Electronic Processing In Flaw Detection

T. S. Huang

doi:10.1117/12.954381

20 October 1975 Electronic Processing In Flaw Detection

T. S. Huang

Proceedings Volume 0060, Solving Quality Control and Reliability Problems with Optics; (1975) https://doi.org/10.1117/12.954381
Event: Solving Quality Control and Reliability Problems with Optics, 1975, San Diego, United States

Abstract

We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.

Citation Download Citation

T. S. Huang "Electronic Processing In Flaw Detection", Proc. SPIE 0060, Solving Quality Control and Reliability Problems with Optics, (20 October 1975); https://doi.org/10.1117/12.954381

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