Front Matter Vol. 9525
Proc. SPIE 9525, Front Matter: Volume 9525, 952501 (22 June 2015); doi: 10.1117/12.2197953
Resolution-enhanced Techniques
Proc. SPIE 9525, Ultra-precision optical metrology using highly controlled fiber-based frequency combs, 952502 (22 June 2015); doi: 10.1117/12.2191131
Proc. SPIE 9525, Deterministic phase retrieval employing spherical illumination, 952503 (22 June 2015); doi: 10.1117/12.2184760
Proc. SPIE 9525, Digital super-resolution microscopy using example-based algorithm, 952504 (22 June 2015); doi: 10.1117/12.2184826
Proc. SPIE 9525, 3D optical metrology and super-resolution microscopy with structured illumination based on QXGA (2048x1536) resolution, 952506 (22 June 2015); doi: 10.1117/12.2184774
Interferometric Techniques
Proc. SPIE 9525, Dual spectrally resolved interferometry to improve measurement range, 952507 (22 June 2015); doi: 10.1117/12.2184123
Proc. SPIE 9525, Full-field and contact-less topography of nanometric thin films based on multiwavelength interferometry, 952508 (22 June 2015); doi: 10.1117/12.2184631
Proc. SPIE 9525, Novel dispersion tolerant interferometry method for accurate measurements of displacement, 952509 (22 June 2015); doi: 10.1117/12.2184858
Proc. SPIE 9525, Spatial-frequency analysis algorithm for in-situ measurement of wavefront, 95250B (22 June 2015); doi: 10.1117/12.2184769
OCT and Fiber Sensors
Proc. SPIE 9525, Robust fiber optic flexure sensor exploiting mode coupling in few-mode fiber, 95250F (22 June 2015); doi: 10.1117/12.2184868
Proc. SPIE 9525, Fibre optic pressure sensor using a microstructured POF, 95250G (22 June 2015); doi: 10.1117/12.2185441
Proc. SPIE 9525, Distributed fiber optic sensor employing phase generate carrier for disturbance detection and location, 95250H (22 June 2015); doi: 10.1117/12.2184686
Digital Holography
Proc. SPIE 9525, Resolution enhancement in phase imaging by using modulated illumination, 95250I (22 June 2015); doi: 10.1117/12.2199414
Proc. SPIE 9525, Sparsity promoting automatic focusing in digital holography, 95250J (22 June 2015); doi: 10.1117/12.2185015
Proc. SPIE 9525, Holographic position measurements of an optically trapped nanoparticle, 95250K (22 June 2015); doi: 10.1117/12.2184553
Proc. SPIE 9525, Color holograms synthesis framework for three-dimensional scene reconstruction, 95250L (22 June 2015); doi: 10.1117/12.2185017
Proc. SPIE 9525, Off-axis illumination in object-rotation diffraction tomography for enhanced alignment and resolution, 95250M (22 June 2015); doi: 10.1117/12.2184688
White-Light Interferometry
Proc. SPIE 9525, A new class of wide-field objectives for 3D interference microscopy, 95250N (22 June 2015); doi: 10.1117/12.2183628
Proc. SPIE 9525, Interferometric measuring system for cone inspection on shop-floor level, 95250O (22 June 2015); doi: 10.1117/12.2184456
Proc. SPIE 9525, Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer, 95250P (22 June 2015); doi: 10.1117/12.2184814
Proc. SPIE 9525, Robust vertical scanning white-light interferometry in close-to-machine applications, 95250Q (22 June 2015); doi: 10.1117/12.2184024
Proc. SPIE 9525, Development of a compact low coherence interferometer based on GPGPU for fast microscopic surface measurement on turbine blades, 95250R (22 June 2015); doi: 10.1117/12.2184749
Speckle and Shearing Interferometry
Proc. SPIE 9525, Robust speckle metrology for stress measurements outside the lab, 95250T (22 June 2015); doi: 10.1117/12.2184739
Proc. SPIE 9525, Reduction of phase singularities in speckle-shearing interferometry by incoherent averaging of speckle patterns, 95250U (22 June 2015); doi: 10.1117/12.2184580
Proc. SPIE 9525, Bending stress determination in pipes using a radial in-plane digital speckle pattern interferometer combined with instrumented indentation, 95250V (22 June 2015); doi: 10.1117/12.2184732
Proc. SPIE 9525, Influence of error sources in speckle interferometry using only two speckle patterns, 95250W (22 June 2015); doi: 10.1117/12.2182643
Proc. SPIE 9525, A calibration method of self-referencing interferometry based on maximum likelihood estimation , 95250X (22 June 2015); doi: 10.1117/12.2184591
Confocal and WLI Techniques
Proc. SPIE 9525, Multiplex acquisition approach for high speed 3D measurements with a chromatic confocal microscope, 95250Y (22 June 2015); doi: 10.1117/12.2184560
Proc. SPIE 9525, Multi-scale roughness measurement of cementitious materials using different optical profilers and window resizing analysis, 95250Z (22 June 2015); doi: 10.1117/12.2184711
Proc. SPIE 9525, Calibration of z-axis linearity for arbitrary optical topography measuring instruments, 952510 (22 June 2015); doi: 10.1117/12.2190737
Proc. SPIE 9525, Surface topography measurement based on color images processing in white light interferometry, 952511 (22 June 2015); doi: 10.1117/12.2184558
Fringe Projection and 3D Imaging
Proc. SPIE 9525, Automatic complete high-precision optical 3D measurement of air cooling-holes of gas turbine vanes for repair, 952512 (22 June 2015); doi: 10.1117/12.2184709
Proc. SPIE 9525, Endoscopic fringe projection for in-situ inspection of a sheet-bulk metal forming process, 952513 (22 June 2015); doi: 10.1117/12.2184746
Proc. SPIE 9525, Long wave infrared 3D scanner, 952514 (22 June 2015); doi: 10.1117/12.2184691
Proc. SPIE 9525, Experimental comparison of laser speckle projection and array projection for high-speed 3D measurements, 952515 (22 June 2015); doi: 10.1117/12.2184672
Proc. SPIE 9525, Development of a photogrammetry system for the measurement of rotationally symmetric forgings, 952516 (22 June 2015); doi: 10.1117/12.2184916
Proc. SPIE 9525, 3D shape shearography with integrated structured light projection for strain inspection of curved objects, 952517 (22 June 2015); doi: 10.1117/12.2184058
Deflectometry
Proc. SPIE 9525, Temporal modulated deflectometry for painted surface inspection, 952518 (22 June 2015); doi: 10.1117/12.2184810
Joint Session I: Measurement of Optical Components and Systems
Proc. SPIE 9525, Never-ending struggles with mid-spatial frequencies, 95251B (22 June 2015); doi: 10.1117/12.2191135
Proc. SPIE 9525, Overview of characterization and metrology techniques for microlenses and microlens arrays, 95251D (22 June 2015); doi: 10.1117/12.2183692
Joint Session II: Measurement of Optical Components and Systems
Proc. SPIE 9525, Traceability in interferometric form metrology, 95251F (22 June 2015); doi: 10.1117/12.2191136
Proc. SPIE 9525, Point diffraction interferometry based on the use of two pinholes, 95251K (22 June 2015); doi: 10.1117/12.2184771
3D Shape, Displacement, and Deformation Measurement
Proc. SPIE 9525, Speckle interferometry in the long-wave infrared for combining holography and thermography in a single sensor: applications to nondestructive testing: The FANTOM Project, 95251L (22 June 2015); doi: 10.1117/12.2191133
Proc. SPIE 9525, Problems and solutions in measurements of engineering objects by means of digital image correlation, 95251M (22 June 2015); doi: 10.1117/12.2184759
Proc. SPIE 9525, Objective speckle displacement resulting from the deformation of shaped objects, 95251N (22 June 2015); doi: 10.1117/12.2184060
Proc. SPIE 9525, Optical system for the calibration and verification of correct axis positioning in medium-big sized milling boring machines, 95251O (22 June 2015); doi: 10.1117/12.2184620
Proc. SPIE 9525, Modified coherent gradient sensing method for slope measurement of reflective surfaces, 95251P (22 June 2015); doi: 10.1117/12.2184444
Nondestructive Testing and In-process Measurement
Proc. SPIE 9525, Optical detection of mixture ratios and impurities in viscous materials based on fluorescence imaging, 95251R (22 June 2015); doi: 10.1117/12.2184251
Proc. SPIE 9525, Expanded beam spectro-ellipsometry for big area on-line monitoring, 95251S (22 June 2015); doi: 10.1117/12.2184713
Proc. SPIE 9525, Additive manufacturing: a new approach for individualized optical shape metrology, 95251T (22 June 2015); doi: 10.1117/12.2183168
Proc. SPIE 9525, 3D shape measurements with a single interferometric sensor for in-situ lathe monitoring, 95251U (21 June 2015); doi: 10.1117/12.2184813
Proc. SPIE 9525, Ultrafast 2K line-scan sensor for industrial inspection applications, 95251V (22 June 2015); doi: 10.1117/12.2184683
Proc. SPIE 9525, Monitoring deformations of industrial objects using optical-electronic autoreflection system, 95251W (22 June 2015); doi: 10.1117/12.2183604
Vibration Measurement
Proc. SPIE 9525, High-speed digital in-line holography as multipoint vibrometry to analyze vibrations of structures, 95251X (22 June 2015); doi: 10.1117/12.2184459
Proc. SPIE 9525, Ultracompact vibrometry measurement with nanometric accuracy using optical feedback, 95251Y (22 June 2015); doi: 10.1117/12.2184730
Proc. SPIE 9525, Evaluation of the vibrational behaviour of a rotating disk by optical tip-clearance measurements, 95251Z (22 June 2015); doi: 10.1117/12.2185273
Proc. SPIE 9525, Simultaneous laser vibrometry on multiple surfaces with a single beam system using range-resolved interferometry, 952520 (22 June 2015); doi: 10.1117/12.2183281