PROCEEDINGS VOLUME 8851
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
X-Ray Nanoimaging: Instruments and Methods
Proceedings Volume 8851 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter Volume 8851
Proc. SPIE 8851, Front Matter: Volume 8851, 885101 (11 October 2013); doi: 10.1117/12.2045770
Scanning Probes I
Proc. SPIE 8851, Sub-100-nm 3D-elemental mapping of frozen-hydrated cells using the bionanoprobe, 885102 (26 September 2013); doi: 10.1117/12.2025169
Proc. SPIE 8851, Status of the Nanoscopium scanning nanoprobe beamline of Synchrotron Soleil, 885104 (26 September 2013); doi: 10.1117/12.2027086
Proc. SPIE 8851, A next-generation in-situ nanoprobe beamline for the Advanced Photon Source, 885106 (26 September 2013); doi: 10.1117/12.2026418
Full-Field Microscopes
Proc. SPIE 8851, Development of achromatic full-field x-ray microscopy with compact imaging mirror system, 885107 (26 September 2013); doi: 10.1117/12.2023152
Proc. SPIE 8851, Development of large-field high-resolution hard x-ray imaging microscopy and microtomography with Fresnel zone plate objective, 885109 (26 September 2013); doi: 10.1117/12.2025792
In-situ TXM Studies
Proc. SPIE 8851, Data-processing strategies for nano-tomography with elemental specification, 88510A (5 October 2013); doi: 10.1117/12.2026436
Proc. SPIE 8851, Identifying and managing radiation damage during in situ transmission x-ray microscopy of Li-ion batteries, 88510B (26 September 2013); doi: 10.1117/12.2027263
Proc. SPIE 8851, Development of in-situ full-field spectroscopic imaging analysis and application on Li-ion battery using transmission x-ray microscopy, 88510C (26 September 2013); doi: 10.1117/12.2027095
Proc. SPIE 8851, Development of in-line furnace for in situ nanoscale resolution x-ray microscopy, 88510D (26 September 2013); doi: 10.1117/12.2025842
Nanofocusing Optics
Proc. SPIE 8851, Design optimization of ultra-precise elliptical mirrors for hard x-ray nanofocusing at Nanoscopium, 88510G (26 September 2013); doi: 10.1117/12.2026026
Scanning Probes II
Proc. SPIE 8851, Development of an in-vacuum x-ray microscope with cryogenic sample cooling for beamline P11 at PETRA III, 88510K (26 September 2013); doi: 10.1117/12.2027303
Proc. SPIE 8851, NanoMAX: a hard x-ray nanoprobe beamline at MAX IV, 88510L (26 September 2013); doi: 10.1117/12.2026609
Proc. SPIE 8851, Preliminary design of a zone plate based hard X-ray monochromatic diffraction nanoprobe for materials studies at APS, 88510M (26 September 2013); doi: 10.1117/12.2025900
Fast Instrumentation
Proc. SPIE 8851, Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography, 88510P (26 September 2013); doi: 10.1117/12.2026680
Proc. SPIE 8851, The Maia detector array and x-ray fluorescence imaging system: locating rare precious metal phases in complex samples, 88510Q (26 September 2013); doi: 10.1117/12.2027195
Novel Nanoimaging Methods
Proc. SPIE 8851, A universal measure for coherence requirements in diffractive imaging, 88510T (26 September 2013); doi: 10.1117/12.2027269
Lab-based Instruments
Proc. SPIE 8851, Optimized cavity-enhanced x-ray sources for x-ray microscopy, 88510W (26 September 2013); doi: 10.1117/12.2027193
Proc. SPIE 8851, Tabletop coherent diffractive imaging of extended objects in transmission and reflection geometry, 88510Y (26 September 2013); doi: 10.1117/12.2026300
Poster Session
Proc. SPIE 8851, High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates, 88510Z (26 September 2013); doi: 10.1117/12.2022640
Proc. SPIE 8851, Analysis of impact of sintering temperature on microstructure of LSCF-SDC composite cathodes using nano-CT, 885112 (26 September 2013); doi: 10.1117/12.2026149
Proc. SPIE 8851, Reconstruction of limited-angle and few-view nano-CT image via total variation iterative reconstruction, 885113 (26 September 2013); doi: 10.1117/12.2026153
Proc. SPIE 8851, A soft x-ray beamline for quantitative nanotomography using ptychography, 885117 (26 September 2013); doi: 10.1117/12.2027211
Proc. SPIE 8851, Recent advances in use of atomic layer deposition and focused ion beams for fabrication of Fresnel zone plates for hard x-rays, 885119 (26 September 2013); doi: 10.1117/12.2027251
Proc. SPIE 8851, Full-field x-ray nano-imaging at SSRF, 88511D (26 September 2013); doi: 10.1117/12.2035589
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