15 November 1976 CCD Image Simulation
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Abstract
Charge Coupled Device (CCD) imaging and processing arrays have shown promise in applications requiring integrated focal plane data processing such as found in certain "smart" sensor and data rate compression designs. This paper presents the results of a computer simulation effort to determine CCD imaging properties in both scanning and area array configurations. The ability to simulate imagery for a variety of array parameters is useful in the design of such imager/processor systems. Results of the study illustrate effects which are both general characteristics of sampled systems and peculiarities of CCDs. Included are resolution loss using computer generated targets, spurious signals due to the relative position of target and sample points, distortions due to linear and sinusoidal smear, effects of target contrast and CCD noise sources. Both tri-bar and highly over-sampled imagery are used in the demonstractions.
© (1976) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. J. Schraibman, H. J. Schraibman, J. D. Joseph, J. D. Joseph, J. R. Parsons, J. R. Parsons, } "CCD Image Simulation", Proc. SPIE 0095, Modern Utilization of Infrared Technology II, (15 November 1976); doi: 10.1117/12.955173; https://doi.org/10.1117/12.955173
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