27 July 1976 Low-Light-Level Performance Analysis For Charge-Coupled Device TV Cameras
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Proceedings Volume 0078, Low Light Level Devices for Science and Technolgy; (1976) https://doi.org/10.1117/12.954771
Event: 1976 SPIE/SPSE Technical Symposium East, 1976, Reston, United States
Abstract
Charge-coupled device (CCD) area image sensors of the interline-transfer type include design features which enable the transfer and detection of signal charge packets of the order of tens of electrons. These sensors, which include devices with 190 x 244 and 380 x 488 elements, have application in all-solid-state TV cameras designed for use with very low levels of scene illumination. The designer of TV cam-eras which fully exploit this low-light performance potential is faced with a challenging constraint; extraneous noise effects must be mini-mized. In order to assess progress to date, both for sensor design and utilization techniques, the theoretical performance limitations imposed by non-cancellable noise of the detection process, and the effects of sensor CTF, are examined. This paper describes an analytical model for predicting the sensor-limited resolution-irradiance characteristics of CCD-TV camera systems as a function of responsivity, CTF, dark charge, on-chip amplifier NES, optical image contrast, and the required threshold signal-to-noise ratio. The results of the analysis are compared with recent experimental results approaching the predicted sensor-limited camera performance.
© (1976) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth A. Hoagland, Kenneth A. Hoagland, } "Low-Light-Level Performance Analysis For Charge-Coupled Device TV Cameras", Proc. SPIE 0078, Low Light Level Devices for Science and Technolgy, (27 July 1976); doi: 10.1117/12.954771; https://doi.org/10.1117/12.954771
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