1 June 1971 Stereometric Quality Of Scanning Electron Microscope Imagery
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Abstract
The recent development of the scanning electron microscope (SEM) has added a new dimension to the field of microscopy. The SEM produces an image having considerable depth of focus; for example, approximately 400 times that of a light microscope at equivalent magnifications. It can be operated continuously between magnifications of 20 and 100,000X with a resolution of approximately 100 Å.
© (1971) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. D. Eick, L. N. Johnson, R. F. McGivern, "Stereometric Quality Of Scanning Electron Microscope Imagery", Proc. SPIE 0026, Quantitative Imagery in the Biomedical Sciences I, (1 June 1971); doi: 10.1117/12.975334; https://doi.org/10.1117/12.975334
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