20 October 1975 Electronic Processing In Flaw Detection
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Proceedings Volume 0060, Solving Quality Control and Reliability Problems with Optics; (1975); doi: 10.1117/12.954381
Event: Solving Quality Control and Reliability Problems with Optics, 1975, San Diego, United States
Abstract
We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.
© (1975) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. S. Huang, "Electronic Processing In Flaw Detection", Proc. SPIE 0060, Solving Quality Control and Reliability Problems with Optics, (20 October 1975); doi: 10.1117/12.954381; https://doi.org/10.1117/12.954381
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KEYWORDS
Inspection

Image enhancement

Feature extraction

Image quality

Integrated circuits

Thermography

Classification systems

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