PROCEEDINGS VOLUME 9592
SPIE OPTICAL ENGINEERING + APPLICATIONS | 9-13 AUGUST 2015
X-Ray Nanoimaging: Instruments and Methods II
IN THIS VOLUME

0 Sessions, 19 Papers, 0 Presentations
Ptychography  (3)
Proceedings Volume 9592 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
9-13 August 2015
San Diego, California, United States
Front Matter: Volume 9592
Proc. SPIE 9592, Front Matter: Volume 9592, 959201 (14 September 2015); doi: 10.1117/12.2219699
Scanning Probe I
Proc. SPIE 9592, Hard x-ray nanoprobe by Montel KB mirrors at Taiwan Photon Source, 959204 (18 September 2015); doi: 10.1117/12.2189985
Full-Field Microscope I
Proc. SPIE 9592, Development of achromatic full-field hard x-ray microscopy with two monolithic imaging mirrors, 959208 (17 September 2015); doi: 10.1117/12.2188583
Proc. SPIE 9592, FXI: a full-field imaging beamline at NSLS-II, 959209 (18 September 2015); doi: 10.1117/12.2189914
Ptychography
Proc. SPIE 9592, Ptychographic nanotomography at the Swiss Light Source, 95920A (18 September 2015); doi: 10.1117/12.2188313
Proc. SPIE 9592, Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials, 95920B (18 September 2015); doi: 10.1117/12.2188811
Proc. SPIE 9592, Nanofocused x-ray beams applied for mapping strain in core-shell nanowires, 95920D (18 September 2015); doi: 10.1117/12.2190693
Nanofocusing Optics
Proc. SPIE 9592, Progress on multi-order hard x-ray imaging with multilayer zone plates, 95920E (18 September 2015); doi: 10.1117/12.2187799
Proc. SPIE 9592, High-resolution high-efficiency multilayer Fresnel zone plates for soft and hard x-rays, 95920F (18 September 2015); doi: 10.1117/12.2187795
Proc. SPIE 9592, Stacking multiple zone plates for efficient hard x-ray focusing at the Advanced Photon Source, 95920G (18 September 2015); doi: 10.1117/12.2187684
Proc. SPIE 9592, Fabrication and x-ray testing of true kinoform lenses with high efficiencies, 95920H (18 September 2015); doi: 10.1117/12.2187896
Scanning Probe II
Proc. SPIE 9592, Simultaneous x-ray nano-ptychographic and fluorescence microscopy at the bionanoprobe, 95920I (18 September 2015); doi: 10.1117/12.2190672
Full-Field Microscope II
Proc. SPIE 9592, Low dose, limited energy spectroscopic x-ray microscopy, 95920N (18 September 2015); doi: 10.1117/12.2190799
Proc. SPIE 9592, Synchrotron-based transmission x-ray microscopy for improved extraction in shale during hydraulic fracturing, 95920O (18 September 2015); doi: 10.1117/12.2190806
Proc. SPIE 9592, X-ray microscopy for in situ characterization of 3D nanostructural evolution in the laboratory, 95920Q (18 September 2015); doi: 10.1117/12.2188728
Poster Session
Proc. SPIE 9592, Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography, 95920S (18 September 2015); doi: 10.1117/12.2190416
Proc. SPIE 9592, Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy, 95920U (18 September 2015); doi: 10.1117/12.2190749
Proc. SPIE 9592, A new workflow for x-ray fluorescence tomography: MAPStoTomoPy, 95920W (18 September 2015); doi: 10.1117/12.2194162
Proc. SPIE 9592, Refractive lens based full-field x-ray imaging at 45-50 keV with sub-micron resolution, 95920X (18 September 2015); doi: 10.1117/12.2195531
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