Proceedings Volume 9636 is from: Logo
SPIE SCANNING MICROSCOPIES
29 September - 1 October 2015
Monterey, California, United States
Front Matter: Volume 9636
Proc. SPIE 9636, Front Matter: Volume 9636, 963601 (9 November 2015); doi: 10.1117/12.2228190
Advancements in Optical and Particle Beam Microscopies II
Proc. SPIE 9636, Does your SEM really tell the truth? How would you know? Part 4: Charging and its mitigation, 963605 (21 October 2015); doi: 10.1117/12.2195344
Proc. SPIE 9636, Three-dimensional characterization of Gd nanoparticles using STEM-in-SEM tomography in a dual-beam FIB-SEM, 963606 (21 October 2015); doi: 10.1117/12.2195530
Proc. SPIE 9636, A novel approach to TEM preparation with a (7-axis stage) triple-beam FIB-SEM system, 963607 (21 October 2015); doi: 10.1117/12.2196926
Advancements in Optical and Particle Beam Microscopies III
Proc. SPIE 9636, Correlative microscopy including CLSM and SEM to improve high-speed, high-resolution laser-engraved print and embossing forms, 963609 (16 December 2015); doi: 10.1117/12.2197471
Proc. SPIE 9636, Sub-diffraction-limit imaging using mode multiplexing, 96360A (21 October 2015); doi: 10.1117/12.2186137
Proc. SPIE 9636, Investigation of electron beam irradiation effect on pore formation, 96360B (21 October 2015); doi: 10.1117/12.2185519
Advancements in Microscopy for Forensic Science
Proc. SPIE 9636, A compilation of cold cases using scanning electron microscopy at the University of Rhode Island, 96360F (21 October 2015); doi: 10.1117/12.2196968
Proc. SPIE 9636, SEM/EDS analysis for problem solving in the food industry, 96360G (21 October 2015); doi: 10.1117/12.2196962
Proc. SPIE 9636, Exploration of mXRF analysis of gunshot residue from cartridge cases, 96360I (21 October 2015); doi: 10.1117/12.2197028
Microscopy for Science, Technology, Engineering, and Mathematics (STEM)
Proc. SPIE 9636, Hitachi TM3030 engages at the nexus of cross-curriculum teaching and vertical articulation, 96360L (21 October 2015); doi: 10.1117/12.2196819
Proc. SPIE 9636, Using a university characterization facility to educate the public about microscopes: light microscopes to SEM, 96360M (21 October 2015); doi: 10.1117/12.2196552
Proc. SPIE 9636, How a lesson on microscopes supports learning about light in elementary schools, 96360N (21 October 2015); doi: 10.1117/12.2196432
Advancements in Atomic Force Microscopy I
Proc. SPIE 9636, Continuous monitoring of tip radius during atomic force microscopy imaging, 96360O (21 October 2015); doi: 10.1117/12.2196951
Proc. SPIE 9636, Lateral tip control effects in CD-AFM metrology: the large tip limit, 96360Q (21 October 2015); doi: 10.1117/12.2199169
Advancements in Atomic Force Microscopy II
Proc. SPIE 9636, SPM metrological assurance using a heterodyne interferometer, 96360R (21 October 2015); doi: 10.1117/12.2199874
Proc. SPIE 9636, Photomask linewidth comparison by PTB and NIST, 96360S (2 November 2015); doi: 10.1117/12.2199453
Advancements in X-Ray Microanalysis
Proc. SPIE 9636, Electron-excited energy dispersive x-ray spectrometry in the variable pressure scanning electron microscope (EDS/VPSEM): it's not microanalysis anymore!, 96360T (21 October 2015); doi: 10.1117/12.2191088
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