New Applications For Infrared Taicroimaging

Herbert Kaplan

doi:10.1117/12.978155

1 August 1972 New Applications For Infrared Microimaging

Herbert Kaplan

Proceedings Volume 0029, Imaging Techniques for Testing and Inspection; (1972) https://doi.org/10.1117/12.978155
Event: Imaging Techniques for Testing and Inspection, 1972, Los Angeles, United States

Abstract

Within the past year, several papers have been presented concerning the advent of a new device for real-time non-contact thermal imaging of microscopic targets. This device, the BM-50 IR Microscanner has since been utilized in several new and interesting areas of non-destructive testing and it is the purpose of this paper to discuss these new applications and to project sore areas which show future promise.

Citation Download Citation

Herbert Kaplan "New Applications For Infrared Microimaging", Proc. SPIE 0029, Imaging Techniques for Testing and Inspection, (1 August 1972); https://doi.org/10.1117/12.978155

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