Front Matter vol. 9236
Proc. SPIE 9236, Front Matter: Volume 9236, 923601 (23 October 2014); doi: 10.1117/12.2086290
Invited Session: Joint Session with Photomask and Scanning Microscopies
Proc. SPIE 9236, 3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology?, 923602 (16 September 2014); doi: 10.1117/12.2069324
Advanced Scanning Microscopies I
Proc. SPIE 9236, A novel approach for scanning electron microscopic observation in atmospheric pressure, 923604 (16 September 2014); doi: 10.1117/12.2064935
Proc. SPIE 9236, Does your SEM really tell the truth? How would you know? part 3: vibration and drift, 923605 (16 September 2014); doi: 10.1117/12.2065235
Advanced Scanning Microscopies II
Proc. SPIE 9236, Investigations on CMOS photodiodes using scanning electron microscopy with electron beam induced current measurements , 923607 (16 September 2014); doi: 10.1117/12.2066124
Proc. SPIE 9236, A novel transmission electron imaging technique for observation of biological samples on a plate, 923608 (16 September 2014); doi: 10.1117/12.2065479
Proc. SPIE 9236, Three-dimensional surface reconstruction using scanning electron microscopy and the design of a nanostructured electron trap, 923609 (16 September 2014); doi: 10.1117/12.2074830
Advanced Scanning Microscopies III
Proc. SPIE 9236, Shear force microscopy using piezoresistive cantilevers in surface metrology, 92360A (16 September 2014); doi: 10.1117/12.2066247
Proc. SPIE 9236, High throughput data acquisition with a multi-beam SEM, 92360B (16 September 2014); doi: 10.1117/12.2069119
Proc. SPIE 9236, On the limits of miniature electron column technology, 92360C (16 September 2014); doi: 10.1117/12.2068617
Metrology: Joint Session with Photomask and Scanning Microscopies
Proc. SPIE 9236, Assessing the viability of multi-electron beam wafer inspection for sub-20nm defects, 92360E (2 October 2014); doi: 10.1117/12.2069302
Scanning Microscopies in Forensic Science
Proc. SPIE 9236, Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II, 92360H (16 September 2014); doi: 10.1117/12.2065842
Proc. SPIE 9236, First experiences with 2D-mXRF analysis of gunshot residue on garment, tissue, and cartridge cases, 92360J (16 September 2014); doi: 10.1117/12.2066992
Proc. SPIE 9236, Developing a quality assurance program for gunshot primer residue analysis, 92360K (16 September 2014); doi: 10.1117/12.2073770
Proc. SPIE 9236, An electro-conductive organic coating for scanning electron microscopy (déjà vu), 92360L (16 September 2014); doi: 10.1117/12.2065553
Scanning STEM Session
Proc. SPIE 9236, Using the Hitachi SEM to engage learners and promote next generation science standards inquiry, 92360M (16 September 2014); doi: 10.1117/12.2066385
Proc. SPIE 9236, Integrating electron microscopy into nanoscience and materials engineering programs, 92360N (2 October 2014); doi: 10.1117/12.2066250
Proc. SPIE 9236, Teaching K-12 teachers and students about nanoscale science through microscopy, 92360P (16 September 2014); doi: 10.1117/12.2074629
Proc. SPIE 9236, Project NANO (nanoscience and nanotechnology outreach): a STEM training program that brings SEM's and stereoscopes into high-school and middle-school classrooms, 92360Q (16 September 2014); doi: 10.1117/12.2084632
Advanced Scanned Probe Microscopies
Proc. SPIE 9236, Design, technology, and application of integrated piezoresistive scanning thermal microscopy (SThM) microcantilever, 92360R (16 September 2014); doi: 10.1117/12.2066240
Proc. SPIE 9236, Particle deformation induced by AFM tapping under different setpoint voltages, 92360W (16 September 2014); doi: 10.1117/12.2070356
Advanced Optical Microscopies I
Proc. SPIE 9236, Wavelet transform-based method of compensating dispersion for high resolution imaging in SDOCT, 92360X (16 September 2014); doi: 10.1117/12.2065309
Proc. SPIE 9236, Scan mirrors relay for high resolution laser scanning systems, 923610 (16 September 2014); doi: 10.1117/12.2067899
Proc. SPIE 9236, Using scanning near-field microscopy to study photo-induced mass motions in azobenzene containing thin films, 923611 (2 October 2014); doi: 10.1117/12.2066138
Advanced Optical Microscopies II
Proc. SPIE 9236, Nanoscale imaging by micro-cavity scanning microscopy, 923613 (16 September 2014); doi: 10.1117/12.2068584
Advancements in Modeling
Proc. SPIE 9236, A compact physical CD-SEM simulator for IC photolithography modeling applications, 923618 (16 September 2014); doi: 10.1117/12.2066220
Posters-Tuesday
Proc. SPIE 9236, A tale of three trials: from science to junk science, 923619 (16 September 2014); doi: 10.1117/12.2065556
Proc. SPIE 9236, Do electron flux and solar x-ray in juxtaposition prior a seismic event make signature?, 92361A (16 September 2014); doi: 10.1117/12.2066119
Proc. SPIE 9236, Confirmatory analysis of field-presumptive GSR test sample using SEM/EDS, 92361C (16 September 2014); doi: 10.1117/12.2074212
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