PROCEEDINGS VOLUME 9628
SPIE OPTICAL SYSTEMS DESIGN | 7-10 SEPTEMBER 2015
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Proceedings Volume 9628 is from: Logo
SPIE OPTICAL SYSTEMS DESIGN
7-10 September 2015
Jena, Germany
Front Matter: Volume 9628
Proc. SPIE 9628, Front Matter: Volume 9628, 962801 (6 October 2015); doi: 10.1117/12.2217616
Lithography and Space Optics I
Proc. SPIE 9628, Characterization of Mo/Si mirror interface roughness for different Mo layer thickness using resonant diffuse EUV scattering, 962804 (24 September 2015); doi: 10.1117/12.2191265
Lithography and Space Optics II
Proc. SPIE 9628, Fabrication and testing of STREEGO: a compact optical payload for earth observation on small satellites, 962806 (24 September 2015); doi: 10.1117/12.2191285
Proc. SPIE 9628, Process control in optical fabrication, 962807 (5 October 2015); doi: 10.1117/12.2191881
Proc. SPIE 9628, The challenge of developing thin mirror shells for future x-ray telescopes, 962809 (24 September 2015); doi: 10.1117/12.2191112
Characterisation of Coatings
Proc. SPIE 9628, Simultaneous determination of optical constants, local thickness, and local roughness of thin films by imaging spectroscopic reflectometry, 96280C (24 September 2015); doi: 10.1117/12.2190091
Proc. SPIE 9628, Wide spectral range characterization of antireflective coatings and their optimization, 96280F (24 September 2015); doi: 10.1117/12.2190109
Laser Damage, Defects, and Contaminations
Proc. SPIE 9628, Optical surfaces for high power laser coatings, 96280G (24 September 2015); doi: 10.1117/12.2190931
Light Scattering
Proc. SPIE 9628, Measuring and quantifying scatter from a variety of sample types, 96280K (24 September 2015); doi: 10.1117/12.2190986
Proc. SPIE 9628, Facility for fast mapping of total scattering and transmission in the spectral range from DUV- NIR, 96280N (24 September 2015); doi: 10.1117/12.2191311
Spectrophotometry
Proc. SPIE 9628, The absolute radiometric calibration facility ARCF 2.0 at TNO, 96280O (24 September 2015); doi: 10.1117/12.2191595
Proc. SPIE 9628, Scattermeter for measurement of solar cells, 96280P (24 September 2015); doi: 10.1117/12.2190779
Proc. SPIE 9628, A developed method for surface testing based on the scattering interference effect, 96280Q (24 September 2015); doi: 10.1117/12.2191034
Proc. SPIE 9628, Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films, 96280R (24 September 2015); doi: 10.1117/12.2191052
Manufacturing and Testing I
Proc. SPIE 9628, Manufacturing and testing large SiC mirrors in an efficient way, 96280S (24 September 2015); doi: 10.1117/12.2189751
Proc. SPIE 9628, Results of a polishing study for SCHOTT XLD glasses, 96280T (24 September 2015); doi: 10.1117/12.2191036
Proc. SPIE 9628, Mechanical design implementation and mathematical considerations for ultra precise diamond turning of multiple freeform mirrors on a common substrate, 96280U (24 September 2015); doi: 10.1117/12.2191043
Proc. SPIE 9628, Use of a NOM profilometer to measure large aspheric surfaces, 96280W (24 September 2015); doi: 10.1117/12.2191322
Proc. SPIE 9628, Reducing the cycle time of cementing processes for high quality doublets, 96280X (24 September 2015); doi: 10.1117/12.2196876
Manufacturing and Testing II
Proc. SPIE 9628, Surface assessment and mitigation of DUV optics, 96280Y (24 September 2015); doi: 10.1117/12.2190684
Proc. SPIE 9628, V-block refractometer for monitoring the production of optical glasses, 962811 (24 September 2015); doi: 10.1117/12.2191218
Aspheres
Proc. SPIE 9628, Current developments on optical asphere and freeform metrology, 962812 (24 September 2015); doi: 10.1117/12.2191247
Proc. SPIE 9628, Conversion of radius of curvature to power (and vice versa), 962813 (5 October 2015); doi: 10.1117/12.2191400
Proc. SPIE 9628, The measurement of an aspherical mirror by three-dimensional nanoprofiler, 962814 (28 September 2015); doi: 10.1117/12.2191040
Proc. SPIE 9628, Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces, 962815 (24 September 2015); doi: 10.1117/12.2190503
Interferometry
Proc. SPIE 9628, Sensitivity of null testing for a local deformation, 962816 (24 September 2015); doi: 10.1117/12.2191545
Proc. SPIE 9628, Two-dimension lateral shearing interferometry with dual-mode, 962817 (24 September 2015); doi: 10.1117/12.2189878
Proc. SPIE 9628, Compact low-cost lensless digital holographic microscope for topographic measurements of microstructures in reflection geometry, 962818 (24 September 2015); doi: 10.1117/12.2191073
Proc. SPIE 9628, Absolute testing of flats in sub-stitching interferometer by rotation-shift method, 962819 (24 September 2015); doi: 10.1117/12.2191288
Proc. SPIE 9628, Improved cavity ring-down system for high precision measurement of the specific modes' loss in ring cavity, 96281A (24 September 2015); doi: 10.1117/12.2196394
3D and Shape Metrology I
Proc. SPIE 9628, Advances in corneal topography measurements with conical null-screens, 96281B (24 September 2015); doi: 10.1117/12.2192137
Proc. SPIE 9628, Sinusoidal frequency modulation on laser diode for frequency stabilization and displacement measuring interferometry, 96281D (24 September 2015); doi: 10.1117/12.2191032
Proc. SPIE 9628, Analysis of defects on the slopes on a parabolic trough solar collector with null-screens, 96281E (24 September 2015); doi: 10.1117/12.2192136
3D and Shape Metrology II
Proc. SPIE 9628, An automated calibration system that combines fringe projection and 2D digital image correlation, 96281G (24 September 2015); doi: 10.1117/12.2191110
Proc. SPIE 9628, Contribution to the standardization of 3D measurements using a high-resolution PMD camera, 96281H (24 September 2015); doi: 10.1117/12.2191042
Proc. SPIE 9628, Design and development of a profilometer for the fast and accurate characterization of optical surfaces, 96281I (24 September 2015); doi: 10.1117/12.2191058
Proc. SPIE 9628, 3D printed freeform optical sensors for metrology application, 96281J (24 September 2015); doi: 10.1117/12.2191280
Proc. SPIE 9628, Two-dimensional thickness measurement using acousto-optically tuned external cavity laser diode, 96281K (24 September 2015); doi: 10.1117/12.2193027
Micro- and Nanostructures
Proc. SPIE 9628, Multilevel micro-structuring of glassy carbon molds for precision glass molding, 96281M (24 September 2015); doi: 10.1117/12.2191661
Proc. SPIE 9628, Optical design and laser ablation of surface textures: demonstrating total internal reflection, 96281N (24 September 2015); doi: 10.1117/12.2192082
Proc. SPIE 9628, Replication and subdivision of chromium nano-grating in atom lithography, 96281O (24 September 2015); doi: 10.1117/12.2191128
Proc. SPIE 9628, Enhancement of RIE: etched Diffractive Optical Elements surfaces by using Ion Beam Etching, 96281P (24 September 2015); doi: 10.1117/12.2191053
Proc. SPIE 9628, In-line metrology setup for periodic nanostructures based on sub-wavelength diffraction, 96281Q (24 September 2015); doi: 10.1117/12.2191346
Proc. SPIE 9628, Inkjet printed single-mode waveguides on hot-embossed foils, 96281R (24 September 2015); doi: 10.1117/12.2191335
Poster Session
Proc. SPIE 9628, Dispersion model for optical thin films applicable in wide spectral range, 96281U (24 September 2015); doi: 10.1117/12.2190104
Proc. SPIE 9628, Highly sensitive displacement measurement utilizing the wavelength interrogation, 96281W (24 September 2015); doi: 10.1117/12.2191198
Proc. SPIE 9628, Precision optical device of freeform defects inspection, 96281X (24 September 2015); doi: 10.1117/12.2191202
Proc. SPIE 9628, Analysis of factors important for measurements of focal length of optical systems, 96281Z (24 September 2015); doi: 10.1117/12.2191401
Proc. SPIE 9628, Flow-cytometric identification of vinegars using a multi-parameter analysis optical detection module, 962822 (24 September 2015); doi: 10.1117/12.2197474
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