15 January 1976 Substrate Throughprint In Low Scatter Mirrors
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Data is presented which details investigations of substrate throughprint in low scatter nickel plated aluminum mirrors. Effects of fabrication procedures are examined. A novel method is described for photographically recording the visible light scattering of mirror surfaces at near specular angles. Application of the technique to quantitative scatter measurement is considered. Use of the test for inprocess inspection is described.
© (1976) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John J. Hizny, John J. Hizny, } "Substrate Throughprint In Low Scatter Mirrors", Proc. SPIE 0065, Design, Manufacture and Application of Metal Optics, (15 January 1976); doi: 10.1117/12.954515; https://doi.org/10.1117/12.954515


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