PROCEEDINGS VOLUME 9687
EIGHTH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY (AOMATT2016) | 26-29 APRIL 2016
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
IN THIS VOLUME

0 Sessions, 15 Papers, 0 Presentations
Oral Session  (8)
EIGHTH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY (AOMATT2016)
26-29 April 2016
Suzhou, China
Front Matter: Volume 9687
Proc. SPIE 9687, Front Matter: Volume 9687, 968701 (9 November 2016); doi: 10.1117/12.2257119
Oral Session
Proc. SPIE 9687, Comparison of small angle deflectometric measurements with different apertures down to the sub-millimetre range , 968702 (25 October 2016); doi: 10.1117/12.2243608
Proc. SPIE 9687, How to specify super-smooth mirrors: simulation studies on nano-focusing and wavefront preserving x-ray mirrors for next-generation light sources, 968703 (25 October 2016); doi: 10.1117/12.2241139
Proc. SPIE 9687, New scheme to control x-ray deformable mirrors, 968704 (25 October 2016); doi: 10.1117/12.2241522
Proc. SPIE 9687, Evaluation of figure accuracy of Wolter mirror fabricated by electroforming , 968705 (25 October 2016); doi: 10.1117/12.2243422
Proc. SPIE 9687, Two dimensional surface slope metrology with enhanced spatial resolution based on wavefront coding method, 968706 (25 October 2016); doi: 10.1117/12.2244271
Proc. SPIE 9687, High accuracy measurement of power spectral density in middle spatial frequency range of optical surfaces using optical profiler, 968707 (25 October 2016); doi: 10.1117/12.2243152
Proc. SPIE 9687, λ/100 reference flat for commercially available Fizeau interferometer, 968708 (25 October 2016); doi: 10.1117/12.2242806
Proc. SPIE 9687, Control of lateral thickness gradients of EUV/soft x-ray multilayer on curved substrates, 96870A (25 October 2016); doi: 10.1117/12.2246160
9687 Poster Session
Proc. SPIE 9687, An analysis of light spot extracting based on LED, 96870B (25 October 2016); doi: 10.1117/12.2242784
Proc. SPIE 9687, Research on the electron beam spot detection methods based on SEM, 96870C (25 October 2016); doi: 10.1117/12.2245029
Proc. SPIE 9687, Innovative nano-accuracy surface profiler for sub-50 nrad rms mirror test, 96870D (25 October 2016); doi: 10.1117/12.2247575
Proc. SPIE 9687, Nano-accuracy measurement technology of optical-surface profiles, 96870E (25 October 2016); doi: 10.1117/12.2247578
Proc. SPIE 9687, Progress in upgrading a long trace profiler at NSRRC, 96870F (25 October 2016); doi: 10.1117/12.2247664
Proc. SPIE 9687, X-ray optics R&D at NSLSII: focus on optical metrology development, 96870G (25 October 2016); doi: 10.1117/12.2248223
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