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1 June 1974 Trends In The Development Of Otf Measuring Equipments
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Abstract
The special demands for OTF measuring instruments are discussed. The development of commercially available instruments from direct measuring instruments to highly sophisticated devices is described, as a trend from complicated test-charts and mechanical set-ups to simpler slit-imaging systems and use of minicomputers integrated in the instruments. A survey of 8 commercial instruments showing different steps of this trend is given.
© (1974) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K.-J. Rosenbruch "Trends In The Development Of Otf Measuring Equipments", Proc. SPIE 0046, Image Assessment and Specification, (1 June 1974); https://doi.org/10.1117/12.953977
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