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The developmental long trace profiler (DLTP) optimized for metrology of side-facing optics at the ALS
Ultra-high-precision surface processing techniques for nanofocusing ellipsoidal mirrors in hard x-ray region
Pushing the limits: latest developments in angle metrology for the inspection of ultra-precise synchrotron optics
Design of a precision two-dimensional tip-tilting stage system for autocollimator-based long trace profiler angular calibration
A new x-ray optics laboratory (XROL) at the ALS: mission, arrangement, metrology capabilities, performance, and future plans