PROCEEDINGS VOLUME 9556
SPIE NANOSCIENCE + ENGINEERING | 9-13 AUGUST 2015
Nanoengineering: Fabrication, Properties, Optics, and Devices XII
Proceedings Volume 9556 is from: Logo
SPIE NANOSCIENCE + ENGINEERING
9-13 August 2015
San Diego, California, United States
Front Matter: Volume 9556
Proc. SPIE 9556, Front Matter: Volume 9556, 955601 (9 September 2015); doi: 10.1117/12.2205183
Nanofabrication for Energy Harvest
Proc. SPIE 9556, Technical requirements, manufacturing processes and cost efficiency for transparent electrodes based on silver nanowires and carbon nanotubes, 955602 (20 August 2015); doi: 10.1117/12.2187531
Proc. SPIE 9556, Invoking the frequency dependence in square modulated light intensity techniques for the measurement of electron time constants in dye-sensitized solar cells, 955604 (20 August 2015); doi: 10.1117/12.2185921
Proc. SPIE 9556, Optical and structural properties of co-sputtered Cu-Si-O and Cu-Ge-O thin films (Presentation Recording), 955605 (); doi: 10.1117/12.2188902
Nanofabrication for Novel Optical Surface Properties
Proc. SPIE 9556, Scalable nanostructuring on polymer by a SiC stamp: optical and wetting effects, 955607 (20 August 2015); doi: 10.1117/12.2186317
Proc. SPIE 9556, Nanofabrication of ultra-low reflectivity black silicon surfaces and devices (Presentation Recording), 955609 (); doi: 10.1117/12.2189216
Nanophotonics
Proc. SPIE 9556, Development of 3D photonic crystals using sol-gel process for high power laser applications, 95560A (20 August 2015); doi: 10.1117/12.2187017
Proc. SPIE 9556, PbSe/PbSrSe MQW characteristic temperature relationship with laser cavity length, 95560E (20 August 2015); doi: 10.1117/12.2182564
Micro, Nano, and Optical Materials
Proc. SPIE 9556, All-polymer based fabrication process for an all-polymer flexible and parallel optical interconnect, 95560F (20 August 2015); doi: 10.1117/12.2187143
Proc. SPIE 9556, Tolerance analysis of the pulse signal of a novel lateral deformable optical NEMS grating transducer , 95560G (20 August 2015); doi: 10.1117/12.2186555
Proc. SPIE 9556, Design of SiOx slab optical waveguides, 95560H (21 August 2015); doi: 10.1117/12.2187121
Proc. SPIE 9556, Design and fabrication of sinusoidal spectral filters for multispectral imaging, 95560I (20 August 2015); doi: 10.1117/12.2188830
Proc. SPIE 9556, Detection of coating fluorophores’ densities in improved Q-factor cavities, 95560J (20 August 2015); doi: 10.1117/12.2189040
Nanodevices
Proc. SPIE 9556, Nanofabrication at 1nm resolution by quantum optical lithography (Presentation Recording), 95560L (); doi: 10.1117/12.2187249
Proc. SPIE 9556, Plasmonic structures fabricated via nanomasking sub-10 nm lithography technique, 95560M (20 August 2015); doi: 10.1117/12.2188335
Proc. SPIE 9556, Optomechanical nanoantenna: far-field control of near-field through mechanical reconfiguration, 95560N (26 August 2015); doi: 10.1117/12.2188301
Proc. SPIE 9556, Optimizing a sub-wavelength grating lens for large incidence angles, 95560O (20 August 2015); doi: 10.1117/12.2187784
Proc. SPIE 9556, Research on input shaping algorithm for rapid positioning of ultra-precision dual-stage, 95560P (20 August 2015); doi: 10.1117/12.2186912
Nanometrology and Precision
Proc. SPIE 9556, Nanomanufacturing concerns about measurements made in the SEM part IV: charging and its mitigation, 95560Q (20 August 2015); doi: 10.1117/12.2186997
Proc. SPIE 9556, Self-assembly based nanometer-scale patterning for nanowire growth, 95560T (20 August 2015); doi: 10.1117/12.2188016
Nanopatterning for Surface Chemistry
Proc. SPIE 9556, Linear and nonlinear optical processing of polymer matrix nanocomposites, 95560V (20 August 2015); doi: 10.1117/12.2187113
Proc. SPIE 9556, Nanoscale patterning of poly (L-lactic acid) films with nanoimprinting methods, 95560X (20 August 2015); doi: 10.1117/12.2188888
Nanomanufacturing and Metrology
Proc. SPIE 9556, Nanomanufacturing-related programs at NSF, 95560Y (20 August 2015); doi: 10.1117/12.2186815
Proc. SPIE 9556, Challenges and needs for automating nano image processing for material characterization, 95560Z (20 August 2015); doi: 10.1117/12.2186251
Proc. SPIE 9556, Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing, 955610 (20 August 2015); doi: 10.1117/12.2190409
Proc. SPIE 9556, Quantitative tool characterization of 193nm scatterfield microscope, 955611 (9 September 2015); doi: 10.1117/12.2188224
Proc. SPIE 9556, Laser velocimetry for measurement of non-sinusoidal vibration in sub-nanometer scale without lock-in amplifiers, 955612 (20 August 2015); doi: 10.1117/12.2187894
Poster Session
Proc. SPIE 9556, Design and fabrication of multilayer dielectric gratings for spectral beam combining, 955615 (20 August 2015); doi: 10.1117/12.2186076
Proc. SPIE 9556, Advanced length scaling method of optical nanoantennas, 955616 (20 August 2015); doi: 10.1117/12.2186526
Proc. SPIE 9556, Design of optical channel waveguides in SiO2 by ion implantation, 955617 (20 August 2015); doi: 10.1117/12.2187117
Proc. SPIE 9556, Nanoindentation for surface modification of nanofilms, 955619 (20 August 2015); doi: 10.1117/12.2187573
Proc. SPIE 9556, Optical properties of LEDs with patterned 1D photonic crystal, 95561A (20 August 2015); doi: 10.1117/12.2188127
Proc. SPIE 9556, The significance of the number of periods and period size in 2D photonic crystal waveguides, 95561B (20 August 2015); doi: 10.1117/12.2188321
Proc. SPIE 9556, Optical enhancement of photoluminescence with colloidal quantum dots, 95561C (20 August 2015); doi: 10.1117/12.2188362
Proc. SPIE 9556, Development of EUV scatterometer with high-harmonic-generation EUV source for nano-scale grating measurement , 95561F (20 August 2015); doi: 10.1117/12.2194234
Proc. SPIE 9556, Optical reflectivity as an inspection tool for metallic nanoparticles deposited randomly on a flat substrate, 95561H (20 August 2015); doi: 10.1117/12.2186863
Proc. SPIE 9556, Feasibility of sizing metallic nanoparticles in concentrated suspensions from effective optical properties, 95561I (20 August 2015); doi: 10.1117/12.2187032
Proc. SPIE 9556, Wafer defect inspection using component tree of SEM images, 95561J (20 August 2015); doi: 10.1117/12.2187411
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