PROCEEDINGS VOLUME 9276
SPIE/COS PHOTONICS ASIA | 9-11 OCTOBER 2014
Optical Metrology and Inspection for Industrial Applications III
Proceedings Volume 9276 is from: Logo
SPIE/COS PHOTONICS ASIA
9-11 October 2014
Beijing, China
Front Matter: Volume 9276
Proc. SPIE 9276, Front Matter: Volume 9276, 927601 (18 December 2014); doi: 10.1117/12.2181473
Optical Metrology Methods I
Proc. SPIE 9276, Phase retrieval for optical metrology, 927602 (13 November 2014); doi: 10.1117/12.2071038
Proc. SPIE 9276, Single-shot three-dimensional shape measurement of specular surfaces by orthogonal color fringe pattern reflection technique, 927603 (13 November 2014); doi: 10.1117/12.2072410
Proc. SPIE 9276, Pixel correspondence calibration method of a 2CCD camera based on absolute phase calculation, 927604 (13 November 2014); doi: 10.1117/12.2072832
Proc. SPIE 9276, Matching method of the vision image captured by the lunar rover exploring on lunar surface, 927605 (13 November 2014); doi: 10.1117/12.2073717
Optical Metrology Methods II
Proc. SPIE 9276, A high-reflective surface measurement method based on conoscopic holography technology, 927608 (13 November 2014); doi: 10.1117/12.2071706
Proc. SPIE 9276, Three-dimensional reconstruction of specular reflecting technical surfaces using structured light microscopy, 927609 (13 November 2014); doi: 10.1117/12.2072296
Proc. SPIE 9276, Optimized design of a TOF laser range finder based on time-correlated single-photon counting, 92760A (13 November 2014); doi: 10.1117/12.2071405
Optical Metrology Methods III
Proc. SPIE 9276, Optimizing binary dithering patterns to improve phase quality, 92760C (13 November 2014); doi: 10.1117/12.2070799
Proc. SPIE 9276, A hand-held, high-resolution 3D shape measurement system using structured and unstructured illumination, 92760D (13 November 2014); doi: 10.1117/12.2071337
Proc. SPIE 9276, Polarization scattering methods applied in particle analyzing, 92760F (13 November 2014); doi: 10.1117/12.2071234
Proc. SPIE 9276, Compact camera for 3D position registration of cancer in radiation treatment, 92760G (13 November 2014); doi: 10.1117/12.2072170
Optical Metrology Methods IV
Proc. SPIE 9276, Real-time scanner error correction in white light interferometry, 92760I (13 November 2014); doi: 10.1117/12.2071276
Proc. SPIE 9276, A robust automatic registration method for hand-held structured light 3D scanner, 92760J (13 November 2014); doi: 10.1117/12.2071169
Proc. SPIE 9276, System implementation of self-mixing interferometry technique-based measurement on Young's modulus, 92760K (13 November 2014); doi: 10.1117/12.2071360
Proc. SPIE 9276, Research on high-accuracy two-dimensional digital image correlation hardware measurement systems used in the engineering practice, 92760L (13 November 2014); doi: 10.1117/12.2073724
Proc. SPIE 9276, The art of specifying surface quality, 92760M (13 November 2014); doi: 10.1117/12.2071006
Optical Metrology Methods V
Proc. SPIE 9276, Dynamic 3D shape measurement based on grating projection and Fourier fringe analysis, 92760N (13 November 2014); doi: 10.1117/12.2071519
Proc. SPIE 9276, Comparing digital-light-processing (DLP) and liquid-crystal-display(LCD) projection technologies for high-quality 3D shape measurement, 92760Q (13 November 2014); doi: 10.1117/12.2071536
Optical Metrology Methods VI
Proc. SPIE 9276, Solutions on micro lens applied in multiple configuration systems, 92760S (13 November 2014); doi: 10.1117/12.2070939
Proc. SPIE 9276, The assessment of industrial CT's probing error, 92760T (13 November 2014); doi: 10.1117/12.2071795
Proc. SPIE 9276, A driving step auto-access method for single-wavelength microscopic interference, 92760U (13 November 2014); doi: 10.1117/12.2071581
Proc. SPIE 9276, Long-range active retroreflector to measure the rotational orientation in conjunction with a laser tracker, 92760V (13 November 2014); doi: 10.1117/12.2071945
Proc. SPIE 9276, Experimental study for the influence of surface characteristics on the fringe patterns, 92760W (13 November 2014); doi: 10.1117/12.2071295
Optical Metrology Applications I
Proc. SPIE 9276, New method of verificating optical flat flatness , 92760Y (13 November 2014); doi: 10.1117/12.2071461
Proc. SPIE 9276, Mode-disturbing effect of laser speckle in optical fibers, 92760Z (13 November 2014); doi: 10.1117/12.2071847
Proc. SPIE 9276, The model about the package structure of LED and the light intensity distribution, 927610 (13 November 2014); doi: 10.1117/12.2072496
Optical Metrology Applications II
Proc. SPIE 9276, Effects of lens aberrations in phase space, 927613 (13 November 2014); doi: 10.1117/12.2071394
Proc. SPIE 9276, Optical fiber power measurement using different transfer standards, 927615 (13 November 2014); doi: 10.1117/12.2073687
Proc. SPIE 9276, A high-accuracy subaperture stitching system for nonflatness measurement of wafer stage mirror, 927617 (13 November 2014); doi: 10.1117/12.2071824
Proc. SPIE 9276, A high speed camera with auto adjustable ROI for product's outline dimension measurement, 927619 (13 November 2014); doi: 10.1117/12.2072896
Poster Session
Proc. SPIE 9276, A registration method based on profile matching for vegetation canopy measurement, 92761A (13 November 2014); doi: 10.1117/12.2073649
Proc. SPIE 9276, Correction of refraction index based on adjacent pulse repetition interval lengths, 92761C (13 November 2014); doi: 10.1117/12.2069828
Proc. SPIE 9276, Accurate and automatic extrinsic calibration method for blade measurement system integrated by different optical sensors, 92761D (13 November 2014); doi: 10.1117/12.2070020
Proc. SPIE 9276, Analysis on how spectrum affects the test of solar cell electrical property, 92761G (13 November 2014); doi: 10.1117/12.2070857
Proc. SPIE 9276, A new technique of recognition for coded targets in optical 3D measurement, 92761H (13 November 2014); doi: 10.1117/12.2070957
Proc. SPIE 9276, Binocular videogrammetric system for three-dimensional measurement in low-speed wind tunnel, 92761I (13 November 2014); doi: 10.1117/12.2071024
Proc. SPIE 9276, An improved bundle adjustment model and algorithm with novel block matrix partition method, 92761J (13 November 2014); doi: 10.1117/12.2071083
Proc. SPIE 9276, High-speed three-dimensional shape measurement using spatial frequency encoding and DLP projector, 92761K (13 November 2014); doi: 10.1117/12.2071186
Proc. SPIE 9276, Verification and analysis of stray light in high-power laser system, 92761L (13 November 2014); doi: 10.1117/12.2071296
Proc. SPIE 9276, Cost-effective and full-field method for measuring vibration of loudspeaker membrane using fringe projection, 92761M (13 November 2014); doi: 10.1117/12.2071281
Proc. SPIE 9276, Optical image encryption in phase space, 92761N (13 November 2014); doi: 10.1117/12.2071466
Proc. SPIE 9276, Influence of both angle and position error of pentaprism on accuracy of pentaprism scanning system, 92761O (13 November 2014); doi: 10.1117/12.2071533
Proc. SPIE 9276, Optimal design of optical length in low turbidity measurement system with wavelength 1310 nm and 1550 nm, 92761P (13 November 2014); doi: 10.1117/12.2071612
Proc. SPIE 9276, The research of filtering on images with noises of the three-mirror aperture optical system, 92761Q (13 November 2014); doi: 10.1117/12.2071800
Proc. SPIE 9276, Measuring the displacement of the movable guard electrode in the new vertical calculable capacitor at NIM, 92761R (13 November 2014); doi: 10.1117/12.2071812
Proc. SPIE 9276, Cramer-Rao analysis of three-channel phase diverse wave-front sensing for Golay3 aperture, 92761S (13 November 2014); doi: 10.1117/12.2071823
Proc. SPIE 9276, Dual-frequency laser displacement and angle interferometer, 92761T (13 November 2014); doi: 10.1117/12.2071869
Proc. SPIE 9276, A 2-dimensionalal thickness measurement ellipsometer based on the the the liquid crystal variable retarder, 92761U (13 November 2014); doi: 10.1117/12.2071875
Proc. SPIE 9276, Precision judgment criteria and supplement data processing method in high-precision ranging with dual-comb lasers, 92761W (13 November 2014); doi: 10.1117/12.2072017
Proc. SPIE 9276, Novel high speed method using gray level vector modulation for 3D shape measurement, 92761X (13 November 2014); doi: 10.1117/12.2072045
Proc. SPIE 9276, A new usage of ASIFT for the range image registration, 92761Y (13 November 2014); doi: 10.1117/12.2072047
Proc. SPIE 9276, A new geometrical model and mathematical method for three-dimensional surface reconstruction based on phase-shifting structured light technique, 92761Z (13 November 2014); doi: 10.1117/12.2072278
Proc. SPIE 9276, An optimized FBG-based fatigue monitoring strategy on deepwater risers, 927620 (13 November 2014); doi: 10.1117/12.2072847
Proc. SPIE 9276, Hyperspectral visible-near infrared imaging for the detection of waxed rice, 927622 (13 November 2014); doi: 10.1117/12.2073990
Proc. SPIE 9276, Soluble solids content and firmness non-destructive inspection and varieties discrimination of apples based on visible near-infrared hyperspectral imaging, 927623 (13 November 2014); doi: 10.1117/12.2074028
Proc. SPIE 9276, Sensing driver awareness by combining fisheye camera and Kinect, 927624 (13 November 2014); doi: 10.1117/12.2074527
Proc. SPIE 9276, High-frequency deformation grating fabrication techniques and applications, 927625 (13 November 2014); doi: 10.1117/12.2074671