PROCEEDINGS VOLUME 9442
OPTICS AND MEASUREMENT CONFERENCE 2014 | 7-10 OCTOBER 2014
Optics and Measurement Conference 2014
IN THIS VOLUME

0 Sessions, 56 Papers, 0 Presentations
OPTICS AND MEASUREMENT CONFERENCE 2014
7-10 October 2014
Liberec, Czech Republic
Front Matter: Volume 9442
Proc. SPIE 9442, Front Matter: Volume 9442, 944201 (7 January 2015); doi: 10.1117/12.2185214
Optics and Measurement Conference 2014
Proc. SPIE 9442, 50 years of holographic interferometry, 944202 (7 January 2015); doi: 10.1117/12.2082744
Proc. SPIE 9442, Field proven technologies for fabrication of high-precision aspheric and freeform optical surfaces , 944203 (7 January 2015); doi: 10.1117/12.2176586
Proc. SPIE 9442, Ion beam and plasma jet based methods in ultra-precision optics manufacturing, 944204 (7 January 2015); doi: 10.1117/12.2175491
Proc. SPIE 9442, Performance analysis of a DTIRC-LED illumination structure, 944205 (7 January 2015); doi: 10.1117/12.2176057
Proc. SPIE 9442, Tool offset optimisation for the machining of free-form optics with a non-zero gradient at the centre, 944206 (7 January 2015); doi: 10.1117/12.2175910
Proc. SPIE 9442, Optical properties of Fe2O3 deposited by IBAD and its usage in interference filters, 944207 (7 January 2015); doi: 10.1117/12.2176920
Proc. SPIE 9442, Local topography of optoelectronic substrates prepared by dry plasma etching process, 944208 (7 January 2015); doi: 10.1117/12.2176367
Proc. SPIE 9442, AFM imaging of natural optical structures, 944209 (7 January 2015); doi: 10.1117/12.2176720
Proc. SPIE 9442, Mechanical properties of carbon fiber composites for applications in space, 94420A (7 January 2015); doi: 10.1117/12.2175925
Proc. SPIE 9442, Numerical analysis of color holograms based on surface-plasmons, 94420B (7 January 2015); doi: 10.1117/12.2086605
Proc. SPIE 9442, Software simulator for design and optimization of the kaleidoscopes for the surface reflectance measurement, 94420C (7 January 2015); doi: 10.1117/12.2086897
Proc. SPIE 9442, Air flow and length noise in displacement interferometry, 94420D (7 January 2015); doi: 10.1117/12.2176179
Proc. SPIE 9442, Influence of the light source on the liquid optical element planarity measurement, 94420E (7 January 2015); doi: 10.1117/12.2086494
Proc. SPIE 9442, Optical frequency references for laser interferometry, 94420F (7 January 2015); doi: 10.1117/12.2086262
Proc. SPIE 9442, In-situ aberration correction of Bessel beams using spatial light modulator, 94420G (7 January 2015); doi: 10.1117/12.2175908
Proc. SPIE 9442, Time resolved PIV measurement of fluid dynamics in agitated vessels, 94420H (7 January 2015); doi: 10.1117/12.2176018
Proc. SPIE 9442, Optical scattering in muscle tissue and its utilisation, 94420I (7 January 2015); doi: 10.1117/12.2175510
Proc. SPIE 9442, Preparation of coatings with low roughness by high-current impulse magnetron discharge, 94420J (7 January 2015); doi: 10.1117/12.2086913
Proc. SPIE 9442, Three-coordinate laser heterodyne interferometer for metrological assurance of scanning probe microscopes, 94420K (7 January 2015); doi: 10.1117/12.2086921
Proc. SPIE 9442, Development of large aperture composite adaptive optics, 94420L (7 January 2015); doi: 10.1117/12.2175713
Proc. SPIE 9442, VISAR interferometer for measuring mass velocity in shock wave experiments, 94420M (7 January 2015); doi: 10.1117/12.2175923
Proc. SPIE 9442, Diagnostic system for cryogenically cooled 10 Hz Yb:YAG laser, 94420N (7 January 2015); doi: 10.1117/12.2086616
Proc. SPIE 9442, High sensitive method for optical birefringence measurement, 94420O (7 January 2015); doi: 10.1117/12.2086877
Proc. SPIE 9442, Advanced interferometry systems for dimensional measurement in nanometrology, 94420P (7 January 2015); doi: 10.1117/12.2086613
Proc. SPIE 9442, Holographic contouring and its limitations in nearly specularly reflecting surface measurement, 94420Q (7 January 2015); doi: 10.1117/12.2176006
Proc. SPIE 9442, Detection and measurement of surface defects by fringe projection technique, 94420R (7 January 2015); doi: 10.1117/12.2086522
Proc. SPIE 9442, Analysis of scorpion venom composition by Raman Spectroscopy, 94420S (7 January 2015); doi: 10.1117/12.2175995
Proc. SPIE 9442, Influence of the circumferential speed of a resin bond grinding wheel on the properties of a ground aspheric surface, 94420T (7 January 2015); doi: 10.1117/12.2175630
Proc. SPIE 9442, Design and realization of an aspherical doublet, 94420U (7 January 2015); doi: 10.1117/12.2175915
Proc. SPIE 9442, Digital holographic interferometry as an experimental instrumentation for measurements of macroscopic properties of polydomain ferroelectrics, 94420V (7 January 2015); doi: 10.1117/12.2178485
Proc. SPIE 9442, Deformable mirror for high power laser applications, 94420W (7 January 2015); doi: 10.1117/12.2086617
Proc. SPIE 9442, Precise curvature measurement of Yb:YAG thin disk, 94420X (7 January 2015); doi: 10.1117/12.2176185
Proc. SPIE 9442, Thin film deposition and LIDT testing at ISI Brno, 94420Y (7 January 2015); doi: 10.1117/12.2176181
Proc. SPIE 9442, The discovery of a new ELL variable star in Centaurus and possibility of detecting new exoplanets using the FRAM telescope, 94420Z (7 January 2015); doi: 10.1117/12.2175905
Proc. SPIE 9442, Gravity induced deflection of a reference plate and tested plane surfaces and its influence on optical measurement with the Fizeau interferometer, 944210 (7 January 2015); doi: 10.1117/12.2083898
Proc. SPIE 9442, Method for interferometric testing of optical surfaces based on evaluation of similarity of nominal and measured interferograms, 944211 (7 January 2015); doi: 10.1117/12.2083902
Proc. SPIE 9442, Super-polishing of Zerodur aspheres by means of conventional polishing technology, 944212 (7 January 2015); doi: 10.1117/12.2175899
Proc. SPIE 9442, Polishing of S-FPL-53 aspherical lenses, 944213 (7 January 2015); doi: 10.1117/12.2178126
Proc. SPIE 9442, Optical security elements based on waveguide effects, 944214 (7 January 2015); doi: 10.1117/12.2175918
Proc. SPIE 9442, Design and fabrication of diffraction grating for application in hyperspectral imaging for the long-wavelength infrared spectral region, 944215 (7 January 2015); doi: 10.1117/12.2175916
Proc. SPIE 9442, CNC subaperture polishing process arrangement for microroughness minimisation, 944216 (7 January 2015); doi: 10.1117/12.2087102
Proc. SPIE 9442, Optical properties of metal nanoparticles used in biosensors, 944217 (7 January 2015); doi: 10.1117/12.2178788
Proc. SPIE 9442, 3D form inspection of grinded optical surfaces by digital holography, 944218 (7 January 2015); doi: 10.1117/12.2176005
Proc. SPIE 9442, Quantification of synthetic lens surface characteristics by an optical measurement system as stylus instrument, 944219 (7 January 2015); doi: 10.1117/12.2176184
Proc. SPIE 9442, Jamin interferometer for precise measurement of refractive index of gases, 94421A (7 January 2015); doi: 10.1117/12.2175913
Proc. SPIE 9442, Development of methodology for evaluation of subsurface damage, 94421B (7 January 2015); doi: 10.1117/12.2176024
Proc. SPIE 9442, Quantitative microstructural characterization of transparent YAG ceramics via microscopic image analysis using stereological relations, 94421C (7 January 2015); doi: 10.1117/12.2179239
Proc. SPIE 9442, High-throughput optical system for HDES hyperspectral imager, 94421D (7 January 2015); doi: 10.1117/12.2175935
Proc. SPIE 9442, Progress in design of advanced LIDT station in HiLASE project, 94421E (7 January 2015); doi: 10.1117/12.2176935
Proc. SPIE 9442, Numerical simulation of deformation and figure quality of precise mirror, 94421F (7 January 2015); doi: 10.1117/12.2176336
Proc. SPIE 9442, Cooling options for high-average-power laser mirrors, 94421G (7 January 2015); doi: 10.1117/12.2086590
Proc. SPIE 9442, Impact of overmodulation on spectral response in high efficient transmission gratings, 94421H (7 January 2015); doi: 10.1117/12.2086801
Proc. SPIE 9442, Real-time direct measurement of diffraction efficiency of reflection gratings in photopolymer recording materials, 94421I (7 January 2015); doi: 10.1117/12.2086804
Proc. SPIE 9442, All-dielectric diffraction grating for multi-petawatt laser systems, 94421J (7 January 2015); doi: 10.1117/12.2086800
Proc. SPIE 9442, Multi-layer surface profiling using gated wavefront sensing, 94421K (7 January 2015); doi: 10.1117/12.2176174
Back to Top