8848, Two-foci bendable mirrors for the ALS MAESTRO beamline: design and metrology characterization and optimal tuning of the mirror benders, 88480D (27 September 2013); doi: 10.1117/12.2024675
Proc. SPIE 8848, Optical design of soft x-ray focusing system with ellipsoidal mirror for laboratory-based sources, 88480E (27 September 2013); doi: 10.1117/12.2023598
Proc. SPIE 8848, Compound focusing for hard-x-ray inelastic scattering, 88480F (27 September 2013); doi: 10.1117/12.2023795
Metrology
Proc. SPIE 8848, X-ray mirror metrology using SCOTS/deflectometry, 88480G (27 September 2013); doi: 10.1117/12.2024500
Proc. SPIE 8848, Application of time-invariant linear filter approximation to parametrization of one- and two-dimensional surface metrology with high quality x-ray optics, 88480H (27 September 2013); doi: 10.1117/12.2024662
Proc. SPIE 8848, Correlation analysis of surface slope metrology measurements of high quality x-ray optics, 88480I (27 September 2013); doi: 10.1117/12.2024694
Proc. SPIE 8848, Error compensation for the calibration of mechanical mirror benders, 88480K (27 September 2013); doi: 10.1117/12.2024510
Proc. SPIE 8848, Status of multi-beam long trace-profiler development, 88480L (27 September 2013); doi: 10.1117/12.2027146
Multilayer Coating
Proc. SPIE 8848, Suppression of long wavelength reflection from extreme-UV multilayer optics, 88480N (27 September 2013); doi: 10.1117/12.2023889
Proc. SPIE 8848, Optimization of LaN/B multilayer mirrors for 6.x nm wavelength, 88480O (27 September 2013); doi: 10.1117/12.2024199
XFEL and Miscellaneous Applications
Proc. SPIE 8848, Fabrication of x-ray gratings by direct write maskless lithography, 88480Q (27 September 2013); doi: 10.1117/12.2024489
Proc. SPIE 8848, Damage characteristics of platinum/carbon multilayers under x-ray free-electron laser irradiation, 88480S (27 September 2013); doi: 10.1117/12.2022735
Proc. SPIE 8848, Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser, 88480T (27 September 2013); doi: 10.1117/12.2025377
Proc. SPIE 8848, Process-induced inhomogeneities in higher asymmetry angle x-ray monochromators, 88480U (27 September 2013); doi: 10.1117/12.2025142
Poster Session
Proc. SPIE 8848, Using organic slab to obtain x-ray tube spectra for quantitative analysis of x-ray fluorescence analysis, 88480W (27 September 2013); doi: 10.1117/12.2022615
Proc. SPIE 8848, Multilevel stacked Fresnel zone plate for hard x-rays, 88480Y (27 September 2013); doi: 10.1117/12.2023605
Proc. SPIE 8848, The Alba ray tracing code: ART, 88480Z (27 September 2013); doi: 10.1117/12.2024439
Proc. SPIE 8848, Modulation of intensity in defocused beams, 884810 (27 September 2013); doi: 10.1117/12.2024528
Proc. SPIE 8848, Optimization of the soft x-ray transmission microscopy beamline at the ALBA light source, 884811 (27 September 2013); doi: 10.1117/12.2024531
Proc. SPIE 8848, Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV, 884812 (27 September 2013); doi: 10.1117/12.2024652
Proc. SPIE 8848, Investigation of high thermal contact conductance at low contact pressure for high-heat-load optical elements of synchrotron radiation, 884813 (27 September 2013); doi: 10.1117/12.2025369
Proc. SPIE 8848, Engineering optical constants for broadband single layer antireflection coatings, 884814 (27 September 2013); doi: 10.1117/12.2026546
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