20 May 1973 The Vignette Anomaly Monitor (VAM) As Applied To Automotive Testing
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Proceedings Volume 0034, Solving Problems in Automotive Safety Engineering and Biomechanics with Optical Instrumentation; (1973) https://doi.org/10.1117/12.953644
Event: Optical Instrumentation: A Problem Solving Tool in Automotive Safety Engineering and Bio-Mechanics, 1972, Detroit, United States
Abstract
The Vignette Anomaly Monitor or VAM is an instrument for performing non-contacting dimensional measurements. These measurements are attained by multiple evaluation of shadows produced in broad daylight or in a typical manufacturing area. The VAM is not a laboratory curiosity but is rather an instrument which has been designed for production and for installation in stringent environments. The VAM has been selected over other instruments for dimensional measurement when high frequency response was required, when immunity to scintillation was desired, where it is of advantage to have no moving parts in the measurement system, where accuracies of the order of .001 inches are required, where it is of advantage to consider the shadow rather than the object, and where a stand-off distance of up to three feet provides or permits isolation between the measured object and the measurement reference frame.
© (1973) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C. L. Rogers, C. L. Rogers, } "The Vignette Anomaly Monitor (VAM) As Applied To Automotive Testing", Proc. SPIE 0034, Solving Problems in Automotive Safety Engineering and Biomechanics with Optical Instrumentation, (20 May 1973); doi: 10.1117/12.953644; https://doi.org/10.1117/12.953644
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