PROCEEDINGS VOLUME 8849
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X
Proceedings Volume 8849 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter: Volume 8849
Proc. SPIE 8849, Front Matter: Volume 8849, 884901 (18 October 2013); doi: 10.1117/12.2048379
X-Ray Lasers I
Proc. SPIE 8849, Sub-10-nm Ni-like soft-x-ray lasers, 884903 (30 September 2013); doi: 10.1117/12.2023283
Proc. SPIE 8849, Development and applications of x-ray lasers at PALS Centre, 884904 (27 September 2013); doi: 10.1117/12.2024526
High-Order Harmonics
Proc. SPIE 8849, Generation of a beat-wave pulse train for quasi-phase-matched high-harmonic generation, 884907 (27 September 2013); doi: 10.1117/12.2022434
Proc. SPIE 8849, Transmission imaging of sodium in the vacuum ultra-violet spectral range: new application for an intense VUV source, 884908 (27 September 2013); doi: 10.1117/12.2022938
Diagnostics and Optics
Proc. SPIE 8849, The optical design of the soft x-ray self-seeding at LCLS, 88490A (30 September 2013); doi: 10.1117/12.2024402
Proc. SPIE 8849, Temporal characterization of femtosecond x-ray pulses at free-electron lasers, 88490B (27 September 2013); doi: 10.1117/12.2024896
Proc. SPIE 8849, Imaging of fine structures of cellular organelles in hydrated biological cells by a soft x-ray microscope combined with a fluorescence microscope, 88490C (27 September 2013); doi: 10.1117/12.2022332
Proc. SPIE 8849, Corrosion-resistant Mg/SiC multilayer coatings for EUV laser sources in the 25-80nm wavelength region, 88490D (27 September 2013); doi: 10.1117/12.2024955
Applications I
Proc. SPIE 8849, Observation of the nano-scale surface dynamics of femtosecond laser ablation by time-resolved soft x-ray imaging technique, 88490E (27 September 2013); doi: 10.1117/12.2022834
Proc. SPIE 8849, Nano-meter scale modifications on material surfaces induced by soft x-ray laser pulse irradiations, 88490F (27 September 2013); doi: 10.1117/12.2022425
Proc. SPIE 8849, Composition depth profiling by soft x-ray laser-ablation mass spectrometry, 88490G (27 September 2013); doi: 10.1117/12.2024535
Proc. SPIE 8849, Prospects of ultrafast x-ray absorption investigations using laboratory based sources, 88490H (30 September 2013); doi: 10.1117/12.2023906
Proc. SPIE 8849, Experimental setup for high resolution x-ray spectroscopy of solids and liquid samples, 88490I (30 September 2013); doi: 10.1117/12.2023992
X-Ray Lasers II
Proc. SPIE 8849, Multi-tens of GW peak power plasma-based soft x-ray laser, 88490J (27 September 2013); doi: 10.1117/12.2024024
Proc. SPIE 8849, Modeling and numerical simulations of seeded XUV lasers with the COLAX code: recent progress, 88490L (27 September 2013); doi: 10.1117/12.2024975
Proc. SPIE 8849, Wavefront of seeded soft x-ray laser based on a solid-target plasma amplifier, 88490M (27 September 2013); doi: 10.1117/12.2024976
Proc. SPIE 8849, High-average-power 100-Hz repetition rate table-top soft x-ray lasers, 88490N (27 September 2013); doi: 10.1117/12.2024251
X-Ray Free-Electron Lasers
Proc. SPIE 8849, LCLS mirror switching of x-ray beam, 88490Q (30 September 2013); doi: 10.1117/12.2024663
Proc. SPIE 8849, Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization, 88490R (27 September 2013); doi: 10.1117/12.2024784
Novel X-Ray Sources and Applications
Proc. SPIE 8849, Development of x-ray sources using PW laser systems at APRI GIST, 88490T (30 September 2013); doi: 10.1117/12.2023922
Applications II
Proc. SPIE 8849, Coherent nanopatterning with table-top soft x-ray lasers, 88490W (27 September 2013); doi: 10.1117/12.2024472
Proc. SPIE 8849, Analysis of spatial resolution and coherence demands in soft x-ray image-plane holographic microscopy with two zone plates, 88490X (30 September 2013); doi: 10.1117/12.2024274
Proc. SPIE 8849, Tabletop coherent diffraction imaging with a discharge plasma EUV source, 88490Y (30 September 2013); doi: 10.1117/12.2023895
Proc. SPIE 8849, Multiple pulses EUV laser pumping: ASE, seeded operations, and applications, 884910 (8 October 2013); doi: 10.1117/12.2025347
X-Ray Lasers III
Proc. SPIE 8849, Probing of laser-irradiated solid targets using extreme ultraviolet radiation, 884911 (30 September 2013); doi: 10.1117/12.2022744
Proc. SPIE 8849, High energy density plasmas produced by x-ray and extreme ultraviolet lasers, 884912 (30 September 2013); doi: 10.1117/12.2023232
Applications III
Proc. SPIE 8849, Development of coherent EUV scatterometry microscope with high-order harmonic for EUV mask inspection, 884914 (30 September 2013); doi: 10.1117/12.2023880
Proc. SPIE 8849, X-ray Thomson scattering for partially ionized plasmas including the effect of bound levels, 884915 (27 September 2013); doi: 10.1117/12.2022449
Poster Session
Proc. SPIE 8849, Beam characteristics of CAPEX XUV argon laser, 884917 (27 September 2013); doi: 10.1117/12.2023190
Proc. SPIE 8849, Molecular dynamics simulation of cluster formation in femtosecond laser ablation, 884918 (30 September 2013); doi: 10.1117/12.2024655
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