This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: diffraction-pattern generation, diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development, facility description, and experimental results which have been obtained over the last few years at General Motors' AC Electronics-Defense Research Laboratories in Santa Barbara, California. Sampling the diffraction pattern results in a sample - signature - a different one for each sampling geometry. The kinds of information obtainable from sample-signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery.
George G. Lendaris,
Gordon L. Stanley,
"Diffraction-Pattern Sampling For Automatic Pattern Recognition", Proc. SPIE 0018, Pattern Recognition Studies I, (9 December 1969); doi: 10.1117/12.946835; https://doi.org/10.1117/12.946835